摘要:
A semiconductor memory device comprises word lines, bit lines, memory cells, a row decoder, a column decoder, and a write circuit. The word lines are formed along a first direction. The bit lines are formed along a second direction. Memory cells include magneto-resistive elements and are arranged at intersections of the word lines and the bit lines. The row decoder selects at least one of the word lines. The column decoder selects at least one of the bit lines. The write circuit supplies first and second write currents to a selected word line and selected bit line respectively and writes data into a selected memory cell arranged at the intersection of the selected word line and the selected bit line. The write circuit changes the current values of the first and second write currents according to a temperature change.
摘要:
One end of a write word line is connected to a decoder/driver unit. The decoder/driver unit is constituted by a P channel MOS transistor, an N channel MOS transistor, a differential amplifier, and an NAND circuit. When WRITE, CHRDY and RA1 all become “H”, an output signal from the NAND circuit becomes “H”, and a write current flows through the write word line. At this moment, a value of the write current is restricted to a value which does not exceed VLIMIT/R1 by the differential amplifier. R1 is a wiring resistance of the write word line.
摘要:
A read block is constituted of a plurality of TMR elements arranged in a lateral direction. One end of each of the TMR elements in the read block is connected in common, and connected to a source line via a read select switch. The other ends of TMR elements are independently connected to read bit lines/write word lines. The read bit lines/write word lines are connected to common data lines via a row select switch. The common data lines are connected to a read circuit.
摘要:
A magnetic memory includes: a magnetoresistance effect element having a magnetic recording layer; a first wiring extending in a first direction on or below the magnetoresistance effect element; a covering layer provided at least both sides of the first wiring, the covering layer being made of magnetic material, and the covering layer having a uniaxial anisotropy in the first direction along which a magnetization of the covering layer occurs easily; and a writing circuit configured to pass a current through the first wiring in order to record an information in the magnetic recording layer by a magnetic field generated by the current.
摘要:
A NAND EEPROM is disclosed which is capable of variously setting, for each chip, the voltage to be applied to the control gates of memory cells. The semiconductor chip includes a NAND memory cell array and a high-voltage generating circuit for generating data writing internal voltage VPP required when data is written on the memory cell array. Moreover, the semiconductor chip includes a set voltage selection circuit for arbitrarily setting the level of the voltage VPP generated by the high-voltage generating circuit for each chip and a multiplexer for extracting, to the outside of the chip, setting signal LTF which is a signal for enabling the level of the voltage VPP set arbitrarily.
摘要:
A semiconductor memory device includes a memory cell array in which memory cell units are arranged in a matrix, each memory cell unit being constructed by connecting plural memory cells, each of which is electrically rewritable, a select gate connected to a select gate line for connecting a memory cell unit to a bitline, a precharge circuit connected to a first node of the bitline, for supplying a precharge voltage higher than an power supply voltage in programming of data, and a latch circuit connected to a second node of the bitline via a transfer gate for holding data to be programmed into a memory cell, wherein channels of the plurality of the memory cells constituting a selected memory cell unit are charged to the precharge voltage in programming of data.
摘要:
The time required for the program verify and erase verify operations can be shortened. The change of threshold values of memory cells can be suppressed even if the write and erase operations are executed repetitively. After the program and erase operations, whether the operations were properly executed can be judged simultaneously for all bit lines basing upon a change, after the pre-charge, of the potential at each bit line, without changing the column address. In the data rewrite oepration, the rewrite operation is not effected for a memory cell with the data once properly written, by changing the data in the data register.
摘要:
A semiconductor memory device includes a semiconductor substrate, a memory cell array having memory cells, each of which stores data, formed in matrix on the semiconductor substrate, a plurality of data latch circuits, each, of which is arranged at one end of at least one bit line connected to the memory cell array and for latching programming data, a control section for judging whether all of a plurality of latched data included in date latch groups constituted by the plurality of data latch circuits are the same as a first data or not and for controlling to change a potential of a plurality of first nodes according to the judging result, a section for detecting potentials of the plurality of the first nodes and for judging whether all data latched by the latch circuits are the same as the first data and for controlling to change a potential of a plurality of second nodes according to the judging result, and a section for detecting the potential of the plurality of second nodes and for outputting a judging result whether all of data latched by data latch circuits, are the same as the first data or not.
摘要:
A semiconductor circuit device includes an oscillator for outputting an oscillating signal, a driving signal generator for generating driving signals having respective phases based on a counting of oscillations of the oscillating signal, and a charge pump circuit driven by the driving signals. A pulse width ratio of the driving signals to one another is constant even when an oscillation period of the oscillating signal output by the oscillator changes, whereby the charge pump operates properly under changing conditions.
摘要:
In a non-volatile semiconductor memory device having a memory cell array formed by arranging a plurality of non-volatile reloadable semiconductor memory cells (Mi) and select gate elements on a semiconductor substrate (11) via a gate insulating film (13), each memory cell being formed by interposing an interlayer insulating film (15) between a charge storage layer and a control gate line (16.sub.i), the memory device comprises a plurality of select gate lines (14.sub.i) formed by a wiring layer the same as the charge storage layer of the memory cells, as gate electrodes of the select gate elements; and select gate over-adjacent connect lines (16.sub.9, 16.sub.10) formed by a wiring layer the same as the control gate lines (16.sub.i) of the memory cells and located over the select gate lines (14.sub.9, 14.sub.10) via an insulating film in such a way as to be kept floated without contacting with any other wires and potential nodes.