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公开(公告)号:US11824018B2
公开(公告)日:2023-11-21
申请号:US18089227
申请日:2022-12-27
Applicant: Intel Corporation
Inventor: Debendra Mallik , Ravindranath Mahajan , Robert Sankman , Shawna Liff , Srinivas Pietambaram , Bharat Penmecha
IPC: H01L23/00 , H01L21/48 , H01L21/56 , H01L23/31 , H01L23/538
CPC classification number: H01L23/562 , H01L21/486 , H01L21/4853 , H01L21/4857 , H01L21/565 , H01L21/568 , H01L23/3128 , H01L23/5381 , H01L23/5384 , H01L23/5385 , H01L23/5386 , H01L24/16 , H01L2224/16227 , H01L2924/3511
Abstract: Embodiments disclosed herein include electronic packages and methods of fabricating electronic packages. In an embodiment, an electronic package comprises an interposer, where a cavity passes through the interposer, and a nested component in the cavity. In an embodiment, the electronic package further comprises a die coupled to the interposer by a first interconnect and coupled to the nested component by a second interconnect. In an embodiment, the first and second interconnects comprise a first bump, a bump pad over the first bump, and a second bump over the bump pad.
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公开(公告)号:US11652057B2
公开(公告)日:2023-05-16
申请号:US16405610
申请日:2019-05-07
Applicant: Intel Corporation
Inventor: Khang Choong Yong , Eng Huat Goh , Min Suet Lim , Robert Sankman , Telesphor Kamgaing , Wil Choon Song , Boon Ping Koh
IPC: H01L23/538 , H01L23/31 , H01L23/48 , H01L25/065
CPC classification number: H01L23/5381 , H01L23/3178 , H01L23/3185 , H01L23/481 , H01L25/0655
Abstract: Embodiments disclose electronic packages with a die assembly and methods of forming such electronic packages. In an embodiment, a die assembly comprises a first die and a second die laterally adjacent to the first die. In an embodiment, the first die and the second die each comprise a first semiconductor layer, an insulator layer over the first semiconductor layer, and a second semiconductor layer over the insulator layer. In an embodiment, a cavity is disposed through the second semiconductor layer. In an embodiment, the die assembly further comprises a bridge substrate that electrically couples the first die to the second die, where the bridge is positioned in the cavity of the first die and the cavity of the second die.
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公开(公告)号:US11557541B2
公开(公告)日:2023-01-17
申请号:US16235879
申请日:2018-12-28
Applicant: Intel Corporation
Inventor: Md Altaf Hossain , Ankireddy Nalamalpu , Dheeraj Subbareddy , Robert Sankman , Ravindranath V. Mahajan , Debendra Mallik , Ram S. Viswanath , Sandeep B. Sane , Sriram Srinivasan , Rajat Agarwal , Aravind Dasu , Scott Weber , Ravi Gutala
IPC: H01L23/538 , H01L25/18 , H01L23/00 , H01L23/48
Abstract: Embodiments disclosed herein include electronic packages. In an embodiment, the electronic package comprises, a package substrate, an interposer on the package substrate, a first die cube and a second die cube on the interposer, wherein the interposer includes conductive traces for electrically coupling the first die cube to the second die cube, a die on the package substrate, and an embedded multi-die interconnect bridge (EMIB) in the package substrate, wherein the EMIB electrically couples the interposer to the die.
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公开(公告)号:US11515232B2
公开(公告)日:2022-11-29
申请号:US16379619
申请日:2019-04-09
Applicant: Intel Corporation
Inventor: Chia-Pin Chiu , Robert Sankman , Pooya Tadayon
IPC: H01L23/473 , H05K7/20 , H01L23/373 , H01L23/367 , H01L23/00
Abstract: Embodiments include semiconductor packages and cooling semiconductor packaging systems. A semiconductor package includes a second die on a package substrate, first dies on the second die, conductive bumps between the first dies and the second die, a cold plate and a manifold over the first dies, second die, and package substrate, and first openings in the manifold. The first openings are fluidly coupled through the conductive bumps. The semiconductor package may include a first fluid path through the first openings of the manifold, where a first fluid flows through the first fluid path. The semiconductor package may further include a second fluid path through second openings of the cold plate, where a second fluid flows through the second fluid path, and where the first and second fluids of the first and second fluid paths cool heat providing surfaces of the first dies, the second die, or the package substrate.
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公开(公告)号:US20210328589A1
公开(公告)日:2021-10-21
申请号:US17359466
申请日:2021-06-25
Applicant: Intel Corporation
Inventor: Dheeraj Subbareddy , MD Altaf Hossain , Ankireddy Nalamalpu , Robert Sankman , Ravindranath Mahajan , Gregg William Baeckler
IPC: H03K19/1776 , H01L25/18 , H01L23/367
Abstract: A programmable device may have logic circuitry formed in a top die and memory and specialized processing blocks formed in a bottom die, where the top die is stacked directly on top of the bottom die in a face-to-face configuration. The logic circuitry may include logic sectors, logic array blocks, logic elements, and other types of logic regions. The memory blocks may include large banks of multiport memory for storing data. The specialized processing blocks may include multipliers, adders, and other arithmetic components. The logic circuitry may access the memory and specialized processing blocks via an address encoded scheme. Configured in this way, the maximum operating frequency of the programmable device can be optimized such that critical paths will no longer need to traverse any unused memory and specialized processing blocks.
