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公开(公告)号：US20170149383A1
公开(公告)日：2017-05-25
申请号：US15425709
申请日：2017-02-06
Applicant: Xiuwen Tu , David Aitan Soltz , Michael C. Johnson , Seung Bum Rim , Taiqing Qiu , Yu-Chen Shen , Kieran Mark Tracy
Inventor： Xiuwen Tu , David Aitan Soltz , Michael C. Johnson , Seung Bum Rim , Taiqing Qiu , Yu-Chen Shen , Kieran Mark Tracy
CPC classification number: H02S50/15 , G01N21/6408 , G01N21/6489 , G01N2201/06113 , G01N2201/0621
Abstract: Methods of testing a semiconductor, and semiconductor testing apparatus, are described. In an example, a method for testing a semiconductor can include applying light on the semiconductor to induce photonic degradation. The method can also include receiving a photoluminescence measurement induced from the applied light from the semiconductor and monitoring the photonic degradation of the semiconductor from the photoluminescence measurement.
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2.发明申请公开(公告)号：US20160043267A1
公开(公告)日：2016-02-11
申请号：US14919049
申请日：2015-10-21
Applicant: Seung Bum Rim , David D. Smith , Taiqing Qiu , Staffan Westerberg , Kieran Mark Tracy , Venkatasubramani Balu
Inventor： Seung Bum Rim , David D. Smith , Taiqing Qiu , Staffan Westerberg , Kieran Mark Tracy , Venkatasubramani Balu
IPC: H01L31/18 , H01L31/0236 , H01L31/0368 , H01L31/0224 , H01L31/068
CPC classification number: H01L31/022441 , H01L31/02167 , H01L31/02168 , H01L31/02363 , H01L31/03682 , H01L31/068 , H01L31/0682 , H01L31/0745 , H01L31/0747 , H01L31/1804 , H01L31/182 , H01L31/202 , H01L31/208 , Y02E10/547 , Y02P70/521
Abstract: Methods of fabricating solar cell emitter regions with differentiated P-type and N-type regions architectures, and resulting solar cells, are described. In an example, a back contact solar cell includes a substrate having a light-receiving surface and a back surface. A first polycrystalline silicon emitter region of a first conductivity type is disposed on a first thin dielectric layer disposed on the back surface of the substrate. A second polycrystalline silicon emitter region of a second, different, conductivity type is disposed on a second thin dielectric layer disposed on the back surface of the substrate. A third thin dielectric layer is disposed laterally directly between the first and second polycrystalline silicon emitter regions. A first conductive contact structure is disposed on the first polycrystalline silicon emitter region. A second conductive contact structure is disposed on the second polycrystalline silicon emitter region.
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公开(公告)号：US20110097720A1
公开(公告)日：2011-04-28
申请号：US12811503
申请日：2008-12-31
Applicant: Marco A. Ciufolini , Thomas D. Madden , Michael J. Hope , Barbara Mui , De Fougerolles Antonin , Tatiana Novobrantseva , Anna Borodovsky , Akin Akinc , Mark Tracy , Pieter Rutter Cullis
Inventor： Marco A. Ciufolini , Thomas D. Madden , Michael J. Hope , Barbara Mui , De Fougerolles Antonin , Tatiana Novobrantseva , Anna Borodovsky , Akin Akinc , Mark Tracy , Pieter Rutter Cullis
CPC classification number: G01N33/5088 , A01K2207/05 , A01K2227/105 , A01K2267/0381 , C12N15/111 , C12N15/1137 , C12N2310/14 , C12N2320/10 , C12Q1/6876 , C12Q2600/136 , C12Q2600/158 , C12Q2600/178 , C12Y304/21021 , G01N33/5023 , G01N33/5067 , G01N33/86 , G01N2333/745 , G01N2333/96447
Abstract: The invention features a method of identifying therapeutically relevant compositions which include a therapeutic agent and 2,2-Dilinoley 1-4-dimethylaminomethyl-[1,3]-dioxolane by screening for an effect of the agent on the liver of a model subject.
