利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

180 条记录 (耗时 0.045 秒)

    Method of cutting thin-walled material
    3.
    发明授权
    Method of cutting thin-walled material 失效
    切割薄壁材料的方法

    公开(公告)号：US08701530B2

    公开(公告)日：2014-04-22

    申请号：US13055932

    申请日：2009-07-16

    申请人： Hiroyuki Ochiai ,  Masaharu Yano ,  Kiyoshi Fujikake ,  Yoshio Takimoto ,  Yutaka Watanabe

    发明人： Hiroyuki Ochiai ,  Masaharu Yano ,  Kiyoshi Fujikake ,  Yoshio Takimoto ,  Yutaka Watanabe

    IPC分类号： B23B1/00

    CPC分类号： B23B1/00 ,  B23B2215/64 ,  B23B2270/205

    摘要： A method is provided to cut a thin-walled member without causing chattering vibration, without using a chattering vibration preventing retainer, that performs the following: (A) preparing a material having much stock for obtaining a thin-walled material, (B) while rotating the material about a center axis, cutting the inner round surface of the material within a predetermined range by feeding a cutting tool relative to material by the desired distance from one end side to the other end side of the material along the center axis, (C) while rotating the material about the center axis, cutting the outer round surface of the material within a predetermined range by feeding the cutting tool relative to the material by the desired distance from the one end side to the other end side of the material along the center axis, and (D) alternately repeating (B) and (C) to finish cutting the material.

    摘要翻译： 提供了一种方法来切割薄壁构件而不产生震动振动，而不使用振动防震保持器，其执行以下操作：（A）制备具有很多储备以获得薄壁材料的材料，（B）同时 使材料围绕中心轴线旋转，通过沿着中心轴线将相对于材料的切割工具相对于材料的一个端侧向另一端侧馈送期望的距离，将材料的内圆面切割在预定范围内（ C）当围绕中心轴线旋转材料时，通过将切割工具相对于材料沿材料的一端侧到另一端侧的期望距离进给，将材料的外圆表面切割在预定范围内 中心轴，（D）交替重复（B）和（C）切割材料。

    ELECTRIC COMPRESSOR
    5.
    发明申请
    ELECTRIC COMPRESSOR 有权
    电动压缩机

    公开(公告)号：US20130175964A1

    公开(公告)日：2013-07-11

    申请号：US13822768

    申请日：2011-09-30

    申请人： Yutaka Watanabe

    发明人： Yutaka Watanabe

    IPC分类号： G01K13/00 ,  H02P29/00

    CPC分类号： G01K13/00 ,  F04B35/04 ,  F04B39/06 ,  F04B49/103 ,  F04B2203/0209 ,  H02P29/68

    摘要： An electric compressor capable of following temperature changes of a power element even if a temperature measurement unit is disposed separately from the power element. In the electric compressor, the temperature measurement unit (34) measures the temperature of a substrate (36) on which the power element (31) is disposed. A rotational speed detection unit (35) detects the rotational speed of a motor. A control unit (33) estimates the temperature of the power element (31) on the basis of the rotational speed of the motor detected by the rotational speed detection unit (35) and the temperature measured by the temperature measurement unit (34).

    摘要翻译： 即使温度测量单元与功率元件分开设置，也能够跟随功率元件的温度变化。 在电动压缩机中，温度测量单元（34）测量设置有功率元件（31）的基板（36）的温度。 转速检测单元（35）检测电动机的转速。 控制单元（33）基于由转速检测单元（35）检测的电动机的转速和由温度测量单元（34）测量的温度来估计功率元件（31）的温度。

    Micro force measurement device, micro force measurement method, and micro surface shape measurement probe
    6.
    发明授权
    Micro force measurement device, micro force measurement method, and micro surface shape measurement probe 失效
    微力测量装置，微力测量方法和微表面形状测量探头

    公开(公告)号：US07685733B2

    公开(公告)日：2010-03-30

    申请号：US11566377

    申请日：2006-12-04

    申请人： Hitoshi Ohmori ,  Yutaka Watanabe ,  Shinya Morita ,  Yoshihiro Uehara ,  Weimin Lin ,  Kazutoshi Katahira

    发明人： Hitoshi Ohmori ,  Yutaka Watanabe ,  Shinya Morita ,  Yoshihiro Uehara ,  Weimin Lin ,  Kazutoshi Katahira

    IPC分类号： G01B7/00

    CPC分类号： G01B7/012 ,  G01B3/008 ,  G01B5/012 ,  G01B11/007

    摘要： There is disclosed a micro surface shape measurement probe including a probe shaft 4 having at a distant end thereof a probe member 2 for contacting an object 1 to be measured, a probe body 21 provided with support means for movably supporting the probe shaft 4 in a non-contact manner, a pressing device for pressing and moving the probe shaft 4 toward the object 1 to be measured, a piezoelectric sensor 8a incorporated in the probe body 21 so that a reactive force acts to a pressing force applied to the probe shaft by the pressing device, a load detecting device 8b to measure a load acting on the piezoelectric sensor, a control device 9 for adjusting the pressing force applied by the pressing device based on the load detected by the load detecting device, and a displacement amount measuring device for measuring a position of the probe member 2 in contact with the object 1 to be measured by the pressing force adjusted by the control device 9.

