Method of forming bonded body and bonded body
    12.
    发明授权
    Method of forming bonded body and bonded body 有权
    形成粘结体和粘结体的方法

    公开(公告)号:US07963435B2

    公开(公告)日:2011-06-21

    申请号:US12358689

    申请日:2009-01-23

    IPC分类号: B23K31/02

    摘要: A method of forming a bonded body comprised of a first base member, a second base member, and a first bonding film and a second bonding film provided between the first base member and the second base member is provided. The first bonding film and the second bonding film are constituted of copper and an organic component, and an amount of copper contained in each of the first bonding film and the second bonding film is 90 atom % or higher but lower than 99 atom % at an atomic ratio. The method is comprised of: forming the first bonding film on the first base member by using a chemical vapor-film formation method; forming the second bonding film on the second base member by using a chemical vapor-film formation method; bringing the first bonding film formed on the first base member into contact with the second bonding film formed on the second base member so that the first bonding film faces the second bonding film; and applying a compressive force to the first base member and the second base member so that the first bonding film and the second bonding film are bonded together to thereby obtain the bonded body. Two base members can be firmly and efficiently bonded together with high dimensional accuracy at a low temperature, and the two base members can be efficiently separated (peeled off) to each other after use of the bonded body. Further, a bonded body is also provided.

    摘要翻译: 提供一种形成由第一基底构件,第二基底构件和第一接合膜构成的接合体的方法和设置在第一基底构件和第二基底构件之间的第二接合薄膜。 第一接合膜和第二接合膜由铜和有机成分构成,并且在第一接合膜和第二接合膜中的每一个中的铜量为90原子%以上且低于99原子% 原子比。 该方法包括:通过使用化学气相成膜法在第一基底构件上形成第一接合膜; 通过使用化学气相成膜法在第二基底构件上形成第二接合膜; 使形成在第一基底构件上的第一接合膜与形成在第二基底构件上的第二接合膜接触,使得第一接合膜面向第二接合膜; 并且向第一基底构件和第二基底构件施加压缩力,使得第一接合膜和第二接合膜接合在一起,从而获得接合体。 两个基底构件可以在低温下以高尺寸精度牢固有效地粘合在一起,并且在使用粘合体之后可以将两个基底构件彼此有效地分离(剥离)。 此外,还提供了粘合体。

    NONTHERMAL TRANSFER SHEET AND METHOD FOR MANUFACTURING THE SAME
    15.
    发明申请
    NONTHERMAL TRANSFER SHEET AND METHOD FOR MANUFACTURING THE SAME 审中-公开
    非转移片及其制造方法

    公开(公告)号:US20100028622A1

    公开(公告)日:2010-02-04

    申请号:US12442532

    申请日:2007-08-27

    申请人: Mitsuru Sato

    发明人: Mitsuru Sato

    摘要: A nonthermal transfer sheet (11) usable for transfer to various types of objects including daily personal items such as clothing and the like and also human skin. In order to allow transfer to be realized without heating or pressurization, a transfer layer (33), which is or is not provided with a multi-color design layer (32) and is to be a main part of the nonthermal transfer sheet, and an adhesive layer (34) for pasting the transfer layer (33) to a transfer subject (51) are integrated together in advance by heating and pressurization. The transfer layer (33) is formed of a thermoplastic resin containing polyurethane as a main component, and therefore is highly flexible, extendable and transferrable even to human body. The adhesive layer (34) is formed of an adhesive containing an acrylic adhesive, and therefore is not reduced in the adhesive force and can be re-transferred (re-pasted). As a result, a wide range of transfer effects including decoration is provided. In addition, the nonthermal transfer sheet is easily removable and so is easily usable.

