Multi-sample read circuit having test mode of operation
    29.
    发明申请
    Multi-sample read circuit having test mode of operation 有权
    具有测试操作模式的多样本读取电路

    公开(公告)号:US20050102576A1

    公开(公告)日:2005-05-12

    申请号:US10698896

    申请日:2003-10-31

    CPC分类号: G11C29/02 G11C29/026

    摘要: A data storage device includes non-volatile memory; and a read circuit for performing multi-sample read operations on the memory during a normal mode of operation. The read circuit includes a digital counter having an output that indicates a single bit (e.g., a sign-bit). The read circuit allows an external device (e.g., a memory tester) to supply test clock pulses to an input of the digital counter during a test mode. The test clock pulses can be counted to determine a state of the digital counter.

    摘要翻译: 数据存储装置包括非易失性存储器; 以及用于在正常操作模式期间对存储器执行多样本读取操作的读取电路。 读取电路包括具有指示单个位(例如,符号位)的输出的数字计数器。 读取电路允许外部设备(例如,存储器测试器)在测试模式期间将测试时钟脉冲提供给数字计数器的输入。 可以对测试时钟脉冲进行计数,以确定数字计数器的状态。

    Resistive cross point memory
    30.
    发明申请
    Resistive cross point memory 有权
    电阻式交叉点存储器

    公开(公告)号:US20050078536A1

    公开(公告)日:2005-04-14

    申请号:US10675740

    申请日:2003-09-30

    摘要: Embodiments of the present invention provide a resistive cross point memory. The resistive cross point memory comprises an array of memory cells and a read circuit. The read circuit is configured to sense a resistance through a memory cell in the array of memory cells to obtain a sense result and calibrate the read circuit based on the sensed result. The read circuit comprises an up/down counter that provides a calibration value to the read circuit.

    摘要翻译: 本发明的实施例提供一种电阻式交叉点存储器。 电阻交叉点存储器包括存储器单元阵列和读取电路。 读取电路被配置为感测通过存储器单元阵列中的存储器单元的电阻以获得感测结果,并且基于感测结果来校准读取电路。 读取电路包括向读取电路提供校准值的向上/向下计数器。