SHIFT REGISTER MEMORY AND METHOD OF MANUFACTURING THE SAME
    1.
    发明申请
    SHIFT REGISTER MEMORY AND METHOD OF MANUFACTURING THE SAME 有权
    移位寄存器及其制造方法

    公开(公告)号:US20130020627A1

    公开(公告)日:2013-01-24

    申请号:US13409652

    申请日:2012-03-01

    IPC分类号: H01L29/788 H01L21/28

    摘要: In one embodiment, a shift register memory includes first and second control electrodes extending in a first direction parallel to a surface of a substrate, and facing each other in a second direction perpendicular to the first direction. The memory further includes a plurality of first floating electrodes provided in a line on a first control electrode side between the first and second control electrodes. The memory further includes a plurality of second floating electrodes provided in a line on a second control electrode side between the first and second control electrodes. Each of the first and second floating electrodes has a planar shape which is mirror-asymmetric with respect to a plane perpendicular to the first direction.

    摘要翻译: 在一个实施例中,移位寄存器存储器包括在平行于衬底表面的第一方向上延伸的第一和第二控制电极,并且在垂直于第一方向的第二方向上彼此面对。 存储器还包括设置在第一和第二控制电极之间的第一控制电极侧的一行中的多个第一浮置电极。 存储器还包括设置在第一和第二控制电极之间的第二控制电极侧的一行中的多个第二浮置电极。 第一和第二浮动电极中的每一个具有相对于垂直于第一方向的平面镜像不对称的平面形状。

    METHOD FOR MANUFACTURING NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
    2.
    发明申请
    METHOD FOR MANUFACTURING NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND NONVOLATILE SEMICONDUCTOR MEMORY DEVICE 有权
    用于制造非易失性半导体存储器件和非易失性半导体存储器件的方法

    公开(公告)号:US20100224928A1

    公开(公告)日:2010-09-09

    申请号:US12714905

    申请日:2010-03-01

    IPC分类号: H01L29/792 H01L21/8239

    摘要: A method for manufacturing a nonvolatile semiconductor memory device, the device including a stacked structural unit including a plurality of insulating films alternately stacked with a plurality of electrode films in a first direction and a semiconductor pillar piercing the stacked structural unit in the first direction, the method includes: forming a stacked unit including a core material film alternately stacked with a sacrificial film on a major surface of a substrate perpendicular to the first direction; making a trench in the stacked unit, the trench extending in the first direction and a second direction in a plane perpendicular to the first direction; filling a filling material into the trench; removing the sacrificial film to form a hollow structural unit, the hollow structural unit including a post unit supporting the core material film on the substrate, the post unit being made of the filling material; and forming the stacked structural unit by stacking one of the insulating films and one of the electrode films on a surface of the core material film exposed by removing the sacrificial film.

    摘要翻译: 一种用于制造非易失性半导体存储器件的方法,该器件包括层叠结构单元,该堆叠结构单元包括在第一方向上交替堆叠多个电极膜的多个绝缘膜,以及沿第一方向穿透层叠结构单元的半导体柱, 方法包括:在垂直于第一方向的基板的主表面上形成包括交替堆叠有牺牲膜的芯材膜的堆叠单元; 在所述堆叠单元中形成沟槽,所述沟槽在垂直于所述第一方向的平面中沿所述第一方向延伸并且沿第二方向延伸; 将填充材料填充到沟槽中; 去除所述牺牲膜以形成中空结构单元,所述中空结构单元包括支撑所述芯材膜的柱单元,所述柱单元由所述填充材料制成; 以及通过将绝缘膜和其中一个电极膜层叠在通过去除牺牲膜而暴露的芯材膜的表面上来形成层叠结构单元。

    SEMICONDUCTOR MEMORY DEVICE
    5.
    发明申请
    SEMICONDUCTOR MEMORY DEVICE 有权
    半导体存储器件

    公开(公告)号:US20130234233A1

    公开(公告)日:2013-09-12

    申请号:US13603797

    申请日:2012-09-05

    IPC分类号: H01L29/792

    摘要: According to one embodiment, a semiconductor memory device comprises a first layer, a first conductive layer, a insulating layer, and a second conductive layer stacked on a substrate, a block insulating layer on inner surfaces of a pair of through-holes formed in the first conductive layer, the insulating layer, and the second conductive layer, and on an inner surface of a connecting hole connecting lower ends of the pair of through-holes, a charge storage layer on the block insulating layer, a second layer on the charge storage layer, and a semiconductor layer on the second layer. The second layer includes an air gap layer on the charge storage layer in the pair of through-holes, and a third conductive layer on the charge storage layer in the connecting hole.

