公开(公告)号：US08946829B2

公开(公告)日：2015-02-03

申请号：US13273527

申请日：2011-10-14

申请人： Clement Hsingjen Wann ,  Ling-Yen Yeh ,  Chi-Yuan Shih ,  Yi-Tang Lin ,  Chih-Sheng Chang ,  Chi-Wen Liu

发明人： Clement Hsingjen Wann ,  Ling-Yen Yeh ,  Chi-Yuan Shih ,  Yi-Tang Lin ,  Chih-Sheng Chang ,  Chi-Wen Liu

IPC分类号： H01L27/088 ,  H01L21/8238 ,  H01L21/84 ,  H01L29/78 ,  H01L27/092 ,  H01L27/12 ,  H01L29/06 ,  H01L29/66

CPC分类号： H01L21/823431 ,  H01L21/265 ,  H01L21/31111 ,  H01L21/76224 ,  H01L21/823481 ,  H01L21/823821 ,  H01L21/845 ,  H01L27/088 ,  H01L27/0924 ,  H01L27/1211 ,  H01L29/06 ,  H01L29/66818 ,  H01L29/78 ,  H01L29/7853 ,  H01L29/7854

摘要： A semiconductor apparatus includes fin field-effect transistor (FinFETs) having shaped fins and regular fins. Shaped fins have top portions that may be smaller, larger, thinner, or shorter than top portions of regular fins. The bottom portions of shaped fins and regular fins are the same. FinFETs may have only one or more shaped fins, one or more regular fins, or a mixture of shaped fins and regular fins. A semiconductor manufacturing process to shape one fin includes forming a photolithographic opening of one fin, optionally doping a portion of the fin, and etching a portion of the fin.

摘要翻译： 半导体装置包括具有成形翅片和规则翅片的鳍状场效应晶体管（FinFET）。 成形翅片的顶部可以比普通翅片的顶部更小，更大，更薄或更短。 成形翅片和规则翅片的底部是相同的。 FinFET可以仅具有一个或多个成形翅片，一个或多个规则翅片，或者成形翅片和规则翅片的混合物。 形成一个鳍片的半导体制造工艺包括形成一个鳍片的光刻开口，可选地掺杂鳍片的一部分，以及蚀刻鳍片的一部分。

公开(公告)号：US08963257B2

公开(公告)日：2015-02-24

申请号：US13293732

申请日：2011-11-10

申请人： Clement Hsingjen Wann ,  Ling-Yen Yeh ,  Chi-Yuan Shih ,  Yi-Tang Lin ,  Chih-Sheng Chang

发明人： Clement Hsingjen Wann ,  Ling-Yen Yeh ,  Chi-Yuan Shih ,  Yi-Tang Lin ,  Chih-Sheng Chang

IPC分类号： H01L27/088 ,  H01L21/8238 ,  H01L21/84 ,  H01L27/092 ,  H01L27/12 ,  H01L29/66

CPC分类号： H01L29/66818 ,  H01L21/2236 ,  H01L21/823431 ,  H01L21/823462 ,  H01L21/823807 ,  H01L21/823814 ,  H01L21/823821 ,  H01L21/823857 ,  H01L21/823878 ,  H01L21/845 ,  H01L27/0924 ,  H01L27/1211

摘要： The disclosure relates to a Fin field effect transistor (FinFET). An exemplary structure for a FinFET comprises a substrate comprising a top surface; a first fin and a second fin extending above the substrate top surface, wherein each of the fins has a top surface and sidewalls; an insulation layer between the first and second fins extending part way up the fins from the substrate top surface; a first gate dielectric covering the top surface and sidewalls of the first fin having a first thickness and a second gate dielectric covering the top surface and sidewalls of the second fin having a second thickness less than the first thickness; and a conductive gate strip traversing over both the first gate dielectric and second gate dielectric.

