Light-emitting device, light-receiving device and method of manufacturing the same
    1.
    发明授权
    Light-emitting device, light-receiving device and method of manufacturing the same 有权
    发光装置,光接收装置及其制造方法

    公开(公告)号:US08680553B2

    公开(公告)日:2014-03-25

    申请号:US13129115

    申请日:2009-10-21

    IPC分类号: H01L33/34

    摘要: An object of the present invention is to provide a germanium laser diode that can be easily formed on a substrate such as silicon by using a normal silicon process and can emit light efficiently. A germanium light-emitting device according to the present invention is a germanium laser diode characterized in that tensile strain is applied to single-crystal germanium serving as a light-emitting layer to be of a direct transition type, a thin semiconductor layer made of silicon, germanium or silicon-germanium is connected adjacently to both ends of the germanium light-emitting layer, the thin semiconductor layer has a certain degree of thickness capable of preventing the occurrence of quantum confinement effect, another end of the thin semiconductor layer is connected to a thick electrode doped with impurities at a high concentration, the electrode is doped to a p type and an n type, a waveguide is formed so as not to be in direct contact with the electrode, and a mirror is formed at an end of the waveguide.

    摘要翻译: 本发明的目的是提供一种可以通过使用普通硅工艺容易地在诸如硅的衬底上形成的锗激光二极管,并且能够有效发光。 根据本发明的锗发光器件是锗激光二极管,其特征在于将拉伸应变施加到作为直接转变型的发光层的单晶锗,由硅制成的薄半导体层 ,锗或锗锗与锗发光层的两端相邻连接,薄型半导体层具有能够防止量子限制效应发生的一定程度的厚度,薄型半导体层的另一端与 以高浓度掺杂有杂质的厚电极,电极被掺杂成ap型和n型,形成波导以不与电极直接接触,并且在波导的端部形成反射镜 。

    LIGHT-EMITTING DEVICE, LIGHT-RECEIVING DEVICE AND METHOD OF MANUFACTURING THE SAME
    2.
    发明申请
    LIGHT-EMITTING DEVICE, LIGHT-RECEIVING DEVICE AND METHOD OF MANUFACTURING THE SAME 有权
    发光装置,光接收装置及其制造方法

    公开(公告)号:US20110227116A1

    公开(公告)日:2011-09-22

    申请号:US13129115

    申请日:2009-10-21

    摘要: An object of the present invention is to provide a germanium laser diode that can be easily formed on a substrate such as silicon by using a normal silicon process and can emit light efficiently. A germanium light-emitting device according to the present invention is a germanium laser diode characterized in that tensile strain is applied to single-crystal germanium serving as a light-emitting layer to be of a direct transition type, a thin semiconductor layer made of silicon, germanium or silicon-germanium is connected adjacently to both ends of the germanium light-emitting layer, the thin semiconductor layer has a certain degree of thickness capable of preventing the occurrence of quantum confinement effect, another end of the thin semiconductor layer is connected to a thick electrode doped with impurities at a high concentration, the electrode is doped to a p type and an n type, a waveguide is formed so as not to be in direct contact with the electrode, and a mirror is formed at an end of the waveguide.

    摘要翻译: 本发明的目的是提供一种可以通过使用普通硅工艺容易地在诸如硅的衬底上形成的锗激光二极管,并且能够有效发光。 根据本发明的锗发光器件是锗激光二极管,其特征在于将拉伸应变施加到作为直接转变型的发光层的单晶锗,由硅制成的薄半导体层 ,锗或锗锗与锗发光层的两端相邻连接,薄型半导体层具有能够防止量子限制效应发生的一定程度的厚度,薄半导体层的另一端与 以高浓度掺杂有杂质的厚电极,电极被掺杂成ap型和n型,形成波导以不与电极直接接触,并且在波导的端部形成反射镜 。

    Method for semiconductor circuit
    6.
    发明授权
    Method for semiconductor circuit 失效
    半导体电路方法

    公开(公告)号:US07890898B2

    公开(公告)日:2011-02-15

    申请号:US12024107

    申请日:2008-01-31

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5036

    摘要: Capacity-gate voltage characteristics of a field-effect transistor having plural gates are measured against a voltage change in each one of the gates for an inverted MOSFET and for an accumulated MOSFET, respectively. These measurements together with numerical simulations provided from a model for quantum effects are used to determine flat band voltages between the plural gates and a channel. Next, an effective normal electric field is calculated as a vector line integral by using a set of flat band voltages for the measured capacity as a lower integration limit. Lastly, mobility depending on the effective normal electric field is calculated from current-gate voltage characteristic measurements and capacity measurements in a source-drain path, and the calculated mobility is substituted into an equation for a current-voltage curve between source and drain.

    摘要翻译: 针对反向MOSFET的栅极和积累的MOSFET中的每一个的电压变化分别测量具有多个栅极的场效应晶体管的容量栅极电压特性。 这些测量结果与从量子效应模型提供的数值模拟一起用于确定多个门和通道之间的平带电压。 接下来,通过使用一组用于测量容量的平带电压作为下积分极限,计算有效正常电场作为矢量线积分。 最后,根据源极 - 漏极路径中的电流 - 栅极电压特性测量和电容测量值计算出有效正常电场的迁移率,并将计算的迁移率代入源极和漏极之间的电流 - 电压曲线的方程式。

    METHOD FOR SEMICONDUCTOR CIRCUIT
    8.
    发明申请
    METHOD FOR SEMICONDUCTOR CIRCUIT 失效
    半导体电路方法

    公开(公告)号:US20090132974A1

    公开(公告)日:2009-05-21

    申请号:US12024107

    申请日:2008-01-31

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5036

    摘要: Capacity-gate voltage characteristics of a field-effect transistor having plural gates are measured against a voltage change in each one of the gates for an inverted MOSFET and for an accumulated MOSFET, respectively. These measurements together with numerical simulations provided from a model for quantum effects are used to determine flat band voltages between the plural gates and a channel. Next, an effective normal electric field is calculated as a vector line integral by using a set of flat band voltages for the measured capacity as a lower integration limit. Lastly, mobility depending on the effective normal electric field is calculated from current-gate voltage characteristic measurements and capacity measurements in a source-drain path, and the calculated mobility is substituted into an equation for a current-voltage curve between source and drain.

    摘要翻译: 针对反向MOSFET的栅极和积累的MOSFET中的每一个的电压变化分别测量具有多个栅极的场效应晶体管的容量栅极电压特性。 这些测量结果与从量子效应模型提供的数值模拟一起用于确定多个门和通道之间的平带电压。 接下来,通过使用一组用于测量容量的平带电压作为下积分极限,计算有效正常电场作为矢量线积分。 最后,根据源极 - 漏极路径中的电流 - 栅极电压特性测量和电容测量值计算出有效正常电场的迁移率,并将计算的迁移率代入源极和漏极之间的电流 - 电压曲线的方程式。