Block copy
    161.
    发明授权

    公开(公告)号:US12086441B2

    公开(公告)日:2024-09-10

    申请号:US17461105

    申请日:2021-08-30

    Applicant: Rambus Inc.

    Abstract: An interconnected stack of one or more Dynamic Random Access Memory (DRAM) die also has one or more custom logic, controller, or processor die. The custom die(s) of the stack include direct channel interfaces that allow direct access to memory regions on one or more DRAMs in the stack. The direct channels are time-division multiplexed such that each DRAM die is associated with a time slot on a direct channel. The custom die configures a first DRAM die to read a block of data and transmit it via the direct channel using a time slot that is assigned to a second DRAM die. The custom die also configures the second memory device to receive the first block of data in its assigned time slot and write the block of data.

    Stacked Memory Device with Paired Channels
    164.
    发明公开

    公开(公告)号:US20240086112A1

    公开(公告)日:2024-03-14

    申请号:US18470232

    申请日:2023-09-19

    Applicant: Rambus Inc.

    Inventor: Thomas Vogelsang

    CPC classification number: G06F3/0659 G06F3/061 G06F3/0673

    Abstract: A stacked memory device includes memory dies over a base die. The base die includes separate memory channels to the different dies and external channels that allow an external processor access to the memory channels. The base die allows the external processor to access multiple memory channels using more than one external channel. The base die also allows the external processor to communicate through the memory device via the external channels, bypassing the memory channels internal to the device. This bypass functionality allows the external processor to connect to additional stacked memory devices.

    STACKED DRAM DEVICE AND METHOD OF MANUFACTURE

    公开(公告)号:US20220238141A1

    公开(公告)日:2022-07-28

    申请号:US17568649

    申请日:2022-01-04

    Applicant: Rambus Inc.

    Inventor: Thomas Vogelsang

    Abstract: A memory device includes a first dynamic random access memory (DRAM) integrated circuit (IC) chip including first memory core circuitry, and first input/output (I/O) circuitry. A second DRAM IC chip is stacked vertically with the first DRAM IC chip. The second DRAM IC chip includes second memory core circuitry, and second I/O circuitry. Solely one of the first DRAM IC chip or the second DRAM IC chip includes a conductive path that electrically couples at least one of the first memory core circuitry or the second memory core circuitry to solely one of the first I/O circuitry or the second I/O circuitry, respectively.

    Compute accelerator with 3D data flows

    公开(公告)号:US11341086B2

    公开(公告)日:2022-05-24

    申请号:US17093227

    申请日:2020-11-09

    Applicant: Rambus Inc.

    Abstract: An array of processing elements are arranged in a three-dimensional array. Each of the processing elements includes or is coupled to a dedicated memory. The processing elements of the array are intercoupled to their nearest neighbor processing elements. A processing element on a first die may be intercoupled to a first processing element on a second die that is located directly above the processing element, a second processing element on a third die that is located directly below the processing element, and the four adjacent processing elements on the first die. This intercoupling allows data to flow from processing element to processing element in the three directions. These dataflows are reconfigurable so that they may be optimized for the task. The data flows of the array may be configured into one or more loops that periodically recycle data in order to accomplish different parts of a calculation.

    TESTING THROUGH-SILICON-VIAS
    169.
    发明申请

    公开(公告)号:US20210233599A1

    公开(公告)日:2021-07-29

    申请号:US17226216

    申请日:2021-04-09

    Applicant: RAMBUS INC.

    Abstract: Embodiments generally relate to integrated circuit devices having through silicon vias (TSVs). In one embodiment, an integrated circuit (IC) device includes a field of TSVs and an address decoder that selectably couples at least one of the TSVs to at least one of a test input and a test evaluation circuit. In another embodiment, a method includes selecting one or more TSVs from a field of TSVs in at least one IC device, and coupling each selected TSV to at least one of a test input and a test evaluation circuit.

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