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1.
公开(公告)号:US12073915B2
公开(公告)日:2024-08-27
申请号:US17888661
申请日:2022-08-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yongsung Cho , Min Hwi Kim , Ji-Sang Lee
CPC classification number: G11C7/20 , G11C7/065 , G11C7/1039 , G11C7/12
Abstract: Disclosed is a memory device which includes a memory cell array including memory cells, data latches connected with a sensing node and storing data in a first memory cell of the memory cells, a sensing latch connected with the sensing node, a temporary storage node, a switch connected between the sensing latch and the temporary storage node and configured to operate in response to a temporary storage node setup signal, a first precharge circuit configured to selectively precharge a first bit line corresponding to the first memory cell depending on a level of the temporary storage node, and a control logic circuit configured to control a dump operation between the data latches, the sensing latch, and the temporary storage node. The control logic circuit performs the dump operation from the data latches to the sensing latch while the first precharge circuit selectively precharges the first bit line.
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公开(公告)号:US12073909B2
公开(公告)日:2024-08-27
申请号:US18085963
申请日:2022-12-21
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yongsung Cho , Jinwoo Park , Hyunjun Yoon , Yoonhee Choi
CPC classification number: G11C7/065 , G11C7/1039 , G11C7/1057 , G11C7/1084 , G11C16/3404
Abstract: A memory device includes a memory cell array, a page buffer circuit, and a counting circuit. The page buffer circuit includes a first and second page buffer columns connected to the memory cell array. The first page buffer column includes a first page buffer unit and the second page buffer column includes a second page buffer unit in a first stage. The first page buffer unit performs a first sensing operation in response to a first sensing signal, and the second page buffer unit performs a second sensing operation in response to a second sensing signal. The counting circuit counts a first number of memory cells included in a first threshold voltage region from a result of the first sensing operation, and counts a second number of memory cells included in a second threshold voltage region from a result of the second sensing operation.
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公开(公告)号:US11974440B2
公开(公告)日:2024-04-30
申请号:US17219299
申请日:2021-03-31
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yongsung Cho , Inho Kang , Ansoo Park , Jeunghwan Park , Dongha Shin , Jeawon Jeong
CPC classification number: H10B43/40 , G06F3/0656 , H10B43/27 , H10B43/35
Abstract: A memory device includes: a memory cell array including a plurality of memory cells; and a page buffer circuit provided in a page buffer region including a main region and a cache region provided in a first horizontal direction, and including a first page buffer unit and a second page buffer unit adjacent to each other in a second horizontal direction in the main region. A first sensing node of the first page buffer unit includes a first lower metal pattern, and a first upper metal pattern, and electrically connected to the first lower metal pattern. A second sensing node of the second page buffer unit includes a second lower metal pattern, and a second upper metal pattern, electrically connected to the second lower metal pattern, and not adjacent to the first upper metal pattern in the second horizontal direction.
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公开(公告)号:US11842790B2
公开(公告)日:2023-12-12
申请号:US18125260
申请日:2023-03-23
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yongsung Cho , Inho Kang , Taehyo Kim , Jeunghwan Park , Jinwoo Park
CPC classification number: G11C7/1039 , G11C7/1048 , G11C7/1057 , G11C7/1084 , G11C7/12
Abstract: Provided are a page buffer and a memory device including the same. A memory device includes: a memory cell array including a plurality of memory cells; and a page buffer circuit including page buffer units in a first horizontal direction, the page buffer units being connected to the memory cells via bit lines, and cache latches in the first horizontal direction, the cache latches corresponding to the page buffer units, wherein each of the page buffer units includes one or more pass transistors connected to a sensing node of each of the plurality of page buffer units, the sensing node electrically connected to a corresponding bit line. Each sensing node included in each of the page buffer units and the combined sensing node are electrically connected to each other through the pass transistors.
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公开(公告)号:US20230154544A1
公开(公告)日:2023-05-18
申请号:US17836453
申请日:2022-06-09
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yongsung Cho
Abstract: A memory device includes a memory cell array, and a page buffer circuit connected to the memory cell array through a plurality of bit lines, including a plurality of page buffers arranged in correspondence with the bit lines and each of which includes a sensing node. The plurality of page buffers include a first page buffer, and the first page buffer includes: a first sensing node configured to sense data by corresponding to a first metal wire at a lower metal layer; and a second metal wire electrically connected to the first metal wire and at an upper metal layer located above the lower metal layer, and a boost node corresponding to a third metal wire adjacent to the second metal wire of the upper metal layer and configured to control a boost-up and a boost-down of a voltage of the first sensing node.
