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    Electro-optical radiation collector for arc flash detection
    31.
    发明授权
    Electro-optical radiation collector for arc flash detection 有权
    用于电弧闪光检测的电光辐射收集器

    公开(公告)号：US09515475B2

    公开(公告)日：2016-12-06

    申请号：US14456757

    申请日：2014-08-11

    Applicant: Schweitzer Engineering Laboratories, Inc.

    Inventor： James R. Kesler ,  Douglas M. Trout ,  Gary W. Scheer

    IPC: H02H1/00 ,  H01J3/14

    CPC classification number: H02H1/0023 ,  H01J3/14

    Abstract: An electro-optical (EO) radiation collector for collecting and/or transmitting EO radiation (which may include EO radiation in the visible wavelengths) for transmission to an EO sensor. The EO radiation collector may be used with an arc flash detection device or other protective system, such as an intelligent electronic device (IED). The arc flash detection device may detect an arc flash event based upon EO radiation collected by and/or transmitted from the EO radiation collector. The EO radiation collector may receive an EO conductor cable, an end of which may be configured to receive EO radiation. A portion of the EO radiation received by the EO radiation collector may be transmitted into the EO conductor cable and transmitted to the arc flash detection device. The EO radiation collector may be adapted to receive a second EO conductor cable, which may be used to provide redundant EO transmission and/or self-test capabilities.

    Abstract translation: 用于收集和/或传输EO辐射（其可以包括可见波长中的EO辐射）的电光（EO）辐射收集器，用于传输到EO传感器。 EO辐射收集器可以与电弧闪光检测装置或诸如智能电子装置（IED）的其它保护系统一起使用。 电弧闪光检测装置可以基于由EO辐射收集器收集的和/或从其发射的EO辐射来检测电弧闪光事件。 EO辐射收集器可以接收EO导体电缆，其端部可被配置为接收EO辐射。 由EO辐射收集器接收的EO辐射的一部分可以传输到EO导体电缆中并传输到电弧闪光检测装置。 EO辐射收集器可以适于接收可用于提供冗余EO传输和/或自检能力的第二EO导体电缆。

    DEVICES HAVING AN ELECTRON EMITTING STRUCTURE
    34.
    发明申请
    DEVICES HAVING AN ELECTRON EMITTING STRUCTURE 审中-公开
    具有电子发射结构的装置

    公开(公告)号：US20150092923A1

    公开(公告)日：2015-04-02

    申请号：US14385503

    申请日：2013-03-14

    Applicant: NANOX IMAGING PLC

    Inventor： Koichi Iida ,  Hidenori Kenmotsu ,  Jun Yamazaki ,  Hitoshi Masuya

    IPC: H01J3/14 ,  G01T1/161 ,  H01J35/14 ,  H01J3/02

    CPC classification number: H01J3/14 ,  G01N23/046 ,  G01N2223/204 ,  G01N2223/419 ,  G01T1/161 ,  H01J1/3042 ,  H01J3/021 ,  H01J3/027 ,  H01J29/467 ,  H01J31/127 ,  H01J35/065 ,  H01J35/14 ,  H01J2235/068

    Abstract: The disclosure relates to an image capture device comprising an electron receiving construct and an electron emitting construct, and further comprising an inner gap providing an unobstructed space between the electron emitting construct and the electron receiving construct. The disclosure further relates to an x-ray emitting device comprising an x-ray emitting construct and an electron emitting construct, said x-ray emitting construct comprising an anode, the anode being an x-ray target, wherein the x-ray emitting device may comprise an inner gap providing an unobstructed space between the electron emitting construct and the x-ray emitting construct. The disclosure further relates to an x-ray imaging system comprising an image capture device and an x-ray emitting device.

    Abstract translation: 本公开涉及包括电子接收构造体和电子发射构造物的图像捕获装置，并且还包括在电子发射构造体和电子接收构造体之间提供无障碍空间的内部间隙。 本发明还涉及一种包括x射线发射结构和电子发射结构的x射线发射器件，所述x射线发射结构包括阳极，阳极是x射线靶，其中x射线发射器件 可以包括提供电子发射构造体和x射线发射结构之间的无障碍空间的内部间隙。 本公开还涉及包括图像捕获装置和x射线发射装置的X射线成像系统。

    Ion beam system and method of operating ion beam system
    35.
    发明授权
    Ion beam system and method of operating ion beam system 有权
    离子束系统和操作离子束系统的方法

    公开(公告)号：US08710451B2

    公开(公告)日：2014-04-29

    申请号：US13251174

    申请日：2011-09-30

    Applicant: Josef Biberger ,  Ralph Pulwey ,  Andreas Adolf

    Inventor： Josef Biberger ,  Ralph Pulwey ,  Andreas Adolf

    IPC: H01J37/317

    CPC classification number: H01J3/26 ,  H01J3/14 ,  H01J37/1477 ,  H01J37/28 ,  H01J37/317 ,  H01J2237/303 ,  H01J2237/31749

    Abstract: An ion beam system comprises a voltage supply system 7 and at least one beam deflector 39 having a plurality of first defection electrodes 51a, 51b, 51c and a plurality of second deflection electrodes 52a, 52b, 52c wherein the voltage supply system is configured to supply different adjustable deflection voltages to the plurality of second deflection electrodes such that electric deflection fields between the plurality of second deflection electrodes and the plurality of opposite first deflection electrodes have a common orientation. The ion beam system has a high kinetic energy mode in which a distribution of the electric deflection fields has a greater width, and a low kinetic energy mode in which a distribution of the electric deflection fields has a smaller width.

