Land grid array stiffener for use with flexible chip carriers
    3.
    发明授权
    Land grid array stiffener for use with flexible chip carriers 失效
    用于柔性芯片载体的土地格栅阵列加强筋

    公开(公告)号:US06905961B2

    公开(公告)日:2005-06-14

    申请号:US10336579

    申请日:2003-01-03

    IPC分类号: H01L23/498 H01L21/44

    摘要: A flexible chip carrier with contact pads on its upper surface matching those of the chip with said pads conductively connected to land grid array (LGA) pads on its lower surface matching the those of a card or PCB. The chip carrier is provided with a stiffening layer at the LGA interface. The stiffening layer is mechanically attached to the lower surface of the chip carrier. Holes are formed in the stiffening layer to expose the LGA pads. The holes are then filled with a conductive adhesive material. Compliant LGA bumps are applied to the uncured conductive adhesive material which material is then cured.

    摘要翻译: 具有在其上表面上具有接触焊盘的柔性芯片载体,其与所述芯片的接触焊盘匹配,所述焊盘导电地连接到其下表面上与卡或PCB匹配的焊盘格栅阵列(LGA)焊盘。 芯片载体在LGA接口处设有加强层。 加强层机械地附接到芯片载体的下表面。 在加强层中形成孔以暴露LGA垫。 然后用导电粘合剂材料填充孔。 对未固化的导电粘合剂材料施加合适的LGA凸块,该材料然后被固化。

    Apparatus for pressing an electronic card against contacts of a test
socket
    5.
    发明授权
    Apparatus for pressing an electronic card against contacts of a test socket 失效
    用于将电子卡抵抗测试插座的触点的装置

    公开(公告)号:US6014031A

    公开(公告)日:2000-01-11

    申请号:US762790

    申请日:1996-12-10

    IPC分类号: G01R31/28 G01R31/02

    CPC分类号: G01R31/2808

    摘要: A test structure tests an electronic card having electrical contacts on one face and a chip on the other face. By way of example, the electrical contacts on the card comprise an array of solder balls. The structure comprises a socket for receiving the card such that the electrical contacts of the card face electrical contacts within the socket. The structure further comprises a plate, received over the socket and having at least two ribs which protrude downwardly from one face of the plate and are positioned over the socket to engage a center portion of the chip when the card is received in the socket. The plate also has at least two holes. One of the ribs is positioned between the two holes but does not surround either of the holes. Consequently, forced air can flow downwardly through the holes in the plate, horizontally between the plate and the chip and out of the test structure. Preferably, the two ribs cross each other, and there are four holes in the plate which are arranged in four respective quadrants defined by the cross.

    摘要翻译: 测试结构测试在一个面上具有电触点和另一个面上的芯片的电子卡。 作为示例,卡上的电触点包括焊球阵列。 该结构包括用于接收卡的插座,使得卡的电触点在插座内电接触。 该结构还包括一个板,容纳在该插座上,并且具有至少两个从板的一个表面向下突出的肋,并且当卡被接纳在插座中时位于插座上方以接合芯片的中心部分。 该板还具有至少两个孔。 其中一个肋位于两个孔之间,但不围绕任何一个孔。 因此,强制空气可以通过板中的孔向下流动,在板和芯片之间水平地离开测试结构。 优选地,两个肋彼此交叉,并且板中有四个孔布置在由十字架限定的四个相应的象限中。