摘要:
The specification describes a process for forming a barrier layer on copper metallization in semiconductor integrated circuits. The barrier layer is effective for both wire bond and solder bump interconnections. The barrier layer is Ti/Ni formed on the copper. Aluminum bond pads are formed on the barrier layer for wire bond interconnections and copper bond pads are formed on the barrier layer for solder bump interconnections.
摘要:
An in-line hermetic seal for an optical fiber which has an outer diameter and a stripped mid-section contains the stripped mid-section. A tube has an interior with a diameter larger than the outer diameter of the optical fiber and has an opening through a wall of the tube to the interior. The tube and the optical fiber having the stripped mid-section extending through the tube define an annular space therebetween. Soldering means fills the annular space. Sealing means holds the optical fiber approximately centered in ends of the tube. The stripped mid-section is contained by the tube, the sealing means and the soldering means. A method in accordance with the present invention is also described.
摘要:
A semiconductor device package comprises a container including a base and sidewalls. The base is configured to support a semiconductor device chip, and a lead frame extends through at least one of the sidewalls. A portion of the lead frame within the sidewall has at least one aperture penetrating into the lead frame. The sidewall material extends into the aperture, thereby forming a strong interfacial bond that provides a low leakage, sidewall-lead-frame interface. The base has a reentrant feature that is positioned within the thickness of at least one of the sidewalls and engages the at least one sidewall, thereby forming a low leakage base-sidewall interface. The top surface of the base has a groove that is positioned within the thickness of at least one of the sidewalls and engages the at least one sidewall, thereby enhancing the low leakage base-sidewall interface.
摘要:
A semiconductor device package comprises a container having a base and side walls of an electrically insulating material. A semiconductor device chip is disposed on the base, and a lead frame extends through the side walls. At least one electrical conductor couples the lead frame to the chip. A first layer of an electrically insulating cured gel covers the chip and the lead frame, and a second layer of an electrically insulating cured gel covers at least the portion of the first layer that covers the chip, but does not extend to the side walls. In one embodiment, the second layer has the shape of a dome. In a preferred embodiment the gel comprises silicone. In another embodiment a third layer of conformal insulating material is disposed on the second layer and essentially fills the container. Also is described is a method of making the package for use with RFLDMOS chips.
摘要:
An in-line hermetic seal for an optical fiber which has an outer diameter and a stripped mid-section contains the stripped mid-section. A tube has an interior with a diameter larger than the outer diameter of the optical fiber and has an opening through a wall of the tube to the interior. The tube and the optical fiber having the stripped mid-section extending through the tube define an annular space therebetween. Soldering means fills the annular space. Sealing means holds the optical fiber approximately centered in ends of the tube. The stripped mid-section is contained by the tube, the sealing means and the soldering means.
摘要:
A semiconductor device package comprises a container including a base and sidewalls. The base is configured to support a semiconductor device chip, and a lead frame extends through at least one of the sidewalls. A portion of the lead frame within the sidewall has at least one aperture penetrating into the lead frame. The sidewall material extends into the aperture, thereby forming a strong interfacial bond that provides a low leakage, sidewall-lead-frame interface. The base has a reentrant feature that is positioned within the thickness of at least one of the sidewalls and engages the at least one sidewall, thereby forming a low leakage base-sidewalls interface. The top surface of the base has a groove that is positioned within the thickness of at least one of the sidewalls and engages the at least one sidewall, thereby enhancing the low leakage base-sidewall interface.