公开(公告)号：US06757621B2

公开(公告)日：2004-06-29

申请号：US10342871

申请日：2003-01-16

申请人： Fumio Mizuno ,  Seiji Isogai ,  Kenji Watanabe ,  Yasuhiro Yoshitake ,  Terushige Asakawa ,  Yuichi Ohyama ,  Hidekuni Sugimoto ,  Seiji Ishikawa ,  Masataka Shiba ,  Jun Nakazato ,  Makoto Ariga ,  Tetsuji Yokouchi ,  Toshimitsu Hamada ,  Ikuo Suzuki ,  Masami Ikota ,  Mari Nozoe ,  Isao Miyazaki ,  Yoshiharu Shigyo

发明人： Fumio Mizuno ,  Seiji Isogai ,  Kenji Watanabe ,  Yasuhiro Yoshitake ,  Terushige Asakawa ,  Yuichi Ohyama ,  Hidekuni Sugimoto ,  Seiji Ishikawa ,  Masataka Shiba ,  Jun Nakazato ,  Makoto Ariga ,  Tetsuji Yokouchi ,  Toshimitsu Hamada ,  Ikuo Suzuki ,  Masami Ikota ,  Mari Nozoe ,  Isao Miyazaki ,  Yoshiharu Shigyo

IPC分类号： H01L2166

CPC分类号： H01L22/20 ,  G01N21/9501 ,  G01R31/2894 ,  G01R33/06 ,  H01L2223/54466 ,  H01L2924/0002 ,  H01L2924/00

摘要： A process management system in accordance with the present invention includes inspection apparatuses for inspecting defects on a wafer, the inspection apparatuses being connected through a communication network, inspection information and image information obtained from these inspection apparatuses being collected to construct a data base and an image file, therein definition of defects is given by combinations of elements which characterize the defect based on the inspection information and the image information obtained from the inspection apparatuses. By giving definition of the defect, characteristics of the defect can be subdivided and known. Therefore, the cause of a defect can be studied.

摘要翻译： 根据本发明的处理管理系统包括用于检查晶片上的缺陷的检查装置，通过通信网络连接的检查装置，从这些检查装置获得的检查信息和图像信息被收集以构建数据库和图像 文件，其中缺陷的定义通过基于检查信息和从检查装置获得的图像信息来表征缺陷的元件的组合来给出。 通过给出缺陷的定义，可以细分和知道缺陷的特征。 因此，可以研究缺陷的原因。

公开(公告)号：US06542830B1

公开(公告)日：2003-04-01

申请号：US09142546

申请日：1998-09-10

申请人： Fumio Mizuno ,  Seiji Isogai ,  Kenji Watanabe ,  Yasuhiro Yoshitake ,  Terushige Asakawa ,  Yuichi Ohyama ,  Hidekuni Sugimoto ,  Seiji Ishikawa ,  Masataka Shiba ,  Jun Nakazato ,  Makoto Ariga ,  Tetsuji Yokouchi ,  Toshimitsu Hamada ,  Ikuo Suzuki ,  Masami Ikota ,  Mari Nozoe ,  Isao Miyazaki ,  Yoshiharu Shigyo

发明人： Fumio Mizuno ,  Seiji Isogai ,  Kenji Watanabe ,  Yasuhiro Yoshitake ,  Terushige Asakawa ,  Yuichi Ohyama ,  Hidekuni Sugimoto ,  Seiji Ishikawa ,  Masataka Shiba ,  Jun Nakazato ,  Makoto Ariga ,  Tetsuji Yokouchi ,  Toshimitsu Hamada ,  Ikuo Suzuki ,  Masami Ikota ,  Mari Nozoe ,  Isao Miyazaki ,  Yoshiharu Shigyo

IPC分类号： H01L2166

CPC分类号： H01L22/20 ,  G01N21/9501 ,  G01R31/2894 ,  G01R33/06 ,  H01L2223/54466 ,  H01L2924/0002 ,  H01L2924/00

摘要： A process management system in accordance with the present invention includes inspection apparatuses for inspecting defects on a wafer, the inspection apparatuses being connected through a communication network, inspection information and image information obtained from these inspection apparatuses being collected to construct a data base and an image file, therein definition of defects is given by combinations of elements which characterize the defect based on the inspection information and the image information obtained from the inspection apparatuses. By giving definition of the defect, characteristics of the defect can be subdivided and known. Therefore, the cause of a defect can be studied.

