公开(公告)号：US12209977B2

公开(公告)日：2025-01-28

申请号：US18439625

申请日：2024-02-12

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Janos Kirz

IPC: G01N23/20008 ,  G01N23/20091 ,  G01N23/207 ,  G01N23/2209 ,  G21K1/06

Abstract: An apparatus includes a plurality of stacked flat Bragg diffractors having at least a first flat Bragg diffractor and a second flat Bragg diffractor. The first and second flat Bragg diffractors are positioned sequentially along an x-ray propagation axis of an x-ray beam. The x-ray beam includes x-rays and has an angular beam divergence less than 30 mrad in at least one direction.

公开(公告)号：US12111271B1

公开(公告)日：2024-10-08

申请号：US18504493

申请日：2023-11-08

Applicant: Seethru AI Inc.

Inventor： Omar Al-Kofahi

IPC: G01N23/00 ,  G01N23/20008

CPC classification number: G01N23/20008 ,  G01N2223/33

Abstract: Presently disclosed is an x-ray scanning system and method for inspecting an object. The system has a first mobile x-ray scanner configured for scatter imaging and to generate a first compilation of scan data of a first side of the object. A second x-ray scanner is configured for imaging and generating a second compilation of scan data of a second side of the object. A movement device is configured and disposed to move at least one of the first scanner, the second scanner, and the object being scanned, during the scanning of the object. A data integrator is configured and disposed to receive and integrate the first compilation of scan data and the second compilation of scan data.

公开(公告)号：US12099025B2

公开(公告)日：2024-09-24

申请号：US17849632

申请日：2022-06-25

Applicant: THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY

Inventor： Lin Zheng ,  Shitao Dou ,  Xin Chen ,  Lunwu Zhang ,  Jin Zhang ,  Taibin Wu ,  Luchang Che ,  Chengzhang Wang ,  Kun Zhou ,  Fangchao Zhao ,  Changguang He ,  Xianhe Feng

IPC: G01N23/207 ,  G01N23/20008 ,  G01N23/20091 ,  G01N23/2055

CPC classification number: G01N23/207 ,  G01N23/20008 ,  G01N23/20091 ,  G01N23/2055 ,  G01N2223/0563 ,  G01N2223/0566 ,  G01N2223/1016 ,  G01N2223/204 ,  G01N2223/3037 ,  G01N2223/316 ,  G01N2223/3306 ,  G01N2223/3307 ,  G01N2223/3308 ,  G01N2223/331 ,  G01N2223/501 ,  G01N2223/605 ,  G01N2223/606 ,  G01N2223/607

Abstract: A device for measuring short-wavelength characteristic X-ray diffraction based on array detection, and a measurement and analysis method based on the device are provided. An array detector of the device only detects and receives a diffraction ray which is diffracted by a material of a to-be-measured part inside a sample and passes through a through hole of a receiving collimator, and rays passing through a positioning hole. The to-be-measured part inside the sample is placed at the center of the diffractometer circle of the device. The method is performed with the device. With the present disclosure, a diffraction pattern of a part inside the sample with a centimeter thickness, i.e. Debye rings, can be rapidly and non-destructively measured, thereby rapidly and non-destructively measuring and analyzing crystal structures, and its crystal structural change of the part inside the sample, such as phase, texture, and stress.

公开(公告)号：US20240255447A1

公开(公告)日：2024-08-01

申请号：US18429073

申请日：2024-01-31

Applicant: Eldico Scientific AG

Inventor： Francesco Garbuglia ,  Gustavo Santiso-Quinones ,  Laura Samperisi ,  Danny Taminiau ,  Nico Tan

IPC: G01N23/20058 ,  G01N23/20008

CPC classification number: G01N23/20058 ,  G01N23/20008

Abstract: One variation of a system includes: a housing configured to hold a vacuum; a primary assembly; and a cooling assembly. The primary assembly includes: a sample receiver including a base section and a sample holder mounted to the base section and configured to transiently receive and retain a sample specimen; a receiver platform configured to receive and support the sample receiver; and a set of positioner stages flexibly coupled to the receiver platform and configured to transiently drive the sample holder to locate the sample specimen in a position intersecting an electron pathway. The cooling assembly includes: a cold finger defining an end submerged in a volume of coolant; and a conductive cooling braid coupled to the cold finger and to the primary assembly; and configured to communicate heat from the primary assembly into the cold finger to cool the sample specimen to temperatures within a target sample temperature range.

公开(公告)号：US20240248050A1

公开(公告)日：2024-07-25

申请号：US18562508

申请日：2022-05-24

Applicant: XENOCS SAS

Inventor： Peter HOGHOJ ,  Karsten JOENSEN ,  Pierre PANINE

IPC: G01N23/201 ,  G01N23/20008

CPC classification number: G01N23/201 ,  G01N23/20008 ,  G01N2223/33

Abstract: An X-ray scattering apparatus has a sample vacuum chamber, a sample holder placed inside the sample vacuum chamber for aligning and/or orienting a sample to be analyzed by X-ray scattering, an X-ray beam delivery system having a 2D X-ray source and a 2D monochromator and being arranged upstream of the sample holder for generating and directing an X-ray beam along a beam path in a propagation direction towards the sample holder. An X-ray detector placed inside a diffraction chamber connected to the sample vacuum chamber where the X-ray detector is arranged downstream of the sample holder and is movable, in a motorized way, along the propagation direction so as to detect the X-ray beam and X-rays scattered at different scattering angles, where the X-ray beam delivery system is configured to focus the X-ray beam onto a focal spot on or near the X-ray detector when placed at its distal position.

