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    TESTING INTEGRATED CIRCUITS USING FEW TEST PROBES
    3.
    发明申请
    TESTING INTEGRATED CIRCUITS USING FEW TEST PROBES 有权
    使用几个测试探针测试集成电路

    公开(公告)号：US20130120012A1

    公开(公告)日：2013-05-16

    申请号：US13716018

    申请日：2012-12-14

    Applicant: STMicroelectronics S.r.I.

    Inventor： Alberto Pagani

    IPC: G01R31/28

    CPC classification number: G01R31/2841 ,  G01R31/2851 ,  G01R31/3172 ,  G01R31/31905 ,  G01R31/31926 ,  H01L22/30 ,  H01L2224/16 ,  H01L2924/1461 ,  H01L2924/00

    Abstract: A method of testing integrated circuits, including establishing at least a first physical communication channel between a test equipment and an integrated circuit under test by having at least a first probe of the test equipment contacting a corresponding physical contact terminal of the integrated circuit under test; having the test equipment and the integrated circuit under test exchange, over said first physical communication channel, at least two signals selected from the group including at least two test stimuli and at least two test response signals, wherein said at least two signals are exchanged by means of at least one modulated carrier wave modulated by the at least two signals.

    Abstract translation: 一种测试集成电路的方法，包括通过使测试设备的至少第一探针与被测集成电路的对应的物理接触端子相接触来在测试设备和被测集成电路之间建立至少第一物理通信通道; 使所述测试设备和被测集成电路交换，通过所述第一物理通信信道，从包括至少两个测试刺激和至少两个测试响应信号的组中选出的至少两个信号，其中所述至少两个信号由 由至少两个信号调制的至少一个调制载波的装置。

    Block Made of a Building Material
    4.
    发明申请
    Block Made of a Building Material 审中-公开

    公开(公告)号：US20190271664A1

    公开(公告)日：2019-09-05

    申请号：US16415973

    申请日：2019-05-17

    Applicant: STMicroelectronics S.r.I.

    Inventor： Alberto Pagani

    IPC: G01N27/82 ,  G01N33/38 ,  G01N27/72

    Abstract: A building structure includes a block of building material and a magnetic circuit buried in the block of building material. The structure also includes a plurality of sensing devices buried in the block of building material. Each sensing device may include a contactless power supplying circuit magnetically coupled with the magnetic circuit to generate a supply voltage when the magnetic circuit is subject to a variable magnetic field.

    Pressure sensor device for measuring a differential normal pressure to the device and related methods
    5.
    发明授权
    Pressure sensor device for measuring a differential normal pressure to the device and related methods 有权

    公开(公告)号：US10041848B2

    公开(公告)日：2018-08-07

    申请号：US15644301

    申请日：2017-07-07

    Applicant: STMicroelectronics S.r.I.

    Inventor： Alessandro Motta ,  Alberto Pagani ,  Giovanni Sicurella

    IPC: G01L9/06 ,  G01L1/18 ,  G01L9/00

    Abstract: A pressure sensor device is to be positioned within a material where a mechanical parameter is measured. The pressure sensor device may include an IC having a ring oscillator with an inverter stage having first doped and second doped piezoresistor couples. Each piezoresistor couple may include two piezoresistors arranged orthogonal to one another with a same resistance value. Each piezoresistor couple may have first and second resistance values responsive to pressure. The IC may include an output interface coupled to the ring oscillator and configured to generate a pressure output signal based upon the first and second resistance values and indicative of pressure normal to the IC.

    ELECTROMAGNETIC SHIELD FOR TESTING INTEGRATED CIRCUITS
    8.
    发明申请
    ELECTROMAGNETIC SHIELD FOR TESTING INTEGRATED CIRCUITS 审中-公开
    用于测试集成电路的电磁屏蔽

    公开(公告)号：US20150054538A1

    公开(公告)日：2015-02-26

    申请号：US14533526

    申请日：2014-11-05

    Applicant: STMicroelectronics S.r.I.

    Inventor： Alberto Pagani

    IPC: G01R1/18 ,  G01R31/28 ,  G01R1/073

    CPC classification number: G01R1/18 ,  G01R1/06772 ,  G01R1/07307 ,  G01R31/2884 ,  G01R31/2886

    Abstract: A probe card includes a number probes. Each probe is adapted to contact a corresponding terminal of a circuit integrated in at least one die of a semiconductor material wafer during a test phase of the wafer. The probes include at least one probe adapted to provide and/or receive a radio frequency test signal to/from the corresponding terminal during the test phase. The probe card further includes at least one electromagnetic shield structure corresponding to the at least one probe adapted to provide and/or receive the radio frequency test signal for the at least partial shielding of an electromagnetic field irradiated by such at least one probe adapted to provide and/or receive the radio frequency test signal.

    Abstract translation: 探针卡包括数字探针。 每个探针适于在晶片的测试阶段期间接触集成在半导体材料晶片的至少一个管芯中的电路的相应端子。 探针包括适于在测试阶段期间向/从相应终端提供和/或接收射频测试信号的至少一个探头。 探针卡还包括对应于至少一个探头的至少一个电磁屏蔽结构，适于提供和/或接收射频测试信号，用于至少部分屏蔽由这样的至少一个探头照射的电磁场，该探针适于提供 和/或接收射频测试信号。

    MAGNETIC INERTIAL SENSOR AND METHOD FOR OPERATING THE SAME
    9.
    发明申请
    MAGNETIC INERTIAL SENSOR AND METHOD FOR OPERATING THE SAME 有权
    磁性惯性传感器及其操作方法

    公开(公告)号：US20130255381A1

    公开(公告)日：2013-10-03

    申请号：US13854782

    申请日：2013-04-01

    Applicant: STMICROELECTRONICS S.R.I.

    Inventor： Giulio Ricotti ,  Alberto Pagani ,  Fulvio Vittorio Fontana ,  Ubaldo Mastromatteo

    IPC: G01P15/105

    CPC classification number: G01P15/11 ,  B81B7/008 ,  B81B2201/025 ,  B81B2207/012 ,  B81C1/0023 ,  G01C19/5783 ,  G01P15/0802 ,  G01P15/097 ,  G01P15/105 ,  H01L2224/16225 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2924/00014

    Abstract: An inertial sensor having a body with an excitation coil and a first sensing coil extending along a first axis. A suspended mass includes a magnetic-field concentrator, in a position corresponding to the excitation coil, and configured for displacing by inertia in a plane along the first axis. A supply and sensing circuit is electrically coupled to the excitation coil and to the first sensing coil, and is configured for generating a time-variable flow of electric current that flows in the excitation coil so as to generate a magnetic field that interacts with the magnetic-field concentrator to induce a voltage/current in the sensing coil. The integrated circuit is configured for measuring a value of the voltage/current induced in the first sensing coil so as to detect a quantity associated to the displacement of the suspended mass along the first axis.

    Abstract translation: 惯性传感器，其具有带有激励线圈的主体和沿着第一轴线延伸的第一感测线圈。 悬挂质量体包括磁场集中器，位于对应于激励线圈的位置，并且构造成用于沿沿着第一轴线的平面中的惯性移位。 供电和感测电路电耦合到激励线圈和第一感测线圈，并且被配置为产生在励磁线圈中流动的时间流的电流，以便产生与磁场相互作用的磁场 感应线圈中的电压/电流。 集成电路被配置为测量在第一感测线圈中感应的电压/电流的值，以便检测与悬挂质量沿着第一轴的位移相关联的量。

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