Apparatus for accurate and efficient quality and reliability evaluation of micro electromechanical systems
    4.
    发明授权
    Apparatus for accurate and efficient quality and reliability evaluation of micro electromechanical systems 失效
    微机电系统的准确高效的质量和可靠性评估装置

    公开(公告)号:US07602265B2

    公开(公告)日:2009-10-13

    申请号:US11163485

    申请日:2005-10-20

    IPC分类号: H01H51/22

    CPC分类号: H01H59/0009

    摘要: The present invention provides multiple test structures for performing reliability and qualification tests on MEMS switch devices. A Test structure for contact and gap characteristic measurements is employed having a serpentine layout simulates rows of upper and lower actuation electrodes. A cascaded switch chain test is used to monitor process defects with large sample sizes. A ring oscillator is used to measure switch speed and switch lifetime. A resistor ladder test structure is configured having each resistor in series with a switch to be tested, and having each switch-resistor pair electrically connected in parallel. Serial/parallel test structures are proposed with MEMS switches working in tandem with switches of established technology. A shift register is used to monitor the open and close state of the MEMS switches. Pull-in voltage, drop-out voltage, activation leakage current, and switch lifetime measurements are performed using the shift register.

    摘要翻译: 本发明提供用于在MEMS开关装置上执行可靠性和鉴定测试的多个测试结构。 采用具有蛇形布局的接触和间隙特性测量的测试结构来模拟上下驱动电极的行。 级联交换链测试用于监控大样本量的过程缺陷。 环形振荡器用于测量开关速度和开关寿命。 电阻梯形测试结构被配置为具有与要测试的开关串联的每个电阻器,并且每个开关电阻器对并联电连接。 提出了串联/并联测试结构,其中MEMS开关与成熟技术的开关串联工作。 移位寄存器用于监测MEMS开关的开启和关闭状态。 使用移位寄存器执行拉入电压,掉电电压,启动漏电流和开关寿命测量。