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公开(公告)号:US12132019B2
公开(公告)日:2024-10-29
申请号:US18151622
申请日:2023-01-09
发明人: Hyuekjae Lee , Jongho Lee , Jihoon Kim , Taehun Kim , Sangcheon Park , Jinkyeong Seol , Sanghoon Lee
IPC分类号: H01L21/56 , H01L23/00 , H01L25/00 , H01L25/065 , H01L25/18
CPC分类号: H01L24/06 , H01L21/561 , H01L24/05 , H01L24/08 , H01L24/13 , H01L24/32 , H01L24/92 , H01L24/94 , H01L24/96 , H01L25/0652 , H01L25/0655 , H01L25/0657 , H01L25/18 , H01L25/50 , H01L2224/05025 , H01L2224/05073 , H01L2224/05562 , H01L2224/05564 , H01L2224/06182 , H01L2224/08121 , H01L2224/08145 , H01L2224/08148 , H01L2224/08225 , H01L2224/13024 , H01L2224/32145 , H01L2224/32225 , H01L2224/80895 , H01L2224/83099 , H01L2224/8389 , H01L2224/92142 , H01L2225/06541 , H01L2225/06548
摘要: A semiconductor package includes a first connection structure, a first semiconductor chip on an upper surface of the first connection structure, a first molding layer on the upper surface of the first connection structure and surrounding the first semiconductor chip, a first bond pad on the first semiconductor chip, a first bond insulation layer on the first semiconductor chip and the first molding layer and surrounding the first bond pad, a second bond pad directly contacting the first bond pad, a second bond insulation layer surrounding the second bond pad; and a second semiconductor chip on the second bond pad and the second bond insulation layer.
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公开(公告)号:US11552033B2
公开(公告)日:2023-01-10
申请号:US17155657
申请日:2021-01-22
发明人: Hyuekjae Lee , Jongho Lee , Jihoon Kim , Taehun Kim , Sangcheon Park , Jinkyeong Seol , Sanghoon Lee
IPC分类号: H01L25/065 , H01L21/56 , H01L23/00 , H01L25/18 , H01L25/00
摘要: A semiconductor package includes a first connection structure, a first semiconductor chip on an upper surface of the first connection structure, a first molding layer on the upper surface of the first connection structure and surrounding the first semiconductor chip, a first bond pad on the first semiconductor chip, a first bond insulation layer on the first semiconductor chip and the first molding layer and surrounding the first bond pad, a second bond pad directly contacting the first bond pad, a second bond insulation layer surrounding the second bond pad; and a second semiconductor chip on the second bond pad and the second bond insulation layer.
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公开(公告)号:US12040313B2
公开(公告)日:2024-07-16
申请号:US18133959
申请日:2023-04-12
发明人: Hyuekjae Lee , Jihoon Kim , JiHwan Suh , So Youn Lee , Jihwan Hwang , Taehun Kim , Ji-Seok Hong
CPC分类号: H01L25/0652 , H01L21/565 , H01L24/08 , H01L24/80 , H01L25/18 , H01L25/50 , H01L2224/08146 , H01L2224/80895 , H01L2224/80896 , H01L2225/06524 , H01L2225/06555 , H01L2225/06586 , H01L2225/06589
摘要: A semiconductor package includes a substrate, a first semiconductor chip on the substrate, a second semiconductor chip on the first semiconductor chip so that the first semiconductor chip is vertically between the second semiconductor chip and the substrate, a first molding layer adjacent to a sidewall of the first semiconductor chip on the substrate, the first molding layer formed of a first molding material, and a second molding layer adjacent to a sidewall of the second semiconductor chip on the substrate so that the first molding layer is vertically between the second molding layer and the substrate. The second molding layer is formed of a second molding material different from the first molding material. A top surface of the first semiconductor chip and a top surface of the first molding layer are flat and are coplanar with each other, and a ratio of the difference between the coefficient of thermal expansion between the second molding layer and the first molding layer to the difference between the coefficient of thermal expansion between the second molding layer and the substrate is between 5:1 and 20:1.
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公开(公告)号:US20240030214A1
公开(公告)日:2024-01-25
申请号:US18480310
申请日:2023-10-03
发明人: Sang Cheon PARK , Dae-Woo Kim , Taehun Kim , Hyuekjae Lee
IPC分类号: H01L25/18 , H01L23/31 , H01L23/48 , H01L23/498
CPC分类号: H01L25/18 , H01L23/3128 , H01L23/481 , H01L23/49827 , H01L23/49822
摘要: A semiconductor package includes a redistribution substrate, a first memory chip provided on the redistribution substrate, the first memory chip comprising a first base layer, a first circuit layer provided on a top surface of the first base layer, and a first via penetrating the first base layer and connected to the first circuit layer and the redistribution substrate, a logic chip provided on the first memory chip, and a first molding layer surrounding the first memory chip. An outer side surface of the first molding layer is coplanar with a side surface of the logic chip. At an interface of the logic chip and the first memory chip, a first chip pad provided in the first circuit layer of the first memory chip and a second chip pad of the logic chip are formed of the same material and constitute one body.
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公开(公告)号:US11764192B2
公开(公告)日:2023-09-19
申请号:US17861580
申请日:2022-07-11
发明人: Jihwan Hwang , Taehun Kim , Jihwan Suh , Soyoun Lee , Hyuekjae Lee , Jiseok Hong
IPC分类号: H01L25/065 , H01L25/00
CPC分类号: H01L25/0657 , H01L25/50 , H01L2225/06513 , H01L2225/06541 , H01L2225/06586 , H01L2225/06589
摘要: A semiconductor package and a method of forming the same are provided. The semiconductor package includes one or a plurality of chips on a substrate, bumps disposed below each of the one or plurality of chips, an underfill material layer on the substrate, on a side surface of each of the bumps, and extending to side surfaces of the one or plurality of chips, and a mold layer on the substrate and contacting the underfill material layer. The underfill material layer includes a first side portion, a second side portion on the first side portion and having a slope, steeper than a slope of the first side portion, and a third side portion on the second side portion and having a slope that is less steep than a slope of the second side portion.