摘要翻译： 根据本发明的处理管理系统包括用于检查晶片上的缺陷的检查装置，通过通信网络连接的检查装置，从这些检查装置获得的检查信息和图像信息被收集以构建数据库和图像 文件，其中缺陷的定义通过基于检查信息和从检查装置获得的图像信息来表征缺陷的元件的组合来给出。 通过给出缺陷的定义，可以细分和知道缺陷的特征。 因此，可以研究缺陷的原因。

公开(公告)号：US09035223B2

公开(公告)日：2015-05-19

申请号：US12918271

申请日：2009-02-19

申请人： Shintaro Noguchi ,  Kuniaki Sakakibara ,  Yoshiaki Ishio ,  Hiroshi Tominaga ,  Kenji Watanabe

发明人： Shintaro Noguchi ,  Kuniaki Sakakibara ,  Yoshiaki Ishio ,  Hiroshi Tominaga ,  Kenji Watanabe

IPC分类号： H05B6/04 ,  H05B6/12 ,  H05B6/06

CPC分类号： H05B6/1209 ,  H05B6/062 ,  H05B2213/04 ,  H05B2213/07

摘要： An induction heat cooking device is provided that finishes preheating in a short time and maintains the temperature obtained at the finish of the preheating. The induction heat cooking device includes a heating coil for heating a cooking container by induction, an inverter circuit for providing a high frequency current to the heating coil, an operation unit including an operation mode setting unit for setting an operation mode of the inverter circuit, an infrared sensor for detecting an infrared light that is emitted from a bottom surface of the cooking container, a control unit for controlling an output of the inverter circuit based on an output of the infrared sensor and a setting inputted to the operation unit, and a notification unit.

摘要翻译： 提供一种在短时间内完成预热并保持在预热结束时获得的温度的感应加热烹饪装置。 感应加热烹调装置包括用于通过感应加热烹饪容器的加热线圈，用于向加热线圈提供高频电流的逆变器电路，包括用于设置逆变器电路的操作模式的操作模式设置单元的操作单元， 用于检测从烹饪容器的底面发射的红外光的红外传感器，用于基于红外线传感器的输出和输入到操作单元的设定来控制逆变器电路的输出的控制单元，以及 通知单位。

公开(公告)号：US08796599B2

公开(公告)日：2014-08-05

申请号：US12918268

申请日：2009-02-19

申请人： Kuniaki Sakakibara ,  Shintaro Noguchi ,  Yoshiaki Ishio ,  Hiroshi Tominaga ,  Kenji Watanabe

发明人： Kuniaki Sakakibara ,  Shintaro Noguchi ,  Yoshiaki Ishio ,  Hiroshi Tominaga ,  Kenji Watanabe

IPC分类号： H05B6/12

CPC分类号： H05B6/1209 ,  H05B6/062 ,  H05B2213/04 ,  H05B2213/07

摘要： An induction heat cooking device is provided that finishes preheating in a short time and maintains the temperature obtained at the finish of the preheating. When a preheating heating mode is selected as an operation mode, a control unit (8) arranged in the induction heat cooking device starts operation in a preheating mode in which a cooking container is heated with a first heating output. When an increment of an output value of an infrared sensor exceeds a first predetermined increment since the heating starts with the first heating output, the control unit causes a notification unit to notify a user that the preheating is finished, and the operation mode is changed to a waiting mode for performing heating with a second heating output that is lower than the first heating output. Further, when the user sets a heating power by means of a heating power setting unit in the preheating mode, the control unit prohibits changing to the heating power set by the user. When the user sets a heating power by means of a heating power setting unit in the waiting mode, the control unit permits changing to the heating power set by the user, and the operation mode is changed to a heating mode for performing heating with a third heating output corresponding to the heating power set by the user.