    摘要翻译: 根据一个实施例,半导体存储器件包括第一层,第一导电层,绝缘层和堆叠在衬底上的第二导电层,在形成在衬底中的一对通孔的内表面上的块绝缘层 第一导电层,绝缘层和第二导电层,以及连接在一对通孔的下端的连接孔的内表面上,在块绝缘层上的电荷存储层,电荷上的第二层 存储层和第二层上的半导体层。 第二层包括一对通孔中的电荷存储层上的气隙层和连接孔中的电荷存储层上的第三导电层。

    SHIFT REGISTER MEMORY AND DRIVING METHOD THEREOF
    8.
    发明申请
    SHIFT REGISTER MEMORY AND DRIVING METHOD THEREOF 有权
    移位寄存器及其驱动方法

    公开(公告)号:US20130242634A1

    公开(公告)日:2013-09-19

    申请号:US13599228

    申请日:2012-08-30

    IPC分类号: G11C19/02

    摘要: A shift register memory according to the present embodiment includes a magnetic pillar including a plurality of magnetic layers and a plurality of nonmagnetic layers provided between the magnetic layers adjacent to each other. A stress application part applies a stress to the magnetic pillar. A magnetic-field application part applies a static magnetic field to the magnetic pillar. The stress application part applies the stress to the magnetic pillar in order to transfer magnetization states of the magnetic layers in a stacking direction of the magnetic layers.

    摘要翻译: 根据本实施例的移位寄存器存储器包括具有多个磁性层的磁柱和设置在彼此相邻的磁性层之间的多个非磁性层。 应力施加部分对磁柱施加应力。 磁场施加部分将静磁场施加到磁柱。 应力施加部分将应力施加到磁柱,以便在磁性层的堆叠方向上传递磁性层的磁化状态。

    SEMICONDUCTOR MEMORY DEVICE
    9.
    发明申请
    SEMICONDUCTOR MEMORY DEVICE 有权
    半导体存储器件

    公开(公告)号:US20110235436A1

    公开(公告)日:2011-09-29

    申请号:US13046894

    申请日:2011-03-14

    IPC分类号: G11C16/04 H01L23/525

    摘要: A semiconductor memory device according to one embodiment of the present invention includes a dielectric film configured to store information depending on presence or absence of a conductive path therein, and a plurality of electrodes provided to contact a first surface of the dielectric film. The conductive path can be formed between two electrodes arbitrarily selected form the plurality of electrodes. The conductive path has a rectifying property of allowing a current to flow more easily in a first direction connecting arbitrary two electrodes than in a second direction opposite to the first direction. The largest possible number of the conductive paths that may be formed is larger than the number of the plurality of electrodes.

    摘要翻译: 根据本发明的一个实施例的半导体存储器件包括:电介质膜,被配置为根据存在或不存在导电路径来存储信息;以及多个电极,设置成与电介质膜的第一表面接触。 导电路径可以形成在从多个电极任意选择的两个电极之间。 导电路径具有使电流在连接任意两个电极的第一方向上比在与第一方向相反的第二方向更容易流动的整流特性。 可能形成的最大可能数量的导电路径大于多个电极的数量。

    NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE AND METHOD OF MANUFACTURING THE SAME
    10.
    发明申请
    NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE AND METHOD OF MANUFACTURING THE SAME 有权
    非挥发性半导体存储器件及其制造方法

    公开(公告)号:US20130109157A1

    公开(公告)日:2013-05-02

    申请号:US13723601

    申请日:2012-12-21

    IPC分类号: H01L29/792

    摘要: A non-volatile semiconductor storage device includes a plurality of memory strings each having a plurality of electrically rewritable memory cells connected in series. Each of the memory strings comprising: a first semiconductor layer including a columnar portion extending in a vertical direction with respect to a substrate; a plurality of first conductive layers formed to surround side surfaces of the columnar portions via insulation layers, and formed at a certain pitch in the vertical direction, the first conductive layers functioning as floating gates of the memory cells; and a plurality of second conductive layers formed to surround the first conductive layers via insulation layers, and functioning as control electrodes of the memory cells. Each of the first conductive layers has a length in the vertical direction that is shorter than a length in the vertical direction of each of the second conductive layers.

    摘要翻译: 非挥发性半导体存储装置包括多个存储串,每个存储串具有串联连接的多个电可重写存储单元。 每个存储器串包括:第一半导体层,包括相对于衬底在垂直方向上延伸的柱状部分; 多个第一导电层,经由绝缘层形成为围绕柱状部分的侧表面,并以垂直方向上的一定间距形成,第一导电层用作存储器单元的浮动栅极; 以及形成为经由绝缘层包围第一导电层并且用作存储单元的控制电极的多个第二导电层。 每个第一导电层在垂直方向上具有比每个第二导电层的垂直方向上的长度短的长度。