摘要:
A semiconductor device includes a rectangular lower semiconductor element (6); a plurality of external electrodes (9) located in a pattern on the lower semiconductor element along sides thereof; a plurality of internal electrodes electrically connected to the plurality of external electrodes via a plurality of line patterns respectively and located on the lower semiconductor element in a pattern; dams (12) provided in such a pattern that each of the dams encloses one or at least two external electrodes among the plurality of external electrodes; an upper semiconductor element (5) mounted on the lower semiconductor element (6) such that a plurality of terminals on the upper semiconductor element are electrically connected to the plurality of internal electrodes respectively; and a resin (4) potted to flow to a space between the lower semiconductor element and the upper semiconductor element.
摘要:
A semiconductor device includes a rectangular lower semiconductor element (6); a plurality of external electrodes (9) located in a pattern on the lower semiconductor element along sides thereof; a plurality of internal electrodes electrically connected to the plurality of external electrodes via a plurality of line patterns respectively and located on the lower semiconductor element in a pattern; dams (12) provided in such a pattern that each of the dams encloses one or at least two external electrodes among the plurality of external electrodes; an upper semiconductor element (5) mounted on the lower semiconductor element (6) such that a plurality of terminals on the upper semiconductor element are electrically connected to the plurality of internal electrodes respectively; and a resin (4) potted to flow to a space between the lower semiconductor element and the upper semiconductor element.
摘要:
The on-resistance of a vertical power transistor is substantially reduced by forming a thick metal layer on top of the relatively thin metal layer that is conventionally used to make contact with the individual transistor cells in the device. The thick metal layer is preferably plated electrolessly on the thin metal layer through an opening that is formed in the passivation layer.
摘要:
A semiconductor device includes a square pellet, a gate electrode pad, a drain electrode pad, a pair of source electrode pads, and a source electrode path. The pellet has first and second diagonal lines. The gate electrode pad is arranged on one of two corners located on the first diagonal line on the pellet. The drain electrode pad is arranged on the other of the two corners located on the first diagonal line on the pellet. The pair of source electrode pads are arranged on two corners located on the second diagonal line on the pellet. The source electrode path connects the source electrode pads to each other.
摘要:
A semiconductor device includes a square pellet, a gate electrode pad, a drain electrode pad, a pair of source electrode pads, and a source electrode path. The pellet has first and second diagonal lines. The gate electrode pad is arranged on one of two corners located on the first diagonal line on the pellet. The drain electrode pad is arranged on the other of the two corners located on the first diagonal line on the pellet. The pair of source electrode pads are arranged on two corners located on the second diagonal line on the pellet. The source electrode path connects the source electrode pads to each other.
摘要:
In a microwave oscillator device, wires (1,2,3 etc) form inductors in a feedback path between a control electrode (e.g. gate) and a second main electrode (e.g. source) of a transistor (e.g. a GaAs MESFET). The transistor body (10) is mounted within an insulating surround 25, on a base 21 providing a first device terminal. The connection to the second main electrode comprises in series at least first and second lengths (1,2) of wire, whereas the connection to the control electrode comprises a third length (3) of wire. The invention permits the construction of a mechanical and electrical replacement for a Gunn diode by compressing the wire lengths (1,2,3 etc) in a particular arrangement into the small space inside a conventional Gunn diode envelope (20). The first wire length (1) and possibly more lengths are arched onto a low bonding area (15,16,17) adjacent the base (21), where the second and third wire lengths extend upto an upper bonding area (23) adjacent the top of the surround (25) and connected to the second terminal (22). The resulting inductance of the connection (1,2, and possibly 4) between the second main electrode and the second terminal (22) is higher than the inductance of the connection (3) between the control electrode and the second terminal (22), whcih provides an impedance level equivalent to that of the Gunn diode which the device replaces.
摘要:
The invention relates to an electronic system comprising: - an integrated circuit die (10') having: • at least 2 bond pads (20, 37) • a redistribution layer, said redistribution layer having: - at least a solder pad (19') comprising 2 portions (33, 34) arranged to enable an electrical connection between each other by a same solder ball placed on said solder pad (19'), but electrically isolated of each other in the absence of a solder ball on the solder pad (19') - at least 2 redistribution wires (22, 23, 39), each one connecting one of the 2 portions (33, 34) to one of the 2 bond pads (20, 37),
a second bond pad (37) connected via a second redistribution wire (39) to a second portion (34) of the solder pad (19') being dedicated to testing said integrated circuit die (10') - a grounded printed circuit board track (24), a solder ball (35) being placed between the solder pad (19') and the printed circuit board track (24).
摘要:
Eine Schaltzellenanordnung (1) umfasst zumindest eine Schaltzelle (2, 2 1 , 2 2 , 2 3 ), wobei diese einen Schaltungsträger (8) und zumindest zwei Halbleiterschaltelemente (3 1 , 3 2 ) aufweist, wobei ein erstes Halbleiterschaltelement (3 1 ) auf einer ersten Seite des Schaltungsträgers (8) angeordnet und mit diesem elektrisch leitend verbunden ist und wobei ein zweites Halbleiterschaltelement (3 2 ) auf einer zweiten, der ersten Seite gegenüberliegenden Seite des Schaltungsträgers (8) angeordnet und mit diesem elektrisch leitend verbunden ist. Ein erster Anschlussbereich (5 1 ) des ersten Halbleiterschaltelements (3 1 ) ist über eine erste elektrische Leitung (6 1 ) in einem ersten Teil (7 1 ) des Schaltungsträgers (8) mit einem ersten Anschluss (4 1 ) einer Gleichspannungsversorgung (4) verbunden. Ein zweiter Anschlussbereich (5 2 ) des zweiten Halbleiterschaltelements (3 2 ) ist über eine zweite elektrische Leitung (6 2 ) in dem ersten Teil (7 1 ) des Schaltungsträgers (8) mit einem zweiten Anschluss (4 2 ) der Gleichspannungsversorgung (4) verbunden. Außerdem sind ein zweiter Anschlussbereich (5 2 ) des ersten Halbleiterschaltelements (3 1 ) und ein erster Anschlussbereich (5 1 ) des zweiten Halbleiterschaltelements (3 2 ) miteinander und mit einem elektrisch leitfähigen zweiten Teil (7 2 ) des Schaltungsträgers (8) verbunden.