Lighting apparatus
    67.
    发明申请
    Lighting apparatus 有权
    照明设备

    公开(公告)号:US20080123337A1

    公开(公告)日:2008-05-29

    申请号:US11984930

    申请日:2007-11-26

    IPC分类号: F21V31/00 F21V5/00 F21V7/00

    摘要: It is a lighting apparatus 10 that has a light emitting element 16, a light emitting element housing 15 having a concave portion 28 that accommodates the light emitting element 16, and an optically transparent member 18 that airproofs a space B formed by the concave portion 28 and transmits light emitted from the light emitting element 16. The concave portion 28 is shaped to become wider toward the optically transparent member 18 from the bottom surface 28A of the concave portion 28. The lighting apparatus 10 is provided with a light shielding member 12 for shielding a part of light emitted from the light emitting element 16 is provided on the optically transparent member 18.

    摘要翻译: 它是具有发光元件16,具有容纳发光元件16的凹部28的发光元件壳体15的照明装置10以及对由凹部28形成的空间B进行空气隔绝的光学透明构件18 并透射从发光元件16发射的光。 凹部28从凹部28的底面28A朝向光学透明构件18变宽。 照明装置10设置有用于屏蔽从光发射元件16发射的光的一部分的光屏蔽构件12设置在光学透明构件18上。

    Probe card
    69.
    发明授权
    Probe card 有权
    探针卡

    公开(公告)号:US07888953B2

    公开(公告)日:2011-02-15

    申请号:US12464916

    申请日:2009-05-13

    IPC分类号: G01R31/02

    摘要: A probe card is disclosed that includes a board having a first surface and a second surface facing away from each other and a through hole formed between the first and second surfaces; and a probe needle having a penetration part and a support part. The penetration part is placed in the through hole without contacting the board and projects from the first and second surfaces of the board. The support part is integrated with a first one of the end portions of the penetration part and connected to one of the first and second surfaces of the board. The support part has a spring characteristic. The penetration part is configured to have a second one of its end portions come into contact with an electrode pad of a semiconductor chip at the time of conducting an electrical test on the semiconductor chip.

    摘要翻译: 公开了一种探针卡,其包括具有第一表面和彼此背离的第二表面的板和形成在第一表面和第二表面之间的通孔; 以及具有穿透部和支撑部的探针。 穿透部分放置在通孔中而不与板接触并从板的第一和第二表面突出。 所述支撑部与所述贯通部的所述端部的第一端部一体化,且与所述基板的所述第一面和所述第二表面中的一个连接。 支撑部分具有弹簧特性。 穿透部被配置为在半导体芯片上进行电气测试时使其第二端部与半导体芯片的电极焊盘接触。

    PROBE CARD
    70.
    发明申请
    PROBE CARD 有权
    探针卡

    公开(公告)号:US20090284276A1

    公开(公告)日:2009-11-19

    申请号:US12464916

    申请日:2009-05-13

    IPC分类号: G01R31/02

    摘要: A probe card is disclosed that includes a board having a first surface and a second surface facing away from each other and a through hole formed between the first and second surfaces; and a probe needle having a penetration part and a support part. The penetration part is placed in the through hole without contacting the board and projects from the first and second surfaces of the board. The support part is integrated with a first one of the end portions of the penetration part and connected to one of the first and second surfaces of the board. The support part has a spring characteristic. The penetration part is configured to have a second one of its end portions come into contact with an electrode pad of a semiconductor chip at the time of conducting an electrical test on the semiconductor chip.

    摘要翻译: 公开了一种探针卡,其包括具有第一表面和彼此背离的第二表面的板和形成在第一表面和第二表面之间的通孔; 以及具有穿透部和支撑部的探针。 穿透部分放置在通孔中而不与板接触并从板的第一和第二表面突出。 所述支撑部与所述贯通部的所述端部的第一端部一体化,且与所述基板的所述第一面和所述第二表面中的一个连接。 支撑部分具有弹簧特性。 穿透部被配置为在半导体芯片上进行电气测试时使其第二端部与半导体芯片的电极焊盘接触。