摘要翻译： 提供一种在短时间内完成预热并保持在预热结束时获得的温度的感应加热烹饪装置。 当选择预热加热模式作为操作模式时，设置在感应加热烹饪装置中的控制单元（8）在以第一加热输出加热烹饪容器的预热模式下开始操作。 当从第一加热输出开始加热红外线传感器的输出值的增量超过第一预定增量时，控制单元使通知单元通知用户预热结束，并且将操作模式改变为 用于以比第一加热输出低的第二加热输出进行加热的等待模式。 此外，当用户在预热模式下通过加热功率设定单元设定加热功率时，控制单元禁止改变为由用户设定的加热功率。 当用户在等待模式下通过加热功率设定单元设置加热功率时，控制单元允许改变为用户设定的加热功率，并且将操作模式改变为用第三个加热模式进行加热的加热模式 加热输出对应于用户设定的加热功率。

公开(公告)号：US08624182B2

公开(公告)日：2014-01-07

申请号：US13195927

申请日：2011-08-02

申请人： Kenji Watanabe ,  Masahiro Hatakeyama ,  Yoshihiko Naito ,  Tatsuya Kohama ,  Kenji Terao ,  Takeshi Murakami ,  Takehide Hayashi ,  Kiwamu Tsukamoto ,  Hiroshi Sobukawa ,  Norio Kimura

发明人： Kenji Watanabe ,  Masahiro Hatakeyama ,  Yoshihiko Naito ,  Tatsuya Kohama ,  Kenji Terao ,  Takeshi Murakami ,  Takehide Hayashi ,  Kiwamu Tsukamoto ,  Hiroshi Sobukawa ,  Norio Kimura

IPC分类号： H01J37/244 ,  H01J37/285 ,  H01J37/29

CPC分类号： H01J37/22 ,  H01J37/265 ,  H01J37/29 ,  H01J2237/004 ,  H01J2237/022 ,  H01J2237/24495 ,  H01J2237/24564 ,  H01J2237/2817

摘要： An electro-optical inspection apparatus prevents adhesion of dust or particles to a sample surface, wherein a stage on which a sample is placed is disposed inside a vacuum chamber that can be evacuated, and a dust collecting electrode is disposed to surround a periphery of the sample. The dust collecting electrode is applied with a voltage having the same polarity as a voltage applied to the sample and an absolute value that is the same or larger than an absolute value of the voltage. Because dust or particles adhere to the dust collecting electrode, adhesion of the dust or particles to the sample surface can be reduced. Instead of using the dust collecting electrode, it is possible to form a recess on a wall of the vacuum chamber, or to dispose on the wall a metal plate having a mesh structure to which a predetermined voltage is applied.

摘要翻译： 电光检查装置防止灰尘或颗粒附着到样品表面，其中放置样品的阶段设置在可以抽真空的真空室内，并且集尘电极被设置成围绕 样品。 集尘电极施加与施加到样品的电压极性相同的电压，绝对值等于或大于电压的绝对值。 由于灰尘或颗粒附着在集尘电极上，所以可以减少灰尘或颗粒附着到样品表面。 代替使用集尘电极，可以在真空室的壁上形成凹部，或者在壁上设置具有施加了预定电压的网状结构的金属板。

公开(公告)号：US20130232015A1

公开(公告)日：2013-09-05

申请号：US13885111

申请日：2011-10-03

申请人： Kenji Watanabe ,  Akira Tojima

发明人： Kenji Watanabe ,  Akira Tojima

IPC分类号： G06Q30/02

CPC分类号： G06Q30/0277 ,  G06Q30/0251

摘要： A terminal communicating with a server includes an output unit for outputting information received through a communication line, an information accepting unit for accepting information related to the terminal, and an advertisement request unit for transmitting an advertisement request including the information related to the terminal to the server. The server includes an advertisement storage unit for storing beforehand advertisement information and information corresponding to each advertisement information that is related to a terminal as a distribution target of the advertisement information. The information related to the terminal indicates market information that designates a sales channel of the terminal. The server reads out the advertisement information corresponding to the information related to the terminal in the received advertisement request from the advertisement storage unit and transmits the read advertisement information to the terminal.

摘要翻译： 与服务器通信的终端包括用于输出通过通信线路接收的信息的输出单元，用于接受与终端相关的信息的信息接收单元，以及广告请求单元，用于将包括与终端有关的信息的广告请求发送到 服务器。 服务器包括广告存储单元，用于预先存储广告信息和与终端相关的每个广告信息对应的信息作为广告信息的分发目标。 与终端相关的信息表示指定终端的销售信道的市场信息。 服务器从广告存储单元中读出与接收到的广告请求中的与终端相关的信息相对应的广告信息，并向终端发送读取的广告信息。

公开(公告)号：US08497476B2

公开(公告)日：2013-07-30

申请号：US13420731

申请日：2012-03-15

申请人： Masahiro Hatakeyama ,  Shoji Yoshikawa ,  Takeshi Murakami ,  Kenji Watanabe ,  Yoshihiko Naito ,  Yasushi Toma ,  Tsutomu Karimata ,  Takehide Hayashi ,  Kiwamu Tsukamoto ,  Tatsuya Kohama ,  Noboru Kobayashi