摘要翻译： 本发明涉及Fin场效应晶体管（FinFET）。 FinFET的示例性结构包括：包括顶表面的衬底; 在所述基板顶表面上方延伸的第一翅片和第二翅片，其中每个翼片具有顶表面和侧壁; 所述第一和第二翅片之间的绝缘层从所述基板顶表面向上延伸所述翅片; 覆盖第一鳍片的顶表面和第一鳍片的侧壁的第一栅极电介质和覆盖第二鳍片的顶表面和第二鳍片的侧壁的第二栅极电介质具有小于第一厚度的第二厚度; 以及穿过第一栅极电介质和第二栅极电介质两端的导电栅极条。

公开(公告)号：US08816444B2

公开(公告)日：2014-08-26

申请号：US13416862

申请日：2012-03-09

申请人： Clement Hsingjen Wann ,  Chih-Sheng Chang ,  Yi-Tang Lin ,  Ming-Feng Shieh ,  Ting-Chu Ko ,  Chung-Hsien Chen

发明人： Clement Hsingjen Wann ,  Chih-Sheng Chang ,  Yi-Tang Lin ,  Ming-Feng Shieh ,  Ting-Chu Ko ,  Chung-Hsien Chen

IPC分类号： H01L27/088

CPC分类号： H01L27/0886 ,  G03F1/00 ,  G06F17/5068 ,  G06F17/5081 ,  H01L21/823821 ,  H01L21/845 ,  H01L23/48 ,  H01L27/0207 ,  H01L29/41791 ,  H01L29/66795 ,  H01L29/7831 ,  H01L2924/0002 ,  H01L2924/00

摘要： A method for generating a layout for a device having FinFETs from a first layout for a device having planar transistors is disclosed. The planar layout is analyzed and corresponding FinFET structures are generated in a matching fashion. The resulting FinFET structures are then optimized. Dummy patterns and a new metal layer may be generated before the FinFET layout is verified and outputted.

公开(公告)号：US08799833B2

公开(公告)日：2014-08-05

申请号：US13416907

申请日：2012-03-09

申请人： Clement Hsingjen Wann ,  Chih-Sheng Chang ,  Yi-Tang Lin ,  Ming-Feng Shieh

发明人： Clement Hsingjen Wann ,  Chih-Sheng Chang ,  Yi-Tang Lin ,  Ming-Feng Shieh

IPC分类号： G06F17/50

CPC分类号： G06F17/5068

摘要： A method for generating a layout for a device having FinFETs from a first layout for a device having planar transistors is disclosed. The planar layout is analyzed and corresponding FinFET structures are generated in a matching fashion. The resulting FinFET structures are then optimized. Dummy patterns and a new metal layer may be generated before the FinFET layout is verified and outputted.

公开(公告)号：US08621406B2

公开(公告)日：2013-12-31

申请号：US13416642

申请日：2012-03-09

申请人： Cheok-Kei Lei ,  Yi-Tang Lin ,  Hsiao-Hui Chen ,  Yu-Ning Chang ,  Shu-Yu Chen ,  Chien-Wen Chen ,  Chih-Sheng Chang ,  Clement Hsingjen Wann

发明人： Cheok-Kei Lei ,  Yi-Tang Lin ,  Hsiao-Hui Chen ,  Yu-Ning Chang ,  Shu-Yu Chen ,  Chien-Wen Chen ,  Chih-Sheng Chang ,  Clement Hsingjen Wann

IPC分类号： G06F17/50

CPC分类号： H01L27/0207 ,  G06F17/5068 ,  H01L21/823821

摘要： A method for generating a layout for a device having FinFETs from a first layout for a device having planar transistors is disclosed. The planar layout is analyzed and corresponding FinFET structures are generated.

摘要翻译： 公开了一种用于从具有平面晶体管的器件的第一布局生成具有FinFET的器件的布局的方法。 分析平面布局并生成相应的FinFET结构。

公开(公告)号：US08726220B2

公开(公告)日：2014-05-13

申请号：US13416742

申请日：2012-03-09

申请人： Yi-Tang Lin ,  Cheok-Kei Lei ,  Shu-Yu Chen ,  Yu-Ning Chang ,  Hsiao-Hui Chen ,  Chih-Sheng Chang ,  Chien-Wen Chen ,  Clement Hsingjen Wann

发明人： Yi-Tang Lin ,  Cheok-Kei Lei ,  Shu-Yu Chen ,  Yu-Ning Chang ,  Hsiao-Hui Chen ,  Chih-Sheng Chang ,  Chien-Wen Chen ,  Clement Hsingjen Wann

IPC分类号： G06F17/50

CPC分类号： G06F17/5081 ,  G06F17/5068 ,  H01L21/823821 ,  H01L27/0207

摘要： A method for generating a layout for a device having FinFETs from a first layout for a device having planar transistors is disclosed. The planar layout is analyzed and corresponding FinFET structures are generated in a matching fashion. The resulting FinFET structures are then optimized. Dummy patterns and a new metal layer may be generated before the FinFET layout is verified and outputted.

