Abstract:
An infrared collector which employs a non-directive concentrator to concentrate the infrared radiation received in the collector on a detector. In a preferred embodiment, the concentrator is a plastic hemisphere which has an array of PIN diodes glued to its flat side. The hemisphere may have any radius which is greater than or equal to a value dN, where N is the index of refraction of the plastic making up the hemisphere is N and d is the distance from the center of the array of diodes to the most remote part of the infrared-sensitive material. The fact that the concentrator is non-directive obviates the need to aim receivers employing the concentrator at transmitters. The receivers and transmitters need only be in line of sight of each other. The concentrator may further be used generally to concentrate infrared and visible radiation.
Abstract:
Photodetectors having low reflectivity triangular groove, surface relief gratings on homogenous material or one layer of a heterostructure. Preferably, the photodetector is a PIN photodiode in which the p-type layer is triangularly grooved. The surface relief gratings have an optical repeat distance greater than the wavelenth of light which impinges on the photodetector surface. Thus, zero order backward diffracted waves are not coupled into optical reflections which would thereby decrease the optical return loss (ORL). Furthermore, the surface relief gratings have minimum side-wall angles to limit reflection at the heterostructure interfaces from contributing to the ORL. The side-angles of the gratings are chosen to ensure that the angle of the higher order backward diffracted wave is greater than the capture angle of an optical receiver into which the photodetector is incorporated. The free-space depth of the grooves is a half-wavelength of the light impinging on the photodetector. Additionally, a novel ion milling technique is disclosed. This technique involves providing a rectangular groove grating initially etched by conventional chemical etching and photoresistive techniques and then ion milling at particular ion mill angles to obtain triangular groove surface relief gratings provided in accordance with this invention.
Abstract:
A lens-sphere optical system for use in a low resolution, very wide angle optical sensor system for viewing incident energy from a scene of interest. A lens-sphere forms an output image of the scene of interest on a spherical surface. Apparatus for optically filtering the lens-sphere blocks incident energy outside of a predetermined range of incident angles. Apparatus for detecting the optically filtered output image is provided.
Abstract:
Very wide field of view optical surveillance is realized without scanning or moving parts by means of an integrated multiaperture optical system. The system utilizes light gathering optics in the form of an array of eyelets or lens apertures that direct in-coming light onto a detector layer. The detection layer consists of individual detectors, more than one to a lens. Under the detector layer there is a correlation layer, which contains a memory cell for each detector and circuitry which connects to neighboring memory cells according to a hard wired program. Below the correlation layer is a processing layer which contains microprocessor circuitry allowing further processing of the acquired information. Outlines of objects seen by the system are defined by the microprocessor circuitry using an edge detecting routine. A detected object is identified by correlation with a single number recognition coefficient. The microprocessor circuit includes a memory matrix in which is stored recognition coefficient for objects of interest. The lens aperture can be configured to form either apposition or neural superportion images and algorithms for processing information obtained by both modes of operation are developed. The data processing circuitry is implemented by means of large scale integrated circuit technology whereby the memories in the correlation layer are physically located directly below their associated detectors.
Abstract:
A transparent photocell formed of two thin film layers of a semi-conductor material and an intervening thin film layer of a photoconductor material, a constant voltage being applied across the semi-conductor layers and the current through the cell being detected as a measure of the intensity of light incident on the cell. The thin film nature of the cell enables it to be combined with a lens of an optical system as a plurality of laminae coated onto a surface of said lens.
Abstract:
A radiation transparent base having a number of coincentric Fresnel rings mounted on one face, and one-quarter wavelength in thickness and a reflective coating covering the face and rings and a detector mounted on the opposite face to collect reflected in phase radiation.
Abstract:
An optical filter element is provided which comprises a plastic resin containing a particulate dispersion of filter glass. In one preferred embodiment, the photocell of a photometric device, e.g., the automatic exposure control system of a photographic camera, is embedded in the glass-filled resinous element to provide necessary spectral correction filtration for the photocell.
Abstract:
Disclosed are optical devices and methods of manufacturing optical devices. An optical device can include a substrate; an optical emitter chip affixed to the front surface of the substrate; and an optical sensor chip affixed to the front surface of the substrate. The optical sensor chip can include a main sensor and a reference sensor. The optical device can include an opaque dam separating the main optical sensor and the reference sensor. The optical device can include a first transparent encapsulation block encapsulating the optical emitter chip and the reference optical sensor and a second transparent encapsulation block encapsulating the main optical sensor. The optical device can include an opaque encapsulation material encapsulating the first transparent encapsulation block and the second transparent encapsulation block with a first opening above the main optical sensor and a second opening above the optical emitter chip.
Abstract:
A device is disclosed for monitoring power from a laser diode. The device includes a substrate having a top surface and a first facet perpendicular to the top surface through which light enters the substrate. The device further includes a second facet onto which light that has entered the substrate through the first facet along an optical axis that is non-normal to the first facet is incident. The device further includes a photodiode fabricated on the top surface of the substrate for measuring an intensity of the light that enters the first facet of the substrate along the optical axis that is non-normal to the first facet. The light that has entered the substrate through the first facet along the optical axis that is non-normal to the first facet is reflected by the second facet toward a photoactive region of the photodiode.