Reflective mask and method of making same
    1.
    发明授权
    Reflective mask and method of making same 有权
    反光罩及其制作方法

    公开(公告)号:US08877409B2

    公开(公告)日:2014-11-04

    申请号:US13451705

    申请日:2012-04-20

    IPC分类号: G03F1/24

    CPC分类号: G03F1/24 G03F1/48 H01L21/0337

    摘要: A reflective mask is described. The mask includes a low thermal expansion material (LTEM) substrate, a conductive layer deposited on a first surface of the LTEM substrate, a stack of reflective multilayers (ML) deposited on a second surface of the LTEM substrate, a capping layer deposited on the stack of reflective ML, a first absorption layer deposited on the first capping layer, a main pattern, and a border ditch. The border ditch reaches to the capping layer, a second absorption layer deposited inside the border ditch, and the second absorption layer contacts the capping layer. In some instances, the border ditch crosses the capping layer and partially enters the reflective multilayer.

    摘要翻译: 描述了一种反光罩。 掩模包括低热膨胀材料(LTEM)衬底,沉积在LTEM衬底的第一表面上的导电层,沉积在LTEM衬底的第二表面上的反射多层堆叠(ML),沉积在 堆叠的反射ML,沉积在第一盖层上的第一吸收层,主图案和边界沟。 边界沟到达覆盖层,沉积在边界沟内的第二吸收层,第二吸收层接触覆盖层。 在一些情况下,边界沟穿过覆盖层并部分地进入反射层。

    BONDING SYSTEM FOR OPTICAL ALIGNMENT
    5.
    发明申请
    BONDING SYSTEM FOR OPTICAL ALIGNMENT 有权
    用于光学对准的接合系统

    公开(公告)号:US20110280511A1

    公开(公告)日:2011-11-17

    申请号:US12778127

    申请日:2010-05-12

    IPC分类号: G02B6/12 H01L33/48

    摘要: A bonding system and a bonding method for alignment are provided. An optical semiconductor includes a light source and a plurality of protruded elements on a surface thereof. A semiconductor bench includes a light receiving element and a plurality of recess elements on a surface thereof. A sidewall of the protruded elements or a sidewall of the recess elements is slanted. A first metallized layer is disposed on a bonding surface of each protruded element and a second metallized layer is disposed on a bottom surface of each recess element, wherein the first metallized layer is used for bonding with the second metallized layer.

    摘要翻译: 提供了一种接合系统和用于对准的接合方法。 光学半导体在其表面上包括光源和多个突出元件。 半导体工作台在其表面上包括光接收元件和多个凹陷元件。 突出元件的侧壁或凹部的侧壁是倾斜的。 第一金属化层设置在每个突出元件的接合表面上,并且第二金属化层设置在每个凹陷元件的底表面上,其中第一金属化层用于与第二金属化层结合。

    METHOD FOR DRIVING A LIGHT SOURCE AND A BACKING LIGHT SOURCE
    9.
    发明申请
    METHOD FOR DRIVING A LIGHT SOURCE AND A BACKING LIGHT SOURCE 有权
    驱动光源和背光源的方法

    公开(公告)号:US20080129224A1

    公开(公告)日:2008-06-05

    申请号:US11685972

    申请日:2007-03-14

    IPC分类号: H05B37/02

    CPC分类号: H05B33/0818

    摘要: A method for driving a light source first sets a frame time and a unit time, and calculates the number of the unit time that the frame time can contain. Based on the turned-on duration (DTi) of a light-emitting device of the light source and the unit time, the turned-on numbers (Ni) and the compensation times (CTI) of the light-emitting devices are calculated. The light-emitting device is driven to emit a light beam according to the turned-on numbers (Ni) and the compensation times (CTI). The present driving method can be applied to light source and backing light source of liquid crystal displays.

    摘要翻译: 用于驱动光源的方法首先设置帧时间和单位时间,并且计算帧时间可以包含的单位时间的数量。 基于光源的发光装置的接通持续时间(DTi)和单位时间,计算发光装置的导通数(Ni)和补偿时间(CTI)。 根据接通数(Ni)和补偿时间(CTI),驱动发光器件发射光束。 本驱动方法可应用于液晶显示器的光源和背光源。

    Photoresist having improved extreme-ultraviolet lithography imaging performance
    10.
    发明授权
    Photoresist having improved extreme-ultraviolet lithography imaging performance 有权
    光刻胶具有改进的极紫外光刻成像性能

    公开(公告)号:US09081280B2

    公开(公告)日:2015-07-14

    申请号:US13033725

    申请日:2011-02-24

    摘要: Provided is a photoresist that includes a polymer is free of a aromatic group and a photo acid generator (PAG) that has less than three aromatic groups. In an embodiment, the PAG includes an anion component and a cation component. The anion component has one of the following chemical formulas: R31C—CR21—CR21—CR21—SO3− R31C—CR21—CR21—SO3− R31C—CR21—SO3− R31C—SO3− The cation component has one of the following chemical formulas: Wherein R1 and R2 each represent a chemical compound.

    摘要翻译: 提供了包含不含芳族基团的聚合物和具有少于三个芳族基团的光酸产生剂(PAG)的光致抗蚀剂。 在一个实施方案中,PAG包括阴离子组分和阳离子组分。 阴离子成分具有以下化学式之一:R31C-CR21-CR21-CR21-SO3-R31C-CR21-CR21-SO3-R31C-CR21-SO3-R31C-SO3-阳离子成分具有以下化学式之一: 其中R1和R2各自表示化合物。