Abstract:
The package substrates with through silicon plugs (or vias) described above provide lateral and vertical heat dissipation pathways for semiconductor chips that require thermal management. Designs of through silicon plugs (TSPs) with high duty ratios can most effectively provide heat dissipation. TSP designs with patterns of double-sided combs can provide high duty ratios, such as equal to or greater than 50%. Package substrates with high duty ratios are useful for semiconductor chips that generate large amount of heat. An example of such semiconductor chip is a light-emitting diode (LED) chip.
Abstract:
A method includes performing a dicing on a composite wafer including a plurality of dies, wherein the composite wafer is bonded on a carrier when the step of dicing is performed. After the step of dicing, the composite wafer is mounted onto a tape. The carrier is then de-bonded from the composite wafer and the first tape.
Abstract:
A limit switch controlling method and apparatus used in an optical drive are disclosed. When the optical drive is executing a tray-in/tray-out action or a move-sled home action, a detect-tray-in-switch pin, a detect-tray-out-switch pin, or a detect-sled-limit-switch pin of a controlling chip is used to receive a signal from a limit switch. When the optical drive is not executing the tray-in/tray-out action or the move-sled-home action, the detect-tray-in-switch pin, the-detect tray-out-switch pin, or the detect-sled-limit-switch pin of the controlling chip is used as an I/O port.
Abstract:
The present disclosure provides a bonding apparatus. The bonding apparatus includes a cleaning module designed for cleaning chips; and a chip-to-wafer bonding chamber configured to receive the chips from the cleaning module and designed for bonding the chips to a wafer.