    摘要翻译: 可用于转移到各种物品(包括日常个人物品如衣服等)以及人类皮肤的非热转印片材(11)。 为了在没有加热或加压的情况下实现转印,设置或不设置多色设计层(32)并且将成为非热转印片材的主要部分的转印层(33),以及 用于将转印层(33)粘贴到转印体(51)上的粘合剂层(34)通过加热和加压预先结合在一起。 转印层(33)由含有聚氨酯作为主要成分的热塑性树脂形成,因此即使对人体也具有高度柔性,可延展性和可转印性。 粘合剂层(34)由含有丙烯酸粘合剂的粘合剂形成,因此不会降低粘合力并且可以再次转移(重新粘贴)。 结果,提供了广泛的转移效果,包括装饰。 此外,非热转印片易于拆除,因此易于使用。

    SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING OF THE SAME
    17.
    发明申请
    SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING OF THE SAME 有权
    半导体存储器件及其制造方法

    公开(公告)号:US20080219054A1

    公开(公告)日:2008-09-11

    申请号:US12039461

    申请日:2008-02-28

    IPC分类号: G11C11/34

    摘要: A semiconductor memory device includes a plurality of active areas each extending in a first direction and including a memory cell string which includes select transistors and memory cells, current paths of which are connected in series, a first extension portion which is provided between one-side terminal end portions of two active areas neighboring in a second direction that crosses the first direction, and a second extension portion which is provided between other-side terminal end portions of the two active areas neighboring in the second direction, the first and second extension portions connecting the two active areas in a loop configuration.

    摘要翻译: 半导体存储器件包括多个有源区,每个有源区各自沿第一方向延伸,并且包括存储单元串,该存储单元串包括选择晶体管和存储单元,其电流通路串联连接,第一延伸部分设置在一侧 在与第一方向相反的第二方向上相邻的两个有效区域的末端部分和设置在与第二方向相邻的两个有效区域的另一侧终端部分之间的第二延伸部分,第一和第二延伸部分 以循环配置连接两个活动区域。

    SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
    18.
    发明申请
    SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME 审中-公开
    半导体存储器件及其制造方法

    公开(公告)号:US20080149913A1

    公开(公告)日:2008-06-26

    申请号:US11962862

    申请日:2007-12-21

    摘要: A semiconductor memory device is disclosed, which includes a first memory cell array formed on a semiconductor substrate and composed of a plurality of memory cells stacked in layers each having a characteristic change element and a vertical type memory cell transistor connected in parallel to each other, a plurality of second memory cell arrays formed on the semiconductor substrate and having the same structure as the first memory cell array, and arranged in an X direction with respect to the first memory cell array, and a plurality of third memory cell arrays formed on the semiconductor substrate and having the same structure as the first memory cell array, and arranged in a Y direction with respect to the first memory cell array, wherein a gate voltage is applied to gates of the vertical type memory cell transistors of the first to third memory cell arrays in a same layer.

    摘要翻译: 公开了一种半导体存储器件,其包括形成在半导体衬底上的第一存储器单元阵列,并且由堆叠成各自具有彼此并联连接的特征变化元件和垂直型存储单元晶体管的多个存储单元组成, 多个第二存储单元阵列,形成在所述半导体衬底上并具有与所述第一存储单元阵列相同的结构,并且相对于所述第一存储单元阵列沿X方向布置;以及多个第三存储单元阵列, 半导体衬底并且具有与第一存储单元阵列相同的结构,并且相对于第一存储单元阵列在Y方向上布置,其中栅极电压被施加到第一至第三存储器的垂直型存储单元晶体管的栅极 单元阵列在同一层。

    Resist Pattern Forming Method
    19.
    发明申请
    Resist Pattern Forming Method 失效
    抗蚀图案形成方法

    公开(公告)号:US20080118871A1

    公开(公告)日:2008-05-22

    申请号:US11795988

    申请日:2006-01-27

    IPC分类号: G03F7/26

    CPC分类号: G03F7/40 H01L21/0273

    摘要: A fine and high-accuracy resist pattern, which is excellent in etching resistance, can be formed. Disclosed is a resist pattern forming method, which includes the steps of developing a resist composition having photosensitivity to a predetermined light source through a lithography technique to form a resist pattern 2 on a substrate 1, and bringing the resist pattern 2 into contact with a supercritical processing solution 5′ including a supercritical fluid 3′ which contains a crosslinking agent 4.

    摘要翻译: 可以形成耐蚀刻性优异的精细且高精度的抗蚀剂图案。 公开了一种抗蚀剂图案形成方法,其包括通过光刻技术显影对预定光源具有光敏性的抗蚀剂组合物以在基板1上形成抗蚀剂图案2并使抗蚀剂图案2与超临界接触的步骤 处理溶液5',其包含含有交联剂4的超临界流体3'。