TOOL AND METHOD FOR MODELING INTERPOSER RC COUPLINGS
    4.
    发明申请
    TOOL AND METHOD FOR MODELING INTERPOSER RC COUPLINGS 有权
    用于建模间接RC联轴器的工具和方法

    公开(公告)号:US20130007692A1

    公开(公告)日:2013-01-03

    申请号:US13172248

    申请日:2011-06-29

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5036

    摘要: A method comprises analyzing front side conductive patterns and back side conductive patterns on a semiconductor interposer using a machine implemented RC extraction tool, and outputting data representing a plurality of respective RC nodes from the RC extraction tool to a tangible persistent machine readable storage medium. A substrate mesh model of the semiconductor interposer is generated, having a plurality of substrate mesh nodes. Each substrate mesh node is connected to adjacent ones of the plurality of substrate mesh nodes by respective substrate impedance elements. A set of inputs to a timing analysis tool is formed. The plurality of RC nodes are connected to ones of the plurality of substrate mesh nodes of the substrate mesh model. The set of inputs is stored in a tangible machine readable storage medium.

    摘要翻译: 一种方法包括使用机器实施的RC提取工具来分析半导体插入器上的前侧导电图案和背面导电图案,并将表示多个相应RC节点的数据从RC提取工具输出到有形的持久机器可读存储介质。 产生半导体插入器的衬底网格模型,其具有多个衬底网格节点。 每个衬底网格节点通过相应的衬底阻抗元件连接到多个衬底网格节点中的相邻衬底网格节点。 形成了一组时序分析工具的输入。 多个RC节点连接到衬底网格模型的多个衬底网格节点中的一个。 该组输入存储在有形机器可读存储介质中。

    Tool and method for modeling interposer RC couplings
    7.
    发明授权
    Tool and method for modeling interposer RC couplings 有权
    用于对插件RC耦合进行建模的工具和方法

    公开(公告)号:US08856710B2

    公开(公告)日:2014-10-07

    申请号:US13172248

    申请日:2011-06-29

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5036

    摘要: A method comprises analyzing front side conductive patterns and back side conductive patterns on a semiconductor interposer using a machine implemented RC extraction tool, and outputting data representing a plurality of respective RC nodes from the RC extraction tool to a tangible persistent machine readable storage medium. A substrate mesh model of the semiconductor interposer is generated, having a plurality of substrate mesh nodes. Each substrate mesh node is connected to adjacent ones of the plurality of substrate mesh nodes by respective substrate impedance elements. A set of inputs to a timing analysis tool is formed. The plurality of RC nodes are connected to ones of the plurality of substrate mesh nodes of the substrate mesh model. The set of inputs is stored in a tangible machine readable storage medium.

    摘要翻译: 一种方法包括使用机器实施的RC提取工具来分析半导体插入器上的前侧导电图案和背面导电图案,并将表示多个相应RC节点的数据从RC提取工具输出到有形的持久机器可读存储介质。 产生半导体插入器的衬底网格模型,其具有多个衬底网格节点。 每个衬底网格节点通过相应的衬底阻抗元件连接到多个衬底网格节点中的相邻衬底网格节点。 形成了一组时序分析工具的输入。 多个RC节点连接到衬底网格模型的多个衬底网格节点中的一个。 该组输入存储在有形机器可读存储介质中。

    DE-EMBEDDING ON-WAFER DEVICES
    8.
    发明申请
    DE-EMBEDDING ON-WAFER DEVICES 有权
    嵌入式嵌入式设备

    公开(公告)号:US20120146680A1

    公开(公告)日:2012-06-14

    申请号:US12963511

    申请日:2010-12-08

    IPC分类号: G01R31/00

    摘要: A transmission line is provided. In one embodiment, the transmission line comprises a substrate, a well within the substrate, a shielding layer over the well, and a plurality of intermediate metal layers over the shielding layer, the plurality of intermediate metal layers coupled by a plurality of vias. The transmission line further includes a top metal layer over the plurality of intermediate metal layers. A test structure for de-embedding an on-wafer device, and a wafer are also disclosed.

    摘要翻译: 提供传输线。 在一个实施例中,传输线包括衬底,衬底内的阱,阱上的屏蔽层以及屏蔽层上的多个中间金属层,多个中间金属层通过多个通孔耦合。 传输线还包括多个中间金属层上的顶部金属层。 还公开了用于去嵌入晶片装置和晶片的测试结构。