发明人： Masahiro Hatakeyama ,  Shoji Yoshikawa ,  Takeshi Murakami ,  Kenji Watanabe ,  Yoshihiko Naito ,  Yasushi Toma ,  Tsutomu Karimata ,  Takehide Hayashi ,  Kiwamu Tsukamoto ,  Tatsuya Kohama ,  Noboru Kobayashi

IPC分类号： G01N23/225

CPC分类号： H01J37/073 ,  G01N23/22 ,  G01N23/223 ,  G01N23/2251 ,  G01N2223/611 ,  H01J1/34 ,  H01J37/09 ,  H01J37/10 ,  H01J37/20 ,  H01J37/222 ,  H01J37/244 ,  H01J37/265 ,  H01J37/28 ,  H01J37/29 ,  H01J2237/0048 ,  H01J2237/022 ,  H01J2237/032 ,  H01J2237/038 ,  H01J2237/045 ,  H01J2237/0458 ,  H01J2237/0473 ,  H01J2237/0492 ,  H01J2237/061 ,  H01J2237/06333 ,  H01J2237/166 ,  H01J2237/186 ,  H01J2237/2002 ,  H01J2237/2007 ,  H01J2237/2008 ,  H01J2237/2448 ,  H01J2237/2482 ,  H01J2237/2485 ,  H01J2237/2817 ,  H01J2237/2855 ,  H01J2237/2857

摘要： An inspection device for inspecting a surface of an inspection object using a beam includes a beam generator capable of generating one of either charge particles or an electromagnetic wave as a beam, a primary optical system capable of guiding and irradiating the beam to the inspection object supported within a working chamber, a secondary optical system capable of including a first movable numerical aperture and a first detector which detects secondary charge particles generated from the inspection object, the secondary charge particles passing through the first movable numerical aperture, an image processing system capable of forming an image based on the secondary charge particles detected by the first detector; and a second detector arranged between the first movable numerical aperture and the first detector and which detects a location and shape at a cross over location of the secondary charge particles generated from the inspection object.

摘要翻译： 用于使用光束检查检查对象的表面的检查装置包括能够产生电荷粒子或电磁波之一作为光束的光束发生器，能够将所述光束引导并照射到被检查对象的主光学系统 在工作室内，能够包括第一可移动数值孔径的二次光学系统和检测从检查对象产生的二次电荷粒子的第一检测器，通过第一可移动数值孔径的二次电荷粒子，能够 基于由所述第一检测器检测到的次级电荷粒子形成图像; 以及第二检测器，其布置在第一可移动数值孔径和第一检测器之间，并且检测在从检查对象生成的次级充电颗粒的交叉位置处的位置和形状。

公开(公告)号：US20130171698A1

公开(公告)日：2013-07-04

申请号：US13816826

申请日：2011-08-11

申请人： Kenji Watanabe ,  Hisao Moriya

发明人： Kenji Watanabe ,  Hisao Moriya

IPC分类号： C12P19/34

CPC分类号： C12P19/34 ,  C12N15/52 ,  C12N15/80 ,  C12N15/815 ,  C12P17/06 ,  C12P21/02

摘要： The present invention relates to a method of removing an intron contained in a gene from a eukaryotic gene, and linking only the exon sequences to prepare an expression vector comprising the linked sequences. Specifically, the invention relates to a method of preparing an expression vector containing linked exon sequences comprising amplifying exon sequences by PCR as one or more fragments from a giant fungal gene containing an intron, and linking the fragments together with a restriction enzyme-treated vector using the gap repair cloning method; a method of preparing an expression vector containing a full-length cDNA sequence by synthesizing and linking cDNA fragments from a fungal giant gene; a transformant having introduced therein an expression vector prepared by the method; a protein produced by the transformant; and a method of preparing a compound produced by the protein using the expression vector.