Abstract translation: 本发明的特征在于通过筛选试剂对模型受试者的肝脏的影响来鉴定治疗相关组合物的方法，所述组合物包括治疗剂和2,2-二苯胺基-4-二甲基氨基甲基 - [1,3] - 二氧杂环戊烷。
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公开(公告)号：US07228894B2
公开(公告)日：2007-06-12
申请号：US10836511
申请日：2004-04-30
Applicant: David A. Moore , Mark Tracy , Kerry Hill
Inventor： David A. Moore , Mark Tracy , Kerry Hill
IPC: F28F7/00
CPC classification number: H05K7/20472 , H01L23/36 , H01L23/552 , H01L2924/0002 , H01L2924/00
Abstract: A device for distributing waste heat from a heat source evenly across an exterior surface of an enclosure is disclosed. The device includes a first layer of material that has a high thermal conductivity along a first plane. One or more layers of material that include a controlled thermal conductivity along a second plane are connected with the first layer. At least one of those layers has a low thermal conductivity (e.g. a thermal insulating material) in the second plane and that layer is positioned between the heat source and the enclosure so that heat flow through that layer is substantially inhibited in the second plane and a majority of the waste heat is thermally transferred through the first layer along the first plane to the exterior surface where the waste heat is uniformly distributed thereby reducing hot spots on the exterior surface which can cause user discomfort.
Abstract translation: 公开了一种用于将来自热源的废热均匀地分布在外壳的外表面上的装置。 该装置包括沿着第一平面具有高导热性的第一材料层。 包括沿着第二平面的受控热导率的一层或多层材料与第一层连接。 这些层中的至少一个在第二平面中具有低导热性（例如绝热材料），并且该层位于热源和外壳之间，使得在第二平面中基本上禁止通过该层的热流，并且 大部分废热通过第一层沿着第一平面热传递到外表面，废热均匀分布，从而减少了外表面上的热点，这可能导致用户的不适。
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公开(公告)号：US20070024588A1
公开(公告)日：2007-02-01
申请号：US11190256
申请日：2005-07-26
Applicant: Memphis Yin , Mark Tracy
Inventor： Memphis Yin , Mark Tracy
IPC: G09G5/00
CPC classification number: G06F3/0202
Abstract: A keyboard lighting device is disclosed. In a preferred embodiment, a moving member may be placed in an operating position protruding from the keyboard, or in a retracted position. In the operating position, light is redirected from a light source to the keyboard so that use of the keyboard in dark environments is facilitated. Preferably, when the moving member is in its retracted position, the keyboard light appears to be a key on the keyboard.
Abstract translation: 公开了一种键盘照明装置。 在优选实施例中，移动构件可以放置在从键盘突出或在缩回位置突出的操作位置。 在操作位置，光从光源被重定向到键盘，从而便于在黑暗环境中使用键盘。 优选地，当移动构件处于其缩回位置时，键盘灯看起来是键盘上的键。
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Patent Agency Ranking
公开(公告)号：USD499504S1
公开(公告)日：2004-12-07
申请号：US29199378
申请日：2004-02-13
Applicant: Mark Tracy Meyer
Designer： Mark Tracy Meyer
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公开(公告)号：US5492656A
公开(公告)日：1996-02-20
申请号：US270759
申请日：1994-07-05
Applicant: Mark Tracy
Inventor： Mark Tracy
CPC classification number: E02D29/1445 , E02D29/12
Abstract: Apparatus and method for constructing a manhole collar between an existing manhole cone and a precast manhole ring. The apparatus includes a circular slip form tube, tapered from a larger top diameter to a smaller bottom diameter; at least two support arms, radially extending from adjacent the top of the slip form tube for placement on a support surface, such as a road surface, to hold the tube at a selected height relative to ground level within a manhole cone; and a plurality of fasteners for attachment of a precast manhole ring about the exterior periphery of the slip form tube for supporting the ring at a selected height relative to the manhole cone and the roadway surface. The apparatus may include a concrete spill retention ring, placeable upon the top rim of the manhole cone and around the slip form tube to prevent concrete from entering the manhole cone. The method of the invention includes the steps of supporting the slip form tube upon the roadway surface by the arms; fastening the manhole ring to the tube for proper positioning thereof; leveling the tube and ring; and the pouring of concrete about the slip form tube to form a ring-supporting concrete collar between the manhole cone and the manhole ring.
