APPARATUS AND METHOD FOR MEASURING FLOW CONDUCTANCE OF SHOWERHEAD ASSEMBLY

    公开(公告)号:US20240198366A1

    公开(公告)日:2024-06-20

    申请号:US18540419

    申请日:2023-12-14

    CPC classification number: B05B1/3006 B05B1/005 B05B1/185

    Abstract: Methods and apparatuses for measuring a flow conductance of a showerhead assembly are described. For example, a showerhead assembly may be seated in a housing. A gas source may be coupled to an intake port of the showerhead assembly and supply gas to the showerhead assembly via the intake port. A pressure controller may be coupled between the gas source and the showerhead assembly. The pressure controller may measure a flow throughput of the gas that passes through the pressure controller. The pressure controller may maintain the gas being supplied to the showerhead assembly at a first pressure value. A pressure transducer coupled to an exhaust port of the showerhead assembly may measure a second pressure value. A controller may determine a flow conductance of the showerhead assembly based on the flow throughput and the first and second pressure values.

    Susceptor
    53.
    外观设计

    公开(公告)号:USD1030687S1

    公开(公告)日:2024-06-11

    申请号:US29840698

    申请日:2022-05-31

    Abstract: FIG. 1 is a front perspective view of a susceptor, showing our new design;
    FIG. 2 is a bottom perspective view thereof;
    FIG. 3 is right side view thereof;
    FIG. 4 is a left side view thereof;
    FIG. 5 is front view thereof;
    FIG. 6 is back view thereof;
    FIG. 7 is a top view thereof; and,
    FIG. 8 is a bottom view thereof.

    Semiconductor deposition reactor ring

    公开(公告)号:USD1028913S1

    公开(公告)日:2024-05-28

    申请号:US29797476

    申请日:2021-06-30

    Abstract: FIG. 1 is a top perspective view of a semiconductor deposition reactor ring;
    FIG. 2 is a bottom perspective view thereof;
    FIG. 3 is a front view thereof;
    FIG. 4 is a back view thereof;
    FIG. 5 is a left view thereof;
    FIG. 6 is a right view thereof;
    FIG. 7 is a top view thereof; and,
    FIG. 8 is a bottom view thereof.
    The broken lines in the drawings illustrate portions of the semiconductor deposition reactor ring that form no part of the claimed design.

    Methods and apparatus for heating a liquid

    公开(公告)号:US11988316B2

    公开(公告)日:2024-05-21

    申请号:US17944296

    申请日:2022-09-14

    CPC classification number: F16L53/38 H01L21/67023 C23C16/45561 Y10T137/6416

    Abstract: An apparatus capable of heating a liquid may provide a valve assembly configured to receive an incoming liquid from a bulk source. The valve assembly may control the flow of the liquid to a source vessel via a pipe system. The pipe system includes a first pipe directly connected to the valve assembly and a second pipe downstream from the first pipe and connected between the first pipe and the source valve. The second pipe is heated with a heating system that surrounds the second pipe, and the second pipe has a larger diameter than that of the first pipe.

    CHAMBER LINER FOR SUBSTRATE PROCESSING APPARATUS

    公开(公告)号:US20240150898A1

    公开(公告)日:2024-05-09

    申请号:US18386481

    申请日:2023-11-02

    Abstract: A substrate processing apparatus is provided. A substrate processing apparatus comprises a reaction chamber provided with a chamber wall comprising a first sidewall, a second sidewall disposed opposite to the first sidewall, a bottom wall connected to the first sidewall and the second sidewall; a gate valve tunnel disposed in the first sidewall configured to be closed by a gate valve; a substrate support provided with a top plate and a shaft, the substrate support being disposed within the reaction chamber and configured to support a substrate on the top plate, wherein the substrate support is configured to be vertically movable between a process position and a transfer position; and a liner disposed around perimeter of the substrate support and configured to move with the substrate support, wherein an outer wall of the liner is configured to cover the gate valve tunnel when the substrate support is in the process position.

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