Back-side illuminated image sensor
    681.
    发明授权

    公开(公告)号:US12199131B2

    公开(公告)日:2025-01-14

    申请号:US17855521

    申请日:2022-06-30

    Abstract: Image sensors and methods of manufacturing image sensors are provided. One such method includes forming a structure that includes a semiconductor layer extending from a front side to a back side, and a capacitive insulation wall extending through the semiconductor layer. The capacitive insulation wall includes first and second insulating walls separated by a region of a conductor or a semiconductor material. Portions of the semiconductor layer and the region of the conductor or semiconductor material are selectively etched, and the first and second insulating walls have portions protruding outwardly beyond a back side of the semiconductor layer and of the region of the conductor or semiconductor material. A dielectric passivation layer is deposited on the back side of the structure, and portions of the dielectric passivation layer are locally removed on a back side of the protruding portions of the first and second insulating walls.

    Electronic chip with two phase change memories

    公开(公告)号:US12167703B2

    公开(公告)日:2024-12-10

    申请号:US18321347

    申请日:2023-05-22

    Abstract: An electronic chip includes at least a first array of first elementary cells and a second array of second elementary cells. The first and second elementary cells form two types of phase change memory having a storage element formed by a volume of phase change material having either a crystalline state or an amorphous state depending on the bit stored. Each first elementary cell includes a volume of a first phase change material, and each second elementary cell includes a volume of a second phase change material that is different from the first material. Each elementary cell includes a heating connector configured for the passage of a heating current adapted to cause a phase change of the volume of phase change material of the elementary cell.

    SPAD PHOTODIODE
    683.
    发明申请

    公开(公告)号:US20240405146A1

    公开(公告)日:2024-12-05

    申请号:US18799088

    申请日:2024-08-09

    Abstract: A photodiode is formed in a semiconductor substrate of a first conductivity type. The photodiode includes a first region having a substantially hemispherical shape and a substantially hemispherical core of a second conductivity type, different from the first conductivity type, within the first region. An epitaxial layer covers the semiconductor substrate and buries the first region and core.

    IMAGE SENSOR
    684.
    发明申请

    公开(公告)号:US20240380999A1

    公开(公告)日:2024-11-14

    申请号:US18781479

    申请日:2024-07-23

    Abstract: An image sensor includes a pixel array where each pixel is formed in a portion of a substrate electrically insulated from other portions of the substrate. Each pixel includes a photodetector; a transfer transistor; and a readout circuit comprising one or a plurality of transistors. The transistors of the readout circuit are formed inside and on top of at least one well of the portion. The reading from the photodetector of a pixel of a current row uses at least one transistor of the readout circuit of a pixel of at least one previous row, the well of the pixel of the previous row being biased with a first voltage greater than a second bias voltage of the well of the pixel of the current row.

    SPAD photodiode
    685.
    发明授权

    公开(公告)号:US12087873B2

    公开(公告)日:2024-09-10

    申请号:US17702186

    申请日:2022-03-23

    CPC classification number: H01L31/107

    Abstract: A photodiode is formed in a semiconductor substrate of a first conductivity type. The photodiode includes a first region having a substantially hemispherical shape and a substantially hemispherical core of a second conductivity type, different from the first conductivity type, within the first region. An epitaxial layer covers the semiconductor substrate and buries the first region and core.

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