Custom leadframe from standard plus printed leadframe portion

    公开(公告)号:US12080633B2

    公开(公告)日:2024-09-03

    申请号:US16123100

    申请日:2018-09-06

    Abstract: A packaged semiconductor device includes an IC die having bump features that are coupled to bond pads flip chip attached to a custom LF. The custom LF includes metal structures including metal leads on at least 2 sides, and printed metal providing a printed LF portion including printed metal traces that connect to and extend inward from at least one of the metal leads over the dielectric support material that are coupled to FC pads configured for receiving the bump features including at least some of the printed metal traces coupled to the bond pads on the IC die. The IC die is flip chip mounted on the printed LF portion so that the bump features are connected to the FC pads.

    Nanoparticle backside die adhesion layer

    公开(公告)号:US11676930B2

    公开(公告)日:2023-06-13

    申请号:US17315102

    申请日:2021-05-07

    CPC classification number: H01L24/32 H01L24/83 H01L2224/32058 H01L2924/35121

    Abstract: In described examples, a microelectronic device includes a microelectronic die with a die attach surface. The microelectronic device further includes a nanoparticle layer coupled to the die attach surface. The nanoparticle layer may be in direct contact with the die attach surface, or may be coupled to the die attach surface through an intermediate layer, such as an adhesion layer or a contact metal layer. The nanoparticle layer includes nanoparticles having adjacent nanoparticles adhered to each other. The microelectronic die is attached to a package substrate by a die attach material. The die attach material extends into the nanoparticle layer and contacts at least a portion of the nanoparticles.

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