Abstract translation: 在现有的井眼锥体与预制井眼环之间构造井眼环的装置和方法。 该装置包括圆形滑动成形管，从更大的顶部直径向较小的底部直径逐渐变细; 至少两个支撑臂，从邻近滑动成形管的顶部径向延伸，用于放置在支撑表面（例如路面）上，以将管保持在相对于井眼锥体内的地平面的选定高度; 以及多个紧固件，用于将预制井眼环附接在滑动成形管的外周边上，用于将环支撑在相对于井眼锥体和道路表面的选定高度处。 该设备可以包括混凝土溢流保持环，可放置在井眼锥体的顶部边缘周围并且围绕滑动形成管，以防止混凝土进入人孔锥体。 本发明的方法包括以下步骤：通过臂支撑滑动管在道路表面上; 将人孔环固定到管上以使其正确定位; 校平管和环; 并将混凝土浇注在滑模管上，以形成孔眼锥体和人孔环之间的支撑环的混凝土环。
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8.发明授权公开(公告)号：US09634177B2
公开(公告)日：2017-04-25
申请号：US14919049
申请日：2015-10-21
Applicant: Seung Bum Rim , David D. Smith , Taiqing Qiu , Staffan Westerberg , Kieran Mark Tracy , Venkatasubramani Balu
Inventor： Seung Bum Rim , David D. Smith , Taiqing Qiu , Staffan Westerberg , Kieran Mark Tracy , Venkatasubramani Balu
IPC: H01L31/18 , H01L31/0224 , H01L31/068 , H01L31/20 , H01L31/0236 , H01L31/0368 , H01L31/0216 , H01L31/0745 , H01L31/0747
CPC classification number: H01L31/022441 , H01L31/02167 , H01L31/02168 , H01L31/02363 , H01L31/03682 , H01L31/068 , H01L31/0682 , H01L31/0745 , H01L31/0747 , H01L31/1804 , H01L31/182 , H01L31/202 , H01L31/208 , Y02E10/547 , Y02P70/521
Abstract: Methods of fabricating solar cell emitter regions with differentiated P-type and N-type regions architectures, and resulting solar cells, are described. In an example, a back contact solar cell includes a substrate having a light-receiving surface and a back surface. A first polycrystalline silicon emitter region of a first conductivity type is disposed on a first thin dielectric layer disposed on the back surface of the substrate. A second polycrystalline silicon emitter region of a second, different, conductivity type is disposed on a second thin dielectric layer disposed on the back surface of the substrate. A third thin dielectric layer is disposed laterally directly between the first and second polycrystalline silicon emitter regions. A first conductive contact structure is disposed on the first polycrystalline silicon emitter region. A second conductive contact structure is disposed on the second polycrystalline silicon emitter region.
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公开(公告)号：US09564854B2
公开(公告)日：2017-02-07
申请号：US14705268
申请日：2015-05-06
Applicant: Xiuwen Tu , David Aitan Soltz , Michael C. Johnson , Seung Bum Rim , Taiqing Qiu , Yu-Chen Shen , Kieran Mark Tracy
Inventor： Xiuwen Tu , David Aitan Soltz , Michael C. Johnson , Seung Bum Rim , Taiqing Qiu , Yu-Chen Shen , Kieran Mark Tracy
CPC classification number: H02S50/15 , G01N21/6408 , G01N21/6489 , G01N2201/06113 , G01N2201/0621
Abstract: Methods of testing a semiconductor, and semiconductor testing apparatus, are described. In an example, a method for testing a semiconductor can include applying light on the semiconductor to induce photonic degradation. The method can also include receiving a photoluminescence measurement induced from the applied light from the semiconductor and monitoring the photonic degradation of the semiconductor from the photoluminescence measurement.
Abstract translation: 对半导体测试方法和半导体测试设备进行描述。 在一个示例中，用于测试半导体的方法可以包括在半导体上施加光以引起光子降解。 该方法还可以包括接收从半导体施加的光引起的光致发光测量，并从光致发光测量监测半导体的光子劣化。
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公开(公告)号：US20160329864A1
公开(公告)日：2016-11-10
申请号：US14705268
申请日：2015-05-06
Applicant: Xiuwen Tu , David Aitan Soltz , Michael C. Johnson , Seung Bum Rim , Taiqing Qiu , Yu-Chen Shen , Kieran Mark Tracy
Inventor： Xiuwen Tu , David Aitan Soltz , Michael C. Johnson , Seung Bum Rim , Taiqing Qiu , Yu-Chen Shen , Kieran Mark Tracy
CPC classification number: H02S50/15 , G01N21/6408 , G01N21/6489 , G01N2201/06113 , G01N2201/0621
Abstract: Methods of testing a semiconductor, and semiconductor testing apparatus, are described. In an example, a method for testing a semiconductor can include applying light on the semiconductor to induce photonic degradation. The method can also include receiving a photoluminescence measurement induced from the applied light from the semiconductor and monitoring the photonic degradation of the semiconductor from the photoluminescence measurement.
Abstract translation: 对半导体测试方法和半导体测试设备进行描述。 在一个示例中，用于测试半导体的方法可以包括在半导体上施加光以引起光子降解。 该方法还可以包括接收从半导体施加的光引起的光致发光测量，并从光致发光测量监测半导体的光子劣化。
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