    摘要翻译： 公开了一种微型表面形状测量探针，其包括探针轴4，探针轴4的远端具有用于接触被测量物体1的探针构件2，探针体21，其设置有用于将探针轴4可移动地支撑在一起的支撑装置 用于将探针轴4朝向要测量的物体1按压和移动的按压装置，结合在探针主体21中的压电传感器8a，使得反作用力作用于通过施加到探针轴的按压力 按压装置，用于测量作用在压电传感器上的负载的负载检测装置8b，用于基于由负载检测装置检测到的负载来调节由加压装置施加的按压力的控制装置9和位移量测量装置 用于通过由控制装置9调节的按压力来测量与被测量物体1接触的探针部件2的位置。

    MICRO FORCE MEASUREMENT DEVICE, MICRO FORCE MEASUREMENT METHOD, AND MICRO SURFACE SHAPE MEASUREMENT PROBE
    7.
    发明申请
    MICRO FORCE MEASUREMENT DEVICE, MICRO FORCE MEASUREMENT METHOD, AND MICRO SURFACE SHAPE MEASUREMENT PROBE 失效
    微力测量装置，微力测量方法和微观表面形状测量探针

    公开(公告)号：US20070126314A1

    公开(公告)日：2007-06-07

    申请号：US11566377

    申请日：2006-12-04

    申请人： Hitoshi Ohmori ,  Yutaka Watanabe ,  Shinya Morita ,  Yoshihiro Uehara ,  Weimin Lin ,  Kazutoshi Katahira

    发明人： Hitoshi Ohmori ,  Yutaka Watanabe ,  Shinya Morita ,  Yoshihiro Uehara ,  Weimin Lin ,  Kazutoshi Katahira

    IPC分类号： H01L41/00

    CPC分类号： G01B7/012 ,  G01B3/008 ,  G01B5/012 ,  G01B11/007

    摘要： There is disclosed a micro surface shape measurement probe including a probe shaft 4 having at a distant end thereof a probe member 2 for contacting an object 1 to be measured, a probe body 21 provided with support means for movably supporting the probe shaft 4 in a non-contact manner, a pressing device for pressing and moving the probe shaft 4 toward the object 1 to be measured, a piezoelectric sensor 8a incorporated in the probe body 21 so that a reactive force acts to a pressing force applied to the probe shaft by the pressing device, a load detecting device 8b to measure a load acting on the piezoelectric sensor, a control device 9 for adjusting the pressing force applied by the pressing device based on the load detected by the load detecting device, and a displacement amount measuring device for measuring a position of the probe member 2 in contact with the object 1 to be measured by the pressing force adjusted by the control device 9.

    摘要翻译： 公开了一种微型表面形状测量探针，其包括探针轴4，探针轴4的远端具有用于接触被测量物体1的探针构件2，探针体21，其设置有用于将探针轴4可移动地支撑在一起的支撑装置 用于将探针轴4朝向待测量物体1按压并移动的按压装置，结合在探针体21中的压电传感器8，使得反作用力作用于施加到探针轴的压力 通过按压装置，用于测量作用在压电传感器上的负载的负载检测装置8b，用于基于由负载检测装置检测到的负载来调整由加压装置施加的按压力的控制装置9和位移量 测量装置，用于通过由控制装置9调节的按压力来测量与待测量物体1接触的探针构件2的位置。

    Cooling fin connected to a cooling unit and a pusher of the testing apparatus
    8.
    发明申请
    Cooling fin connected to a cooling unit and a pusher of the testing apparatus 审中-公开
    冷却翅片连接到测试装置的冷却单元和推动器

    公开(公告)号：US20050225346A1

    公开(公告)日：2005-10-13

    申请号：US11148386

    申请日：2005-06-09

    申请人： Noboru Saito ,  Hiroyuki Takahashi ,  Noriyuki Igarashi ,  Keiichi Fukumoto ,  Hiroto Nakamura ,  Yutaka Watanabe ,  Kenichi Shimada

    发明人： Noboru Saito ,  Hiroyuki Takahashi ,  Noriyuki Igarashi ,  Keiichi Fukumoto ,  Hiroto Nakamura ,  Yutaka Watanabe ,  Kenichi Shimada

    IPC分类号： G01R31/26 ,  G01R1/04 ,  G01R31/00 ,  G01R31/01 ,  G01R31/02 ,  G01R31/28 ,  G01R31/303

    CPC分类号： G01R31/01 ,  G01R1/0458 ,  G01R31/2806 ,  G01R31/2862 ,  G01R31/2863 ,  G01R31/2868 ,  G01R31/2877

    摘要： A device testing apparatus including a connection terminal to which an electronic device under test is detachably attached, a pusher for pushing the electronic device in the direction of the connection terminal so as to connect the electronic device to the connection terminal, and a cooling unit for cooling the electronic device. As the cooling unit, an element cooling the device using electricity is for example used. The cooling unit includes a cooling medium blower for blowing a cooling medium around the electronic device and heat exchange projections or depressions for raising the cooling efficiency by blowing a cooling medium. In the device testing apparatus, even if the electronic device generates heat on its own during testing, the electronic device is cooled through the pusher, connection terminals, or socket, so the effect of the heat generated by the electronic device is canceled out and the electronic device can be tested at the predetermined temperature as prescribed in the specification.

    摘要翻译： 一种装置测试装置，包括可拆卸地安装有被测试的电子设备的连接端子，用于沿着连接端子的方向推动电子设备以将电子设备连接到连接端子的推动器，以及用于 冷却电子设备。 作为冷却单元，例如使用电力冷却装置的元件。 冷却单元包括用于吹送电子设备周围的冷却介质的冷却介质鼓风机和通过吹送冷却介质而提高冷却效率的热交换突起或凹部。 在设备测试装置中，即使电子设备在测试期间自身产生热量，电子设备通过推动器，连接端子或插座被冷却，因此电子设备产生的热量的影响被消除，并且 电子设备可以按照说明书中规定的预定温度进行测试。