摘要翻译： 公开了一种用于从具有平面晶体管的器件的第一布局生成具有FinFET的器件的布局的方法。 分析平面布局，并以相符的方式生成对应的FinFET结构。 然后优化所得的FinFET结构。 在验证并输出FinFET布局之前，可能会产生虚拟图案和新的金属层。

公开(公告)号：US20140048888A1

公开(公告)日：2014-02-20

申请号：US13588860

申请日：2012-08-17

申请人： Chung-Hsien Chen ,  Ting-Chu Ko ,  Chih-Hao Chang ,  Chih-Sheng Chang ,  Shou-Zen Chang ,  Clement Hsingjen Wann

发明人： Chung-Hsien Chen ,  Ting-Chu Ko ,  Chih-Hao Chang ,  Chih-Sheng Chang ,  Shou-Zen Chang ,  Clement Hsingjen Wann

IPC分类号： H01L27/092 ,  H01L21/20

CPC分类号： H01L21/02664 ,  H01L21/02529 ,  H01L21/02532 ,  H01L21/02576 ,  H01L21/02579 ,  H01L21/0262 ,  H01L21/28518 ,  H01L21/76814 ,  H01L21/823807 ,  H01L21/823814 ,  H01L29/165 ,  H01L29/665 ,  H01L29/66636 ,  H01L29/7845 ,  H01L29/7848

摘要： A semiconductor device comprises a substrate comprising a major surface; a p-type Field Effect Transistor (pFET) comprising: a P-gate stack over the major surface, a P-strained region in the substrate adjacent to one side of the P-gate stack, wherein a lattice constant of the P-strained region is different from a lattice constant of the substrate, wherein the P-strained region has a first top surface higher than the major surface; and a P-silicide region on the P-strained region; and an n-type Field Effect Transistor (nFET) comprising: an N-gate stack over the major surface, an N-strained region in the substrate adjacent to one side of the N-gate stack, wherein a lattice constant of the N-strained region is different from a lattice constant of the substrate, wherein the N-strained region has a second top surface lower than the major surface and a N-silicide region on the N-strained region.

公开(公告)号：US20110068407A1

公开(公告)日：2011-03-24

申请号：US12831903

申请日：2010-07-07

申请人： Chih Chieh Yeh ,  Chih-Sheng Chang ,  Clement Hsingjen Wann

发明人： Chih Chieh Yeh ,  Chih-Sheng Chang ,  Clement Hsingjen Wann

IPC分类号： H01L27/092

CPC分类号： H01L21/8256 ,  H01L21/02532 ,  H01L21/02535 ,  H01L21/76224 ,  H01L21/823807 ,  H01L21/823814 ,  H01L21/823821 ,  H01L21/823878 ,  H01L29/0847 ,  H01L29/6681 ,  H01L29/7848

摘要： An integrated circuit structure includes an n-type fin field effect transistor (FinFET) and a p-type FinFET. The n-type FinFET includes a first germanium fin over a substrate; a first gate dielectric on a top surface and sidewalls of the first germanium fin; and a first gate electrode on the first gate dielectric. The p-type FinFET includes a second germanium fin over the substrate; a second gate dielectric on a top surface and sidewalls of the second germanium fin; and a second gate electrode on the second gate dielectric. The first gate electrode and the second gate electrode are formed of a same material having a work function close to an intrinsic energy level of germanium.