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公开(公告)号:US20230143829A1
公开(公告)日:2023-05-11
申请号:US17965004
申请日:2022-10-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yongsung Cho , Min-Hwi Kim , Makoto Hirano
IPC: G11C16/24 , G06F12/0802
CPC classification number: G11C16/24 , G06F12/0802 , G11C16/0483
Abstract: A memory device includes a memory cell array and a page buffer circuit, wherein the page buffer circuit includes page buffer units including upper page buffer units and lower page buffer units and cache units arranged between the upper page buffer unit and the lower page buffer units. The cache units include upper cache units and lower cache units. Each page buffer unit includes a sensing node and a pass transistor. The upper cache units share a first combined sensing node, and, the lower cache units share a second combined sensing node. In a data transmission period, sensing nodes respectively included the page buffer units are electrically connected to one another through serial connections of the pass transistors respectively included in the page buffer units.
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7.
公开(公告)号:US20240331774A1
公开(公告)日:2024-10-03
申请号:US18367677
申请日:2023-09-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Gangmin Lee , Jaehue Shin , Daeseok Byeon , Yongsung Cho
CPC classification number: G11C16/0491 , G11C16/0483 , G11C16/24 , G11C16/26 , G11C16/30 , G11C29/10
Abstract: A nonvolatile memory device may include a page buffer, a control signal generator, and a current mirror. The page buffer may be connected to a bitline and may allow a replicated current to flow through a ground terminal in response to a first control signal and a second control signal. The control signal generator may output the first control signal and the second control signal to the page buffer. The current mirror may output, in a virtual cell mode, a control voltage corresponding to a bias current. The control voltage may correspond to the first control signal.
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公开(公告)号:US20230223056A1
公开(公告)日:2023-07-13
申请号:US18125260
申请日:2023-03-23
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yongsung Cho , Inho Kang , Taehyo Kim , Jeunghwan Park , Jinwoo Park
CPC classification number: G11C16/24 , H10B80/00 , G11C16/0483
Abstract: Provided are a page buffer and a memory device including the same. A memory device includes: a memory cell array including a plurality of memory cells; and a page buffer circuit including page buffer units in a first horizontal direction, the page buffer units being connected to the memory cells via bit lines, and cache latches in the first horizontal direction, the cache latches corresponding to the page buffer units, wherein each of the page buffer units includes one or more pass transistors connected to a sensing node of each of the plurality of page buffer units, the sensing node electrically connected to a corresponding bit line. Each sensing node included in each of the page buffer units and the combined sensing node are electrically connected to each other through the pass transistors.
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公开(公告)号:US11646087B2
公开(公告)日:2023-05-09
申请号:US17134968
申请日:2020-12-28
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yongsung Cho , Bong-Kil Jung , Hangil Jeong
Abstract: An operating method of a nonvolatile memory device includes receiving, at the nonvolatile memory device, a suspend command, suspending, at the nonvolatile memory device, a program operation being performed, in response to the suspend command, receiving, at the nonvolatile memory device, a resume command, and resuming, at the nonvolatile memory device, the suspended program operation in response to the resume command. The program operation includes program loops, each of which includes a bit line setup interval, a program interval, and a verify interval. In the program interval of each of the program loops, a level of a program voltage to be applied to selected memory cells of the nonvolatile memory device increases as much as a first voltage. A difference between a level of the program voltage finally applied s suspend and a level of the program voltage applied first after resume is different from the first voltage.
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公开(公告)号:US11600336B2
公开(公告)日:2023-03-07
申请号:US17332350
申请日:2021-05-27
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yongsung Cho , Byungkwan Chun
IPC: G11C16/24 , G11C16/04 , H01L23/00 , H01L25/065 , H01L25/18
Abstract: A nonvolatile memory device includes a memory cell array including memory cells and a page buffer circuit. The page buffer circuit includes page buffer units and cache latches. The cache latches are spaced apart from the page buffer units in a first horizontal direction, and correspond to respective ones of the plurality of page buffer units. Each of the page buffer units includes a pass transistor connected to each sensing node and driven in response to a pass control signal. The page buffer circuit being configured to perform a data transfer operation, based on performing a first data output operation to output data, provided from a first portion of page buffer units, from a first portion of cache latches to a data input/output (I/O) line, the data transfer operation configured to dump sensed data from a second portion of page buffer units to a second portion of cache latches.
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