Method for identifying defective elements in array molding of semiconductor packaging

    公开(公告)号:US06391666B1

    公开(公告)日:2002-05-21

    申请号:US09475007

    申请日:1999-12-30

    IPC分类号: H01L2166

    摘要: The present invention is a method for identifying defective elements in array molding of semiconductor packaging for mini BGA packaging substrate which comprises a circuit zone and a periphery zone. The method of the present invention is first to form a plurality of package sites disposed in array in the circuit zone, and to form a plurality of marks in a periphery zone. When a defective element is found in the package sites, a symbol is put at the mark or an electronic file is employed to record the location of the defective element, thereby, the defective element in the package sites of the molding array in the circuit zone can be identified.

    Quad flat non-leaded package and leadframe for use in a quad flat non-leaded package
    4.
    发明授权
    Quad flat non-leaded package and leadframe for use in a quad flat non-leaded package 有权
    四面扁平无铅封装和引线框架,用于四方扁平无铅封装

    公开(公告)号:US06583499B2

    公开(公告)日:2003-06-24

    申请号:US09861757

    申请日:2001-05-21

    IPC分类号: H01L23495

    摘要: A quad flat non-leaded package comprises: a die pad having a first upper surface and a corresponding first lower surface thereon a plurality of interlacing slots are formed, each of the interlacing slots extending to the edges of the die pad to form a plurality of island-like blocks; a plurality of leads disposed at the periphery of the die pad, wherein each of the leads has respectively a second upper surface and a corresponding second lower surface coplanar to the surface of the island-like blocks; a chip having an active surface and a corresponding back surface adhered onto the first upper surface of the die pad; and a molding compound encapsulating the chip, the second upper surface, the first upper surface and the interlacing slots while exposing the surface of the island-like blocks and the second lower surface of the leads.

    摘要翻译: 四边形无铅包装包括:形成具有第一上表面和其上的对应的第一下表面的管芯焊盘,其上形成有多个交缠槽,每个交缠槽延伸到管芯焊盘的边缘以形成多个 岛状块 多个引线设置在管芯焊盘的周边,其中每个引线分别具有与岛状块的表面共面的第二上表面和相应的第二下表面; 芯片,其具有粘附到芯片焊盘的第一上表面上的活性表面和对应的背面; 以及在使岛状块的表面和引线的第二下表面暴露的同时封装芯片,第二上表面,第一上表面和交织槽的模塑料。

    Multi-chip packaging having non-sticking test structure
    8.
    发明授权
    Multi-chip packaging having non-sticking test structure 失效
    具有不粘试验结构的多芯片封装

    公开(公告)号:US06392425B1

    公开(公告)日:2002-05-21

    申请号:US09475005

    申请日:1999-12-30

    IPC分类号: G01R3102

    摘要: A multi-chip packaging substrate having a non-sticking test structure consists of a plurality of non-sticking test spots formed in the periphery zone outside the chip-packaging zone of a multi-chip packaging substrate. Each of these non-sticking test spots is electrically connected to an adjacent one of a plurality of chip pads respectively in the chip packaging zone through a plurality of conductive traces while there are no electrical connections connected one another among the chip pads.

    摘要翻译: 具有不粘试验结构的多芯片封装基板由在多芯片封装基板的芯片封装区域外部的外围区域形成的多个不粘附试验点构成。 这些不粘贴的测试点中的每一个都通过多个导电迹线电连接到芯片封装区域中的多个芯片焊盘中的相邻的一个,同时在芯片焊盘之间没有彼此连接的电连接。

    Crack-preventive substrate and process for fabricating solder mask
    10.
    发明授权
    Crack-preventive substrate and process for fabricating solder mask 失效
    防裂衬底和制造焊接掩模的工艺

    公开(公告)号:US06291260B1

    公开(公告)日:2001-09-18

    申请号:US09482758

    申请日:2000-01-13

    IPC分类号: H01L2144

    摘要: A crack-preventive substrate for fabricating a solder mask in a device site region includes a substrate, which has a top surface and a bottom surface, and a solder mask layer. The substrate is divided into a device site region and a periphery region. The solder mask layer, disposed on the top surface and bottom surface of the substrate, forms a bare area on the top surface and bottom surface of the substrate by exposing a portion of the substrate on the top surface and bottom surface of the substrate. And the bare areas divide the solder mask layer into a “device site region solder mask layer” and a “periphery region solder mask layer”. As a result, the crack lines generated on the solder mask layer at the perimeter of the substrate will not develop toward the solder mask in the device site region.

    摘要翻译: 用于在器件位置区域制造焊料掩模的防裂衬底包括具有顶表面和底表面的衬底和焊料掩模层。 将基板分为装置位置区域和外围区域。 设置在基板的顶表面和底表面上的焊料掩模层通过在基板的顶表面和底表面上暴露基板的一部分而在基板的顶表面和底表面上形成裸露区域。 并且裸露区域将焊接掩模层分成“器件区域焊料掩模层”和“外围区域焊接掩模层”。 结果,在衬底的周边处的焊料掩模层上产生的裂纹线将不会朝向器件位置区域中的焊接掩模发展。