Face seals for respirators and method of manufacturing respirators
    14.
    发明授权
    Face seals for respirators and method of manufacturing respirators 有权
    呼吸器面罩和制造呼吸器的方法

    公开(公告)号:US08955516B2

    公开(公告)日:2015-02-17

    申请号:US12420385

    申请日:2009-04-08

    IPC分类号: A62B18/02 A62B18/08

    CPC分类号: A62B18/08 Y10T29/49826

    摘要: A respirator includes a mask having a body extending between a front edge and a rear edge, and a face seal extending inward from the body. The face seal has a first wall extending from the body and a second wall intersecting with the first wall at a sealing land. The sealing land is configured to contact a user's face to form a continuous circumferential seal. The face seal is folded over such that the first wall and the second wall both extend away from the sealing land in a common direction. Optionally, the face seal may be U-shaped.

    摘要翻译: 呼吸器包括具有在前边缘和后边缘之间延伸的主体的面罩和从身体向内延伸的面部密封件。 面密封件具有从主体延伸的第一壁和在密封区域与第一壁相交的第二壁。 密封面构造成与使用者的面接触以形成连续的圆周密封。 面密封被折叠,使得第一壁和第二壁在共同的方向上远离密封区域延伸。 可选地,面密封件可以是U形的。

    Lateral growth method for defect reduction of semipolar nitride films
    15.
    发明申请
    Lateral growth method for defect reduction of semipolar nitride films 有权
    用于半极性氮化物膜缺陷还原的横向生长方法

    公开(公告)号:US20070015345A1

    公开(公告)日:2007-01-18

    申请号:US11486224

    申请日:2006-07-13

    IPC分类号: H01L21/20

    摘要: A lateral growth method for defect reduction of semipolar nitride films. The process steps include selecting a semipolar nitride plane and composition, selecting a suitable substrate for growth of the semipolar nitride plane and composition, and applying a selective growth process in which the semipolar nitride nucleates on some areas of the substrate at the exclusion of other areas of the substrate, wherein the selective growth process includes lateral growth of nitride material by a lateral epitaxial overgrowth (LEO), sidewall lateral epitaxial overgrowth (SLEO), cantilever epitaxy or nanomasking.

    摘要翻译: 一种用于半极性氮化物薄膜缺陷还原的横向生长方法。 工艺步骤包括选择半极性氮化物平面和组成,选择用于生长半极性氮化物平面和组成的合适衬底,以及施加选择性生长工艺,其中半极性氮化物在其它区域的排除下在衬底的某些区域成核 其中选择性生长工艺包括通过横向外延过度生长(LEO),侧壁横向外延过度生长(SLEO),悬臂外延或纳米掩模的氮化物材料的侧向生长。

    Etching technique for the fabrication of thin (AI, In, Ga)N layers
    17.
    发明申请
    Etching technique for the fabrication of thin (AI, In, Ga)N layers 有权
    用于制造薄(Al,In,Ga)N层的蚀刻技术

    公开(公告)号:US20060246722A1

    公开(公告)日:2006-11-02

    申请号:US11403288

    申请日:2006-04-13

    IPC分类号: C23F1/00 B44C1/22 H01L21/302

    摘要: An etching technique for the fabrication of thin (Al, In, Ga)N layers. A suitable template or substrate is selected and implanted with foreign ions over a desired area to create ion implanted material. A regrowth of a device structure is then performed on the implanted template or substrate. The top growth surface of the template is bonded to a carrier wafer to created a bonded template/carrier wafer structure. The substrate is removed, as is any residual material, to expose the ion implanted material. The ion implanted material on the bonded template/carrier wafer structure is then exposed to a suitable etchant for a sufficient time to remove the ion implanted material.

    摘要翻译: 用于制造薄(Al,In,Ga)N层的蚀刻技术。 选择合适的模板或衬底并在期望的区域上注入外来离子以产生离子注入材料。 然后在植入的模板或衬底上执行器件结构的再生长。 模板的顶部生长表面被结合到载体晶片以产生结合的模板/载体晶片结构。 像任何残留的材料一样去除衬底以暴露离子注入的材料。 然后将接合的模板/载体晶片结构上的离子注入材料暴露于合适的蚀刻剂足够的时间以除去离子注入的材料。