    Abstract translation: 离子束系统包括电压供应系统7和具有多个第一偏移电极51a，51b，51c和多个第二偏转电极52a，52b，52c的至少一个光束偏转器39，其中电压供应系统被配置为供应 对多个第二偏转电极的不同的可调偏转电压使得多个第二偏转电极和多个相对的第一偏转电极之间的电偏转场具有共同的取向。 离子束系统具有高动能模式，其中电偏转场的分布具有较大的宽度，以及低动能模式，其中电偏转场的分布具有较小的宽度。

    Method and apparatus for improved uniformity control with dynamic beam shaping
    36.
    发明授权
    Method and apparatus for improved uniformity control with dynamic beam shaping 有权
    用于改进动态光束成形的均匀性控制的方法和装置

    公开(公告)号：US08653486B2

    公开(公告)日：2014-02-18

    申请号：US13713251

    申请日：2012-12-13

    Applicant: Axcelis Technologies, Inc.

    Inventor： Edward C. Eisner

    IPC: H01J37/317 ,  H01J37/10

    CPC classification number: H01J3/14 ,  G21K5/10 ,  H01J37/302 ,  H01J37/3171 ,  H01J2237/049 ,  H01J2237/30477 ,  H01J2237/30483

    Abstract: The present invention relates to a method and apparatus for varying the cross-sectional shape of an ion beam, as the ion beam is scanned over the surface of a workpiece, to generate a time-averaged ion beam having an improved ion beam current profile uniformity. In one embodiment, the cross-sectional shape of an ion beam is varied as the ion beam moves across the surface of the workpiece. The different cross-sectional shapes of the ion beam respectively have different beam profiles (e.g., having peaks at different locations along the beam profile), so that rapidly changing the cross-sectional shape of the ion beam results in a smoothing of the beam current profile (e.g., reduction of peaks associated with individual beam profiles) that the workpiece is exposed to. The resulting smoothed beam current profile provides for improved uniformity of the beam current and improved workpiece dose uniformity.

    Abstract translation: 本发明涉及一种用于在离子束在工件的表面上扫描时改变离子束截面形状的方法和装置，以产生具有改进的离子束电流分布均匀性的时间平均离子束 。 在一个实施例中，离子束的横截面形状随着离子束移动穿过工件表面而变化。 离子束的不同横截面形状分别具有不同的光束轮廓（例如，沿着光束轮廓在不同位置处具有峰值），使得快速改变离子束的横截面形状导致光束电流的平滑 工件暴露于的轮廓（例如，减小与各个梁轮廓相关联的峰）。 所得到的平滑光束电流分布提供了改进的束电流均匀性和改进的工件剂量均匀性。

    FIELD EMISSION X-RAY TUBE AND METHOD OF FOCUSING ELECTRON BEAM USING THE SAME
    37.
    发明申请
    FIELD EMISSION X-RAY TUBE AND METHOD OF FOCUSING ELECTRON BEAM USING THE SAME 有权
    现场排放X射线管及使用该方法聚焦电子束的方法

    公开(公告)号：US20130336459A1

    公开(公告)日：2013-12-19

    申请号：US13829130

    申请日：2013-03-14

    Applicant: Electronics and Telecommunications Research Institute

    Inventor： Sungyoul CHOI ,  Yoon-Ho Song

    IPC: H01J35/06

    CPC classification number: H01J35/065 ,  H01J3/14 ,  H01J29/481 ,  H01J29/488 ,  H01J29/51 ,  H01J29/58 ,  H01J29/82 ,  H01J35/14

    Abstract: Provided is a field emission X-ray tube. The field emission X-ray tube includes a cathode electrode provided on one end of a vacuum container, including a field emission emitter; a gate electrode provided inside the vacuum container to be adjacent to the cathode electrode, including a first opening; a focusing electrode electrically connected to the gate electrode and provided on one surface of the gate electrode to be farther from the cathode electrode than the gate electrode while including a second opening with a greater width than that of the first opening; and an anode electrode provided inside the vacuum container on another end thereof in a direction where the vacuum container is extended. A height of the focusing electrode is identical to the width of the second opening, and wherein the width of the first opening is ⅓ or less of the second opening.