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公开(公告)号:US11694996B2
公开(公告)日:2023-07-04
申请号:US17245913
申请日:2021-04-30
发明人: Hyuekjae Lee , Un-Byoung Kang , Sang Cheon Park , Jinkyeong Seol , Sanghoon Lee
IPC分类号: H01L25/065 , H01L23/48 , H01L23/00 , H01L25/00
CPC分类号: H01L25/0657 , H01L23/481 , H01L24/13 , H01L24/20 , H01L24/97 , H01L25/50 , H01L2224/1302 , H01L2224/214 , H01L2225/06541
摘要: A semiconductor package is provided. The semiconductor package may include a first semiconductor die, a second semiconductor die stacked on the first semiconductor die, the second semiconductor die having a width smaller than a width of the first semiconductor die, a third semiconductor die stacked on the second semiconductor die, the third semiconductor die having a width smaller than the width of the first semiconductor die, and a mold layer covering side surfaces of the second and third semiconductor dies and a top surface of the first semiconductor die. The second semiconductor die may include a second through via, and the third semiconductor die may include a third conductive pad in contact with the second through via.
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公开(公告)号:US11527509B2
公开(公告)日:2022-12-13
申请号:US17364541
申请日:2021-06-30
发明人: Sanghoon Lee , Hyuekjae Lee
IPC分类号: H01L25/065 , H01L23/498 , H01L23/538 , H01L23/00 , H01L23/48
摘要: A semiconductor package including a first semiconductor chip including a first semiconductor layer having a first forward surface having a first integrated circuit thereon and a first rear surface and a plurality of first through vias electrically connected to the first integrated circuit and including at least first and second groups of first through vias, a second semiconductor chip including a second integrated circuit electrically connected to the first group of first through vias, and a third semiconductor chip including third through vias electrically connected to the second group of first through vias, wherein the first group of first through vias transfer input/output signals of the first integrated circuit, and the second group of first through vias transfer power to the first integrated circuit, may be provided.
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公开(公告)号:US20240136329A1
公开(公告)日:2024-04-25
申请号:US18400497
申请日:2023-12-29
发明人: Hyuekjae Lee , Dae-Woo Kim , Eunseok Song
IPC分类号: H01L25/065 , H01L23/00 , H01L25/10 , H01L25/18
CPC分类号: H01L25/0657 , H01L24/24 , H01L25/0652 , H01L25/105 , H01L25/18 , H01L24/08 , H01L2224/08145 , H01L2224/08235 , H01L2224/24227 , H01L2225/06517 , H01L2225/06544 , H01L2225/06548 , H01L2225/06555 , H01L2225/06568 , H01L2225/1035 , H01L2225/1058
摘要: A semiconductor package includes a first semiconductor chip including a first wiring layer including a first wiring structure and providing a first rear surface, and a first through via for first through via for power electrically connected to the first wiring structure; and a second semiconductor chip including a second wiring layer including a second wiring structure and providing a second rear surface, and a second through via for second through via for power electrically connected to the second wiring structure, wherein the first and second semiconductor chips have different widths, wherein the first semiconductor chip receives power through the first wiring structure and the first through via for first through via for power, wherein the second semiconductor chip receives power through the second wiring structure and the second through via for second through via for power.
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公开(公告)号:US11721673B2
公开(公告)日:2023-08-08
申请号:US17568558
申请日:2022-01-04
发明人: Hyuekjae Lee , Jihoon Kim , Jihwan Suh , Soyoun Lee , Jiseok Hong , Taehun Kim , Jihwan Hwang
IPC分类号: H01L25/065 , H01L23/31 , H01L23/16 , H01L23/00 , H01L23/538
CPC分类号: H01L25/0657 , H01L23/16 , H01L23/31 , H01L23/5386 , H01L24/14
摘要: Provided is a semiconductor package including a semiconductor stack including a first lower chip, a second lower chip, a gap filler disposed between the first lower chip and the second lower chip, and a first upper chip disposed on an upper surface of the first lower chip, an upper surface of the second lower chip, and an upper surface of the gap filler, the first lower chip includes first upper surface pads and a first upper surface dielectric layer, the second lower chip includes second upper surface pads and a second upper surface dielectric layer, the first upper chip includes lower surface pads and a lower surface dielectric layer, and an area of an upper surface of each of the second upper surface pads is greater than an area of a lower surface of each of the lower surface pads.
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公开(公告)号:US20230076511A1
公开(公告)日:2023-03-09
申请号:US18054530
申请日:2022-11-10
发明人: Jihwan Suh , Un-Byoung Kang , Taehun Kim , Hyuekjae Lee , Jihwan Hwang , Sang Cheon Park
IPC分类号: H01L23/00 , H01L25/065 , H01L25/18
摘要: A semiconductor package includes a substrate, a first semiconductor chip disposed on the substrate, and a second semiconductor chip disposed on a top surface of the first semiconductor chip. The first semiconductor chip includes a conductive pattern disposed on the top surface of the first semiconductor chip and a first protective layer covering the top surface of the first semiconductor chip and at least partially surrounds the conductive pattern. The second semiconductor chip includes a first pad that contacts a first through electrode on a bottom surface of the second semiconductor chip. A second protective layer surrounds the first pad and covers the bottom surface of the second semiconductor chip. A third protection layer fills a first recess defined in the second protective layer to face the inside of the second protective layer. The first protective layer and the third protective layer contact each other.
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