Electronically tuned matching network using predictor-corrector control
system
    7.
    发明授权
    Electronically tuned matching network using predictor-corrector control system 失效
    使用预测器校正器控制系统的电子调谐匹配网络

    公开(公告)号:US5187454A

    公开(公告)日:1993-02-16

    申请号:US825658

    申请日:1992-01-23

    CPC分类号: H03H11/30 H01F2029/143

    摘要: A method, and corresponding apparatus, for matching a generator impedance with an unknown and possibly changing load impedance, to maximize power transferred to the load. The apparatus includes an impedance matching network, and a network model, to estimate the load impedance from known present network values and a measurement of network input impedance, and to estimate optimum network values from the input impedance and the estimated load impedance. A controller computes new network values based on the present and optimum values, and outputs the new values to the network. The process is repeated using the new network values to estimate the load impedance and generate a new set of optimum values. The controller uses a control equation with parameters selected to ensure rapid convergence on the maximum-power condition, without overshoot or instability. Preferably, current and voltage measurements are made in the network to enable correction of the network values based on these measurements on the actual network. Although the invention may be used with any type of variable-impedance network hardware, preferably current-controlled inductances are used as the variable network impedances.

    摘要翻译: 一种用于将发电机阻抗与未知且可能变化的负载阻抗进行匹配的方法和相应装置,以最大化传递到负载的功率。 该装置包括阻抗匹配网络和网络模型,以从已知的现有网络值估计负载阻抗和网络输入阻抗的测量,并根据输入阻抗和估计的负载阻抗来估计最佳网络值。 控制器根据当前和最佳值计算新的网络值,并将新值输出到网络。 使用新的网络值重复该过程以估计负载阻抗并产生一组新的最优值。 控制器使用具有选定参数的控制方程,以确保最大功率条件下的快速收敛,无过冲或不稳定。 优选地,在网络中进行电流和电压测量以使得能够基于在实际网络上的这些测量来校正网络值。 虽然本发明可以与任何类型的可变阻抗网络硬件一起使用,但优选地使用电流控制的电感作为可变网络阻抗。

    Electrostatic chuck usable in high density plasma
    8.
    发明授权
    Electrostatic chuck usable in high density plasma 失效
    静电吸盘可用于高密度等离子体

    公开(公告)号:US5583737A

    公开(公告)日:1996-12-10

    申请号:US452351

    申请日:1995-05-26

    CPC分类号: H01L21/6833 H01L21/6831

    摘要: An electrostatic chuck for holding a wafer in a plasma processing chamber, the chuck including a pedestal having a top surface, an internal manifold for carrying a cooling gas, and a first plurality of holes leading from the internal manifold toward said top surface; and a dielectric layer on the top surface of the pedestal. The dielectric layer has a top side and second plurality of holes, each of which is aligned with a different one of the holes of the first plurality of holes in the pedestal. The first and second holes form a plurality of passages extending from the internal manifold to the top side of the dielectric layer and through which the cooling gas is supplied to the backside of the wafer. Each of the first holes and the second hole aligned therewith form a different one of the plurality of passages. The passages are concentrated in regions of the dielectric layer that are in proximity to regions of higher leakage of cooling gas when the wafer is held against the electrostatic chuck by an electrostatic force.

    摘要翻译: 一种用于将晶片保持在等离子体处理室中的静电卡盘,所述卡盘包括具有顶表面的基座,用于承载冷却气体的内部歧管以及从所述内部歧管向所述顶部表面引导的第一多个孔; 以及在基座的顶表面上的介电层。 电介质层具有顶侧和第二多个孔,每个孔与基座中的第一多个孔的不同孔中的一个对准。 第一和第二孔形成从内部歧管延伸到电介质层的顶侧的多个通道,并且冷却气体通过该通道供应到晶片的背面。 与其对准的第一孔和第二孔中的每一个形成多个通道中的不同的一个。 当晶片通过静电力固定在静电卡盘上时,通道集中在电介质层的靠近冷却气体泄漏较高区域的区域中。