公开(公告)号：US12031925B2

公开(公告)日：2024-07-09

申请号：US17899096

申请日：2022-08-30

Applicant: Malvern Panalytical B.V.

Inventor： Detlef Beckers ,  Alexander Kharchenko ,  Milen Gateshki

IPC: G01N23/20008 ,  G01N23/223 ,  H05G1/52 ,  A61B6/00 ,  A61B6/40 ,  A61B6/42

CPC classification number: G01N23/20008 ,  G01N23/223 ,  A61B6/40 ,  A61B6/4208 ,  A61B6/44 ,  H05G1/52

Abstract: The present invention relates to an X-ray analysis apparatus and a method of X-ray analysis. The X-ray analysis apparatus enables a user to carry out a plurality of X-ray analysis applications, for analysing a sample by measuring X-ray diffraction and/or X-ray fluorescence, using the same X-ray source. The apparatus comprises an X-ray source for irradiating the sample with X-rays, the X-ray source comprising a solid anode and a cathode for emitting an electron beam. It also comprises a focusing arrangement for focusing the electron beam onto the anode, and a controller. The controller is configured to receive X-ray analysis application information and to control the X-ray analysis apparatus to selectively operate in either a first X-ray analysis mode or a second X-ray analysis mode based on the X-ray analysis application information. In the first X-ray analysis mode the X-ray source operates at a first operating power and has an effective focal spot size that is less than 100 μm. In the second X-ray analysis mode the X-ray source operates at a second operating power that is higher than the first operating power, and the area of the effective focal spot is larger than the area of the effective focal spot in the first X-ray analysis mode.

公开(公告)号：US20240201112A1

公开(公告)日：2024-06-20

申请号：US18535073

申请日：2023-12-11

Applicant: Gatan, Inc.

Inventor： Colin Geoffrey TREVOR ,  Melanie BARFELS

IPC: G01N23/20058 ,  G01N23/20008

CPC classification number: G01N23/20058 ,  G01N23/20008

Abstract: A system and method for compensating for chromatic aberration in a transmission electron microscope used with an electron energy level spectrometer is described. The method adjusts an electrostatic or magnetic lens located between an electron microscope and a bending magnet to focus the electron microscope beam at electron energy levels under observation.

公开(公告)号：US11927552B2

公开(公告)日：2024-03-12

申请号：US17499614

申请日：2021-10-12

Applicant: QUAESTA INSTRUMENTS, LLC

Inventor： Peter Shifflett ,  Gary Womack ,  Steven Hamann

IPC: G01N23/204 ,  G01N23/20008 ,  G01N33/24 ,  G01V5/00 ,  H02S20/32 ,  H01Q1/24

CPC classification number: G01N23/204 ,  G01N23/20008 ,  G01N33/246 ,  G01V5/0075 ,  H02S20/32 ,  G01N2033/245 ,  G01N2223/05 ,  G01N2223/053 ,  G01N2223/063 ,  G01N2223/1063 ,  G01N2223/1066 ,  G01N2223/205 ,  G01N2223/301 ,  G01N2223/613 ,  H01Q1/24

Abstract: An apparatus for cosmogenic neutron sensing to detect moisture includes a thermal neutron proportional counter. A housing is formed at least partially from a moderating material, which is positioned around the thermal neutron proportional counter. A proportional counter electronics unit is within the housing and has a preamplifier and a shaping amplifier. The preamplifier and shaping amplifier are directly connected to the thermal neutron proportional counter. At least one photovoltaic panel provides electrical power to the thermal neutron proportional counter. A data logger is positioned vertically above the thermal neutron proportional counter and proportional counter electronics unit. A signal from the thermal neutron proportional counter is transmitted through the proportional counter electronics unit and is received by the data logger. The signal indicates a moisture content within a measurement surface of the thermal neutron proportional counter.

公开(公告)号：US11921059B2

公开(公告)日：2024-03-05

申请号：US18350093

申请日：2023-07-11

Applicant: Canon Anelva Corporation

Inventor： Takeo Tsukamoto

IPC: G01N23/04 ,  G01N23/083 ,  G01N23/18 ,  G01N23/20008 ,  G01N23/2206 ,  G01N23/223 ,  G21K7/00 ,  H01J35/18

CPC classification number: G01N23/18 ,  G01N23/04 ,  G01N23/083 ,  G01N23/20008 ,  G01N23/2206 ,  G01N23/223 ,  G21K7/00 ,  H01J35/186 ,  G01N2223/04 ,  G01N2223/052 ,  G01N2223/071 ,  G01N2223/076 ,  G01N2223/1016 ,  G01N2223/20 ,  G01N2223/204 ,  G01N2223/32 ,  G01N2223/643 ,  G01N2223/652

Abstract: An inspection apparatus for inspecting an inspection target surface arranged on an inspection plane, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection plane; and an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface. The X-ray detector has an energy resolution not less than 1 keV or the X-ray detector has no energy analysis function.

公开(公告)号：US11885755B2

公开(公告)日：2024-01-30

申请号：US18309021

申请日：2023-04-28

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Ruimin Qiao ,  Sylvia Jia Yun Lewis ,  Srivatsan Seshadri ,  Janos Kirz ,  Benjamin Donald Stripe

IPC: G01N23/207 ,  G01N23/20008 ,  G01N23/085 ,  G01N23/2209

CPC classification number: G01N23/2076 ,  G01N23/085 ,  G01N23/20008 ,  G01N23/2209 ,  G01N2223/041 ,  G01N2223/0568 ,  G01N2223/076 ,  G01N2223/1016 ,  G01N2223/316 ,  G01N2223/32 ,  G01N2223/50 ,  G01N2223/652

Abstract: An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.