摘要:
At least one refresh without scrubbing is performed on a corresponding portion of the memory device with a first frequency. In addition, at least one refresh with scrubbing is performed on a corresponding portion of the memory device with a second frequency less than the first frequency. Accordingly, refresh operations with data scrubbing are performed to prevent data error accumulation. Furthermore, refresh operations without data scrubbing are also performed to reduce undue power consumption from the data scrubbing.
摘要:
A semiconductor memory device includes a cell array including a plurality of regions accessed by first addresses, where the plurality of regions including at least two groups of regions having respectively different memory characteristics. The device further includes a nonvolatile array for nonvolatile storage of group information indicative of which of the least two groups each of the plurality of regions belongs.
摘要:
Semiconductor memory devices include a first storage layer and a second storage layer, each of which includes at least one array, and a control layer for controlling access to the first storage layer and the second storage layer so as to write data to or read data from the array included in the first storage layer or the second storage layer in correspondence to a control signal. A memory capacity of the array included in the first storage layer is different from a memory capacity of the array included in the second storage layer.
摘要:
A semiconductor memory device includes a cell array including a plurality of regions accessed by first addresses, where the plurality of regions including at least two groups of regions having respectively different memory characteristics. The device further includes a nonvolatile array for nonvolatile storage of group information indicative of which of the least two groups each of the plurality of regions belongs.
摘要:
A semiconductor memory device includes a memory cell and a first reference memory cell. The memory cell includes a first switching element and a first capacitor for storing data. The first switching element is controlled by a first wordline, and has a first terminal connected to a first terminal of the first capacitor and a second terminal connected to a first bitline. The first capacitor has a second terminal for receiving a first plate voltage. The first reference memory cell includes a first reference switching element and a first capacitor. The first switching element is controlled by a first reference wordline, and has a first terminal connected to a first terminal of the first reference capacitor and a second terminal connected to a second bitline. The first reference capacitor has a second terminal receiving a first reference plate voltage different from the first plate voltage.
摘要:
A semiconductor memory device has a hierarchical bit line structure. The semiconductor memory device may include first and second memory cell clusters, which share the same bit line pair and are divided operationally; third and fourth memory cell clusters, which are connected respectively corresponding to word lines coupled with the first and second memory cell clusters, and which share a bit line pair different from the bit line pair and are divided operationally; and a column pass gate for switching one of bit line pairs connected with the first to fourth memory cell clusters, to a common sense amplifier, in response to a column selection signal. Whereby an operating speed decrease caused by load of peripheral circuits connected to the bit line is improved, and the number of column pass gates is reduced substantially with a reduction of chip size.
摘要:
A delay circuit in accordance with the present invention provides high-resolution changes in the time delay by utilizing a slope controller that generates an intermediate signal having sloping edges in response to edges in an input signal. A delay time controller generates an output signal having edges that begin when the level of the intermediate signal reaches a certain level. The overall time delay of the delay circuit can be varied by varying the slope of the edges of the intermediate signal, or by varying the level of the intermediate signal at which the delay time controller begins generating an edge in the output signal, or by varying both parameters. The slope controller and delay time controller can be realized with a plurality of tri-state inverters coupled in parallel for operating responsive to one or more select signals. By implementing the inverters with pull-up and pull-down transistors having different sizes, the overall time delay can be varied with very high resolution.
摘要:
A logic interface circuit and a semiconductor memory device to which the logic interface circuit is applied, the circuit comprising: logic gate means having pull up means and pull down means which respectively responds to one or more input signals to pull up and pull down an output terminal; reverse current preventing means connected between a first supply voltage and the pull up means for preventing current from reversing from the pull up means to the first supply voltage; pre-charging means connected in parallel to the reverse current preventing means for responding to the output signal generated from the output terminal to pre-charge a common point of the reverse current preventing means and the pull up means to the first supply voltage; and reverse current preventing and voltage boosting means connected between the second supply voltage and the output terminal for responding to the first supply voltage to turn off to prevent current from reversing from the output terminal to the second supply voltage if the first supply voltage is higher than the second supply voltage, and for responding to one or more input signals to turn on to set up the output terminal to the second supply voltage if the first supply voltage is lower than the second supply voltage, thereby enabling to shift levels of the supply voltage by adding a simple circuit to logic gates like inverter, NAND gate or NOR gate.
摘要:
A synchronous memory comprises a memory cell array having a plurality of memory cells; a clock control circuit for receiving a first clock signal, a second clock signal, and a third clock signal, and for generating an internal clock signal, a plurality of control signals, and a plurality of flag signals. The memory includes a first register circuit for storing a plurality of input data bits in response to the internal clock signal and to the control signals; a second register circuit for storing the flag signals in response to the internal clock signal and the control signals; a write drive circuit for writing the input data bits passing through the first register circuit into the memory cell array in response to the flag signals during a write cycle; a sense amplifier circuit coupled to the memory cell array, an address comparator circuit for receiving read and write address signals and for generating a first, a second, and a third combination signals; and a switching circuit for transferring the input data bits passing through the first register circuit and the flag signals passing through the second register circuit to output terminals of the device.