摘要翻译： 集成电路结构包括n型鳍式场效应晶体管（FinFET）和p型FinFET。 n型FinFET包括在衬底上的第一锗鳍; 顶表面上的第一栅电介质和第一锗鳍的侧壁; 以及在第一栅极电介质上的第一栅电极。 p型FinFET在衬底上包括第二个锗鳍; 在顶表面上的第二栅电介质和第二锗鳍的侧壁; 和在第二栅极电介质上的第二栅电极。 第一栅电极和第二栅极由具有接近锗的固有能级的功函数的相同材料形成。

公开(公告)号：US09245805B2

公开(公告)日：2016-01-26

申请号：US12831903

申请日：2010-07-07

申请人： Chih Chieh Yeh ,  Chih-Sheng Chang ,  Clement Hsingjen Wann

发明人： Chih Chieh Yeh ,  Chih-Sheng Chang ,  Clement Hsingjen Wann

IPC分类号： H01L21/70 ,  H01L27/088 ,  H01L29/78 ,  H01L29/20 ,  H01L21/02 ,  H01L29/06 ,  H01L21/8238 ,  H01L29/66

CPC分类号： H01L21/8256 ,  H01L21/02532 ,  H01L21/02535 ,  H01L21/76224 ,  H01L21/823807 ,  H01L21/823814 ,  H01L21/823821 ,  H01L21/823878 ,  H01L29/0847 ,  H01L29/6681 ,  H01L29/7848

摘要： An integrated circuit structure includes an n-type fin field effect transistor (FinFET) and a p-type FinFET. The n-type FinFET includes a first germanium fin over a substrate; a first gate dielectric on a top surface and sidewalls of the first germanium fin; and a first gate electrode on the first gate dielectric. The p-type FinFET includes a second germanium fin over the substrate; a second gate dielectric on a top surface and sidewalls of the second germanium fin; and a second gate electrode on the second gate dielectric. The first gate electrode and the second gate electrode are formed of a same material having a work function close to an intrinsic energy level of germanium.

摘要翻译： 集成电路结构包括n型鳍式场效应晶体管（FinFET）和p型FinFET。 n型FinFET包括在衬底上的第一锗鳍; 顶表面上的第一栅电介质和第一锗鳍的侧壁; 以及在第一栅极电介质上的第一栅电极。 p型FinFET在衬底上包括第二个锗鳍; 在顶表面上的第二栅电介质和第二锗鳍的侧壁; 和在第二栅极电介质上的第二栅电极。 第一栅电极和第二栅极由具有接近锗的固有能级的功函数的相同材料形成。

公开(公告)号：US08896055B2

公开(公告)日：2014-11-25

申请号：US13585436

申请日：2012-08-14

申请人： Chih Chieh Yeh ,  Chih-Sheng Chang ,  Clement Hsingjen Wann

发明人： Chih Chieh Yeh ,  Chih-Sheng Chang ,  Clement Hsingjen Wann

IPC分类号： H01L21/336 ,  H01L27/088 ,  H01L29/78 ,  H01L29/66 ,  H01L21/8234

CPC分类号： H01L29/7851 ,  H01L21/823431 ,  H01L29/165 ,  H01L29/267 ,  H01L29/66795 ,  H01L29/7848 ,  H01L2029/7857

摘要： This description relates to a fin field-effect-transistor (FinFET) including a substrate and a fin structure on the substrate. The fin structure includes a channel between a source and a drain, wherein the source, the drain, and the channel have a first type dopant, and the channel comprises at least one of a Ge, SiGe, or III-V semiconductor. The FinFET further includes a gate dielectric layer over the channel and a gate over the gate dielectric layer. The FinFET further includes a nitride spacer on the substrate adjacent the gate and an oxide layer between the nitride spacer and the gate and between the nitride spacer and the substrate.

摘要翻译： 本说明书涉及在基板上包括基板和翅片结构的鳍状场效应晶体管（FinFET）。 鳍结构包括源极和漏极之间的沟道，其中源极，漏极和沟道具有第一类型掺杂物，并且沟道包括Ge，SiGe或III-V半导体中的至少一个。 FinFET还包括通道上的栅极介电层和栅极电介质层上的栅极。 FinFET还包括邻近栅极的衬底上的氮化物间隔物和氮化物间隔物和栅极之间以及氮化物间隔物和衬底之间的氧化物层。