Abstract:
A semiconductor device having integrated MOSFET and Schottky diode includes a substrate having a MOSFET region and a Schottky diode region defined thereon; a plurality of first trenches formed in the MOSFET region; and a plurality of second trenches formed in the Schottky diode region. The first trenches respectively including a first insulating layer formed over the sidewalls and bottom of the first trench and a first conductive layer filling the first trench serve as a trenched gate of the trench MOSFET. The second trenches respectively include a second insulating layer formed over the sidewalls and bottom of the second trench and a second conductive layer filling the second trench. A depth and a width of the second trenches are larger than that of the first trenches; and a thickness of the second insulating layer is larger than that of the first insulating layer.
Abstract:
A frame format for random access response of wireless communication transmission is provided. The frame format comprises a header segment and a variable length data segment. The header segment includes one or more random access response subheader and 0 to N load control subheader. The variable length data segment including one or more random access response data payload corresponding to the one or more random access response subheader. The one or more random access response subheader includes a status indication field to represent a last random access response subheader, a load control subheader, a random access response data payload with a T-CRNTI field, or a random access response data payload without a T-CRNTI field.
Abstract:
A semiconductor device having integrated MOSFET and Schottky diode includes a substrate having a MOSFET region and a Schottky diode region defined thereon; a plurality of first trenches formed in the MOSFET region; and a plurality of second trenches formed in the Schottky diode region. The first trenches respectively including a first insulating layer formed over the sidewalls and bottom of the first trench and a first conductive layer filling the first trench serve as a trenched gate of the trench MOSFET. The second trenches respectively include a second insulating layer formed over the sidewalls and bottom of the second trench and a second conductive layer filling the second trench. A depth and a width of the second trenches are larger than that of the first trenches; and a thickness of the second insulating layer is larger than that of the first insulating layer.
Abstract:
An electrical host system includes a host and an expandable optical disk recording and playing device. The expandable optical disk recording and playing device includes an expanding interface module, an expanding interface, a storage interface module, an output interface module and a CODEC module. The expanding interface module connects to the expanding interface and the host. The storage interface module connects to a storage device. The CODEC module encodes, decodes or transcodes an audio/video source to generate audio/video data, wherein the audio/video source is inputted from the host through the expanding interface and the expanding interface module. The audio/video data are outputted through the output interface module, or through the storage interface module to the storage device.
Abstract:
An expandable optical disk recording and playing system and main board thereof including an input interface module; a PCI expanding interface module, which includes a PCI bus and an expanding component for connecting to a expanding interface, the expanding interface connecting to an expandable external device; a storage interface module, which is used to connect to a storage device; an output interface module; and a CODEC module, which encodes, decodes or transcodes an audio/video source to generate audio/video data, wherein the audio/video source is inputted from the input interface module, the PCI expanding interface module, or the storage interface module, and the audio/video data is outputted through the output interface module, through the PCI expanding interface module to the external device, or through the storage interface module to the storage device.
Abstract:
An integrated structure of an IGBT and a diode includes a plurality of doped cathode regions, and a method of forming the same is provided. The doped cathode regions are stacked in a semiconductor substrate, overlapping and contacting with each other. As compared with other doped cathode regions, the higher a doped cathode region is disposed, the larger implantation area the doped cathode region has. The doped cathode regions and the semiconductor substrate have different conductive types, and are applied as a cathode of the diode and a collector of the IGBT. The stacked doped cathode regions can increase the thinness of the cathode, and prevent the wafer from being overly thinned and broken.
Abstract:
An integrated structure of an IGBT and a diode includes a plurality of doped cathode regions, and a method of forming the same is provided. The doped cathode regions are stacked in a semiconductor substrate, overlapping and contacting with each other. As compared with other doped cathode regions, the higher a doped cathode region is disposed, the larger implantation area the doped cathode region has. The doped cathode regions and the semiconductor substrate have different conductive types, and are applied as a cathode of the diode and a collector of the IGBT. The stacked doped cathode regions can increase the thinness of the cathode, and prevent the wafer from being overly thinned and broken.
Abstract:
A trench semiconductor device and a method of making the same are provided. The trench semiconductor device includes a trench MOS device and a trench ESD protection device. The trench ESD protection device is electrically connected between the gate electrode and source electrode of the trench MOS device so as to provide ESD protection. The fabrication of the ESD protection device is integrated into the process of the trench MOS device, and therefore no extra mask is required to define the doped regions of the trench ESD protection device. Consequently, the trench semiconductor device is advantageous for its simplified manufacturing process and low cost.
Abstract:
A method of forming a power device includes providing a substrate, a semiconductor layer having at least a trench and being disposed on the substrate, a gate insulating layer covering the semiconductor layer, and a conductive material disposed in the trench, performing an ion implantation process to from a body layer, performing a tilted ion implantation process to from a heavy doped region, forming a first dielectric layer overall, performing a chemical mechanical polishing process until the body layer disposed under the heavy doped region is exposed to form source regions on the opposite sides of the trench, and forming a source trace directly covering the source regions disposed on the opposite sides of the trench.
Abstract:
A semiconductor structure including a substrate, an insulating layer, a composite pad structure, a passivation layer, and a bump is provided. A circuit structure is disposed on the substrate. The insulating layer covers the substrate and has a first opening exposing the circuit structure. The composite pad structure includes a first conductive layer, a barrier layer, and a second conductive layer which are sequentially disposed. The composite pad structure is disposed on the insulating layer and fills the first opening to electrically connect to the circuit structure. The passivation layer covers the composite pad structure and has a second opening exposing the composite pad structure. The bump fills the second opening and electrically connects to the composite pad structure.