摘要:
A method of securing a design-for-test scan chain within a programmable integrated circuit device (IC) can include placing the programmable IC in an operational mode and responsive to a request to access a scan chain within the programmable IC, selectively enabling a secure mode within the programmable IC according to a configuration state of the programmable IC. Enabling secure mode within the programmable IC can provide access to the scan chain. Responsive to enabling the secure mode, the programmable IC can remain in the secure mode and be prevented from re-entering the operational mode until the programmable IC is power cycled.
摘要:
A circuit for repairing defective memory of an integrated circuit is disclosed. The circuit includes blocks of memory; and interconnect elements providing data to each of the blocks of memory, where the interconnect elements enable coupling together the signals for programming the blocks of memory. The circuit also includes a directory of locations for defective memory cells of blocks of memory, where the directory of locations is common to the blocks of memory for storing locations of defective memory cells of the blocks of memory. Methods of repairing defective memory of an integrated circuit are also disclosed.
摘要:
Method and apparatus for self-checking and self-correcting memory states of a programmable resource is described. Programmable resource of an integrated circuit has a first core and a second core instantiated therein. A first internal configuration port and a second internal configuration port of the integrated circuit are respectively connected to the first core and the second core. The second core is coupled to the first core for monitoring operation of the first core with the second core, and the second core is configured to obtain control responsive to a failure of the first core or the first internal configuration port for a self-correcting mode.
摘要:
When a first sub-circuit of a programmable integrated circuit (“IC”) is to be deactivated, a global write enable (GWE) signal is deasserted. In response to deassertion of the GWE signal and a first memory cell associated with the first sub-circuit being in a first state, flip-flops in the first sub-circuit are disabled from changing state. In response to memory cells associated with sub-circuits other than the first sub-circuit being in a second state, flip-flops in the other sub-circuits are enabled to change state. When the first sub-circuit is to be activated, the GWE signal is asserted. Logic implemented by the first sub-circuit is preserved between the deasserting and the asserting of the GWE signal. In response to assertion of the GWE signal and the first memory cell associated with the first sub-circuit being in the first state, flip-flops in the first sub-circuit are enabled to change state.
摘要:
A system for protecting an input/output (I/O) pin of an integrated circuit device (IC) from single event transients is disclosed. The system includes a first delay circuit that is configured to delay a clock signal from the clock source by a first predetermined amount of time, and a second delay circuit that is configured to delay the clock signal by a second predetermined amount of time. The system further includes a first register that is clocked by the clock signal, a second register that is clocked by the clock signal delayed by the first predetermined amount of time, and a third register that is clocked by the clock signal delayed by the second predetermined amount of time. The system also includes voter circuits, where each voter circuit is configured to receive a first data signal from an output of the first register, a second data signal from an output of the second register, and a third data signal from an output of the third register.
摘要:
A method of processor operation using an integrated circuit (IC) can include loading encrypted program code into the IC through a configuration port of the IC and decrypting the encrypted program code using configuration circuitry of the IC. Decryption of the encrypted program code can result in decrypted program code which can be provided to a target destination.
摘要:
An embodiment of an integrated circuit (IC) is described. This embodiment of the IC includes an interposer; a first die on an interposer, where the first die generates a global signal propagated through the interposer; and a second die on the surface of the interposer and coupled to the global signal. The first die and the second die each is configured to implement a same operating state concurrently in response to the global signal.
摘要:
An embodiment of an integrated circuit (IC) is described. This embodiment of the IC includes an interposer; a first die on an interposer, where the first die generates a global signal propagated through the interposer; and a second die on the surface of the interposer and coupled to the global signal. The first die and the second die each is configured to implement a same operating state concurrently in response to the global signal.
摘要:
Methods and apparatus for the protection of memory within an integrated circuit (IC) are provided for various phases of operation of the IC. Various portions of sensitive data may be contained within battery backed random access memory (RAM) (310), which may then be protected using either a passive, or an active, zeroization sequence depending upon the phase of operation of the IC. In an idle state, detection circuit (324) senses a drop in battery power (VBATT) to launch active destruction of RAM (310) memory using active zeroization circuits (312 and 314). In a configuration state, detection circuit (402) or (504) senses a drop in battery power (VBATT) to launch active destruction of RAM (310) memory using active zeroization circuits (312 and 314). In an operational state, various methods may be employed to detect and counteract the unauthorized access to RAM (310).
摘要翻译:为集成电路(IC)中的存储器的保护提供了用于IC的各种操作阶段的方法和装置。 敏感数据的各个部分可以包含在电池支持的随机存取存储器(RAM)(310)中,然后根据IC的操作阶段,其可以使用无源或有源零序序列进行保护。 在空闲状态下,检测电路(324)感测到使用有源归零电路(312和314)的电池功率的下降(V BAT BAT)以发起RAM(310)存储器的有效破坏。 在配置状态下,检测电路(402)或(504)检测电池功率的下降(V BAT BAT)以使用主动归零电路(312和314)来启动RAM(310)存储器的有效破坏, 。 在操作状态下,可以采用各种方法来检测和抵消未经授权的访问RAM(310)。
摘要:
Approaches for partially reconfiguring a frame are disclosed. In one approach, a circuit arrangement includes programmable resources, frames of configuration memory cells, and partial configuration control memory cells. Each frame includes a plurality of subsets of configuration memory cells, and each subset configures one of the programmable resources. Each partial configuration control memory cell is coupled to a respective one of the subsets. Responsive to a first partial bitstream that includes a quantity of configuration data for all the subsets of configuration cells of a first frame of the plurality of frames, each subset of the configuration memory cells of the first frame is configurable or not configurable responsive to the state of the associated partial configuration control memory cell.