    Abstract translation: 提供场发射X射线管。 场发射X射线管包括设置在真空容器的一端的阴极，包括场致发射体; 设置在所述真空容器内的与所述阴极电极相邻的栅电极，包括第一开口; 电极连接到所述栅电极并且设置在所述栅电极的一个表面上以比所述栅电极更远离所述阴极的聚焦电极，同时包括具有比所述第一开口的宽度更大的第二开口; 以及在真空容器延伸的方向的另一端设置在真空容器的内部的阳极电极。 聚焦电极的高度与第二开口的宽度相同，并且其中第一开口的宽度是第二开口的1/3以下。

    SYSTEM AND METHOD FOR AUTOMATED CYCLOTRON PROCEDURES
    38.
    发明申请
    SYSTEM AND METHOD FOR AUTOMATED CYCLOTRON PROCEDURES 有权
    自动循环程序的系统和方法

    公开(公告)号：US20130303824A1

    公开(公告)日：2013-11-14

    申请号：US13887071

    申请日：2013-05-03

    Applicant: Thomas STEPHANI ,  Uwe BEHRENS ,  Heinrich ROECKEN ,  Jan TIMMER ,  Christian BAUMGARTEN

    Inventor： Thomas STEPHANI ,  Uwe BEHRENS ,  Heinrich ROECKEN ,  Jan TIMMER ,  Christian BAUMGARTEN

    IPC: H05H7/02 ,  A61N5/10

    CPC classification number: H05H7/02 ,  A61N5/10 ,  A61N5/1077 ,  A61N2005/1087 ,  H01J3/14 ,  H05H13/005 ,  H05H2007/122 ,  H05H2277/11

    Abstract: Systems and methods are provided to perform efficient, automatic cyclotron initialization, calibration, and beam adjustment. A process is provided that allows the automation of the initialization of a cyclotron after overnight or maintenance imposed shutdown. In one embodiment, five independent cyclotron system states are defined and the transition between one state to another may be automated, e.g., by the control system of the cyclotron. According to these embodiments, it is thereby possible to achieve beam operation after shutdown with minimal manual input. By applying an automatic procedure, all active devices of the cyclotron (e.g., RF system, extraction deflectors, ion source) are respectively ramped to predefined parameters.

    Abstract translation: 提供系统和方法来执行有效的自动回旋加速器初始化，校准和波束调整。 提供了一个过程，允许自动化过夜后的回旋加速器的初始化或维护关闭。 在一个实施例中，定义了五个独立的回旋加速器系统状态，并且一个状态与另一个状态之间的转换可以例如由回旋加速器的控制系统自动化。 根据这些实施例，由此可以在最少的手动输入之后实现停机后的光束操作。 通过应用自动程序，回旋加速器的所有有源装置（例如，RF系统，提取偏转器，离子源）分别斜坡到预定参数。

    SYSTEM AND METHOD FOR AUTOMATED CYCLOTRON PROCEDURES
    40.
    发明申请
    SYSTEM AND METHOD FOR AUTOMATED CYCLOTRON PROCEDURES 有权
    自动循环程序的系统和方法

    公开(公告)号：US20120223246A1

    公开(公告)日：2012-09-06

    申请号：US13225045

    申请日：2011-09-02

    Applicant: Thomas STEPHANI ,  Uwe BEHRENS ,  Heinrich ROECKEN ,  Jan TIMMER ,  Christian BAUMGARTEN

    Inventor： Thomas STEPHANI ,  Uwe BEHRENS ,  Heinrich ROECKEN ,  Jan TIMMER ,  Christian BAUMGARTEN

    IPC: A61N5/10 ,  H01J3/14 ,  G21K5/00

    CPC classification number: H05H7/02 ,  A61N5/10 ,  A61N5/1077 ,  A61N2005/1087 ,  H01J3/14 ,  H05H13/005 ,  H05H2007/122 ,  H05H2277/11

    Abstract: Systems and methods are provided to perform efficient, automatic cyclotron initialization, calibration, and beam adjustment. A process is provided that allows the automation of the initialization of a cyclotron after overnight or maintenance imposed shutdown. In one embodiment, five independent cyclotron system states are defined and the transition between one state to another may be automated, e.g., by the control system of the cyclotron. According to these embodiments, it is thereby possible to achieve beam operation after shutdown with minimal manual input. By applying an automatic procedure, all active devices of the cyclotron (e.g., RF system, extraction deflectors, ion source) are respectively ramped to predefined parameters.

    Abstract translation: 提供系统和方法来执行有效的自动回旋加速器初始化，校准和波束调整。 提供了一个过程，允许自动化过夜后的回旋加速器的初始化或维护关闭。 在一个实施例中，定义了五个独立的回旋加速器系统状态，并且一个状态与另一个状态之间的转换可以例如由回旋加速器的控制系统自动化。 根据这些实施例，由此可以在最少的手动输入之后实现停机后的光束操作。 通过应用自动程序，回旋加速器的所有有源装置（例如，RF系统，提取偏转器，离子源）分别斜坡到预定参数。

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