System-on-chip comprising a non-volatile memory

    公开(公告)号:US12124713B2

    公开(公告)日:2024-10-22

    申请号:US18057390

    申请日:2022-11-21

    IPC分类号: G06F3/06

    摘要: A system-on-chip includes a processor, a memory and a memory interface coupled to the processor and to the memory. The processor, in operation, generates memory access requests. The memory includes one or more physical banks divided into a succession of sectors, each sector having a size equal to a smallest erasable size of the memory. The memory interface, in operation, responds to receiving memory configuration information by storing logical memory bank configuration information in the one or more configuration registers, the logical memory bank configuration information assigning each sector of the one or more physical banks of the memory to a respective logical memory bank of one or more logical memory banks. The memory interface, in operation, controls access to the memory by the processor based on the logical memory bank configuration information stored in the one or more configuration registers.

    PHYSICAL UNCLONABLE FUNCTION DEVICE AND METHOD

    公开(公告)号:US20240296253A1

    公开(公告)日:2024-09-05

    申请号:US18661060

    申请日:2024-05-10

    发明人: Francesco La Rosa

    摘要: An embodiment system comprises a physical unclonable function device, wherein the device comprises a first assembly of non-volatile memory cells each having a selection transistor embedded in a semiconductor substrate and a depletion-type state transistor having a control gate and a floating gate that are electrically connected, the state transistors having respective effective threshold voltages belonging to a common random distribution, and a processing circuit configured to deliver, to an output interface of the device, a group of output data based on a reading of the effective threshold voltages of the state transistors of the memory cells of the first assembly.

    Random number generator
    9.
    发明授权

    公开(公告)号:US12019510B2

    公开(公告)日:2024-06-25

    申请号:US17684198

    申请日:2022-03-01

    IPC分类号: G06F7/58 G06F11/10 G06F11/26

    CPC分类号: G06F11/10 G06F7/58 G06F11/26

    摘要: The present disclosure relates to a circuit for testing a random number generator adapted to delivering a series of random bits and comprising at least one test unit configured to detect a defect in the series of random bits, said test circuit being adapted to verifying whether, after the detection of a first defect by the test unit, the number of random bits, generated by the random number generator without the detection of a second defect by said unit test, is smaller than a first threshold.