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公开(公告)号:US11070209B2
公开(公告)日:2021-07-20
申请号:US16788760
申请日:2020-02-12
Applicant: Intel Corporation
Inventor: Dheeraj Subbareddy , Md Altaf Hossain , Ankireddy Nalamalpu , Robert Sankman , Ravindranath Mahajan , Gregg William Baeckler
IPC: H03K19/1776 , H01L25/18 , H01L23/367
Abstract: A programmable device may have logic circuitry formed in a top die and memory and specialized processing blocks formed in a bottom die, where the top die is stacked directly on top of the bottom die in a face-to-face configuration. The logic circuitry may include logic sectors, logic array blocks, logic elements, and other types of logic regions. The memory blocks may include large banks of multiport memory for storing data. The specialized processing blocks may include multipliers, adders, and other arithmetic components. The logic circuitry may access the memory and specialized processing blocks via an address encoded scheme. Configured in this way, the maximum operating frequency of the programmable device can be optimized such that critical paths will no longer need to traverse any unused memory and specialized processing blocks.
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公开(公告)号:US20200083890A1
公开(公告)日:2020-03-12
申请号:US16123765
申请日:2018-09-06
Applicant: Intel Corporation
Inventor: Dheeraj Subbareddy , MD Altaf Hossain , Ankireddy Nalamalpu , Robert Sankman , Ravindranath Mahajan , Gregg William Baeckler
IPC: H03K19/177 , H01L25/18 , H01L23/367
Abstract: A programmable device may have logic circuitry formed in a top die and memory and specialized processing blocks formed in a bottom die, where the top die is stacked directly on top of the bottom die in a face-to-face configuration. The logic circuitry may include logic sectors, logic array blocks, logic elements, and other types of logic regions. The memory blocks may include large banks of multiport memory for storing data. The specialized processing blocks may include multipliers, adders, and other arithmetic components. The logic circuitry may access the memory and specialized processing blocks via an address encoded scheme. Configured in this way, the maximum operating frequency of the programmable device can be optimized such that critical paths will no longer need to traverse any unused memory and specialized processing blocks.
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公开(公告)号:US11978727B2
公开(公告)日:2024-05-07
申请号:US16641922
申请日:2017-09-28
Applicant: Intel Corporation
Inventor: Wilfred Gomes , Sanka Ganesan , Doug Ingerly , Robert Sankman , Mark Bohr , Debendra Mallik
IPC: H01L25/10 , H01L25/00 , H01L25/065
CPC classification number: H01L25/105 , H01L25/0657 , H01L25/50 , H01L2225/06513 , H01L2225/06524 , H01L2225/06586 , H01L2225/1035 , H01L2225/1041 , H01L2225/1052 , H01L2225/1058
Abstract: Systems and methods for providing a low profile stacked die semiconductor package in which a first semiconductor package is stacked with a second semiconductor package and both semiconductor packages are conductively coupled to an active silicon substrate that communicably couples the first semiconductor package to the second semiconductor package. The first semiconductor package may conductively couple to the active silicon substrate using a plurality of interconnects disposed in a first interconnect pattern having a first interconnect pitch. The second semiconductor package may conductively couple to the active silicon substrate using a plurality of interconnects disposed in a second interconnect pattern having a second pitch that is greater than the first pitch. The second semiconductor package may be stacked on the first semiconductor package and conductively coupled to the active silicon substrate using a plurality of conductive members or a plurality of wirebonds.
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公开(公告)号:US20230198526A1
公开(公告)日:2023-06-22
申请号:US18169988
申请日:2023-02-16
Applicant: Intel Corporation
Inventor: Dheeraj Subbareddy , MD Altaf Hossain , Ankireddy Nalamalpu , Robert Sankman , Ravindranath Mahajan , Gregg William Baeckler
IPC: H03K19/1776 , H01L25/18 , H01L23/367
CPC classification number: H03K19/1776 , H01L25/18 , H01L23/367 , H01L2225/06513 , H01L2225/06565 , H01L2225/06589
Abstract: A programmable device may have logic circuitry formed in a top die and memory and specialized processing blocks formed in a bottom die, where the top die is stacked directly on top of the bottom die in a face-to-face configuration. The logic circuitry may include logic sectors, logic array blocks, logic elements, and other types of logic regions. The memory blocks may include large banks of multiport memory for storing data. The specialized processing blocks may include multipliers, adders, and other arithmetic components. The logic circuitry may access the memory and specialized processing blocks via an address encoded scheme. Configured in this way, the maximum operating frequency of the programmable device can be optimized such that critical paths will no longer need to traverse any unused memory and specialized processing blocks.
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公开(公告)号:US11658122B2
公开(公告)日:2023-05-23
申请号:US16356442
申请日:2019-03-18
Applicant: Intel Corporation
Inventor: Robert Sankman , Robert May
IPC: H01L23/538 , H01L25/00 , H01L25/065 , H01L21/48
CPC classification number: H01L23/5381 , H01L21/4857 , H01L23/5383 , H01L23/5385 , H01L23/5386 , H01L25/0655 , H01L25/50
Abstract: Embodiments disclosed herein include electronic packages for PoINT architectures. Particularly, embodiments include electronic packages that include reinforcement substrates to minimize warpage. In an embodiment, an electronic package comprises, a reinforcement substrate, a plurality of through substrate vias through the reinforcement substrate, a dielectric substrate over the reinforcement substrate, a cavity into the dielectric substrate, and a component in the cavity.
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