摘要翻译： 本发明涉及从真核基因中除去包含在基因中的内含子的方法，并且仅连接外显子序列以制备包含连接序列的表达载体。 具体地，本发明涉及一种制备含有连锁外显子序列的表达载体的方法，其包括通过PCR扩增外显子序列作为来自含有内含子的巨型真菌基因的一个或多个片段，并将所述片段与限制酶处理的载体连接，使用 间隙修复克隆方法; 通过合成和连接来自真菌巨基因的cDNA片段制备含有全长cDNA序列的表达载体的方法; 在其中引入了通过该方法制备的表达载体的转化体; 由转化体产生的蛋白质; 以及使用表达载体制备由蛋白质产生的化合物的方法。

公开(公告)号：US08430393B2

公开(公告)日：2013-04-30

申请号：US12834242

申请日：2010-07-12

申请人： Akira Matsushima ,  Yasuhiro Uchida ,  Shunsuke Okazaki ,  Minoru Kawanishi ,  Kenji Watanabe ,  Motohiro Furusawa

发明人： Akira Matsushima ,  Yasuhiro Uchida ,  Shunsuke Okazaki ,  Minoru Kawanishi ,  Kenji Watanabe ,  Motohiro Furusawa

IPC分类号： B65H5/00

CPC分类号： B41J13/0009 ,  B65H1/266 ,  B65H3/0607 ,  B65H3/0669 ,  B65H3/0684 ,  B65H3/5215 ,  B65H3/5261 ,  B65H7/02 ,  B65H7/18 ,  B65H2403/41 ,  B65H2405/11172 ,  B65H2513/41 ,  B65H2513/512 ,  B65H2513/514 ,  B65H2220/01 ,  B65H2220/02

摘要： When a retard roller is rotating in a sheet feeding direction, the rotation is transmitted to a pickup roller and the pickup roller rotates in a direction for conveying the sheet. When the retard roller is rotating in a direction opposite to the sheet feeding direction or is stationary, the pickup roller does not feed the sheet. Therefore, in a successive feeding operation, the sheet to be fed next is always conveyed such that the leading end thereof reaches a nip position between a feed roller and the retard roller. Therefore, the intervals between the sheets are uniform in the successive feeding operation.

摘要翻译： 当延迟辊在片材进给方向上旋转时，旋转被传递到拾取辊，并且拾取辊沿着输送片材的方向旋转。 当延迟辊在与片材进给方向相反的方向上旋转或者是静止时，拾取辊不进给纸。 因此，在连续进给操作中，接下来要被供给的片材总是被输送，使得其前端到达进给辊和延迟辊之间的辊隙位置。 因此，在连续进给操作中，片材之间的间隔是均匀的。

公开(公告)号：US20120312104A1

公开(公告)日：2012-12-13

申请号：US13593171

申请日：2012-08-23

申请人： Akira HAMAMATSU ,  Minori Noguchi ,  Yoshimasa Ohshima ,  Hidetoshi Nishiyama ,  Kenji Oka ,  Takanori Ninomiya ,  Maki Tanaka ,  Kenji Watanabe ,  Tetsuya Watanabe ,  Yoshio Morishige

发明人： Akira HAMAMATSU ,  Minori Noguchi ,  Yoshimasa Ohshima ,  Hidetoshi Nishiyama ,  Kenji Oka ,  Takanori Ninomiya ,  Maki Tanaka ,  Kenji Watanabe ,  Tetsuya Watanabe ,  Yoshio Morishige

IPC分类号： G01N21/88

CPC分类号： G06T7/001 ,  G01N21/8851 ,  G01N21/9501 ,  G01N2021/8861 ,  G01N2021/8867 ,  G06T7/97 ,  G06T2207/10152 ,  G06T2207/30148

摘要： A method and apparatus of inspecting a sample, in which the sample is inspected under a plurality of inspection conditions, and inspection data obtained by inspecting the sample under each of the plurality of inspection conditions and position information on the sample of the inspection date in correspondence with the respective inspection conditions, are stored. The inspection data for each of the plurality of inspection conditions is against each other by the use of the position information on the sample to determine a position to be inspected in detail, and an image of the sample at a position to be inspected in detail is obtained. The obtained image is classified, the inspection condition of the sample by the use of information of classification of the image is determined.

摘要翻译： 在多个检查条件下对样本进行检查的检查方法和装置以及在多个检查条件下检查样本而获得的检查数据和对应于检查日期样本的位置信息 具有相应的检查条件。 多个检查条件中的每一个的检查数据通过使用关于样本的位置信息彼此相对来确定待检查的位置，并且在待检查位置处的样本的图像是详细的 获得。 对所获得的图像进行分类，确定通过使用图像分类信息的样本的检查条件。