LITHOGRAPHIC APPARATUS AND COOLING METHOD

    公开(公告)号:US20210132514A1

    公开(公告)日:2021-05-06

    申请号:US16604976

    申请日:2018-01-31

    IPC分类号: G03F7/20

    摘要: A lithographic apparatus arranged to project a pattern from a patterning device onto a substrate, comprising at least one housing comprising at least one internal wall, at least one optical component arranged within at least one chamber defined at least in part by the at least one internal wall and configured to receive a radiation beam and a cooling apparatus arranged to cool at least a portion of the at least one internal wall to a temperature below that of the at least one optical component.