Electron Source
    81.
    发明申请
    Electron Source 审中-公开
    电子源

    公开(公告)号:US20170047207A1

    公开(公告)日:2017-02-16

    申请号:US15234638

    申请日:2016-08-11

    Abstract: An electron source is formed on a silicon substrate having opposing first and second surfaces. At least one field emitter is prepared on the second surface of the silicon substrate to enhance the emission of electrons. To prevent oxidation of the silicon, a thin, contiguous boron layer is disposed directly on the output surface of the field emitter using a process that minimizes oxidation and defects. The field emitter can take various shapes such as pyramids and rounded whiskers. One or several optional gate layers may be placed at or slightly lower than the height of the field emitter tip in order to achieve fast and accurate control of the emission current and high emission currents. The field emitter can be p-type doped and configured to operate in a reverse bias mode or the field emitter can be n-type doped.

    Abstract translation: 在具有相对的第一和第二表面的硅衬底上形成电子源。 在硅衬底的第二表面上制备至少一个场致发射体以增强电子的发射。 为了防止硅的氧化,使用最小化氧化和缺陷的工艺将薄的连续的硼层直接设置在场致发射体的输出表面上。 场发射器可以采取各种形状,例如金字塔和圆形晶须。 一个或几个可选的栅极层可以放置在或稍低于场发射极尖端的高度,以便实现对发射电流和高发射电流的快速和准确的控制。 场发射极可以是p型掺杂的并且被配置为以反偏压模式操作,或者场发射极可以是n型掺杂的。

    Metrology through use of feed forward feed sideways and measurement cell re-use
    82.
    发明授权
    Metrology through use of feed forward feed sideways and measurement cell re-use 有权
    通过使用前馈饲料进行横向计量和测量细胞再利用

    公开(公告)号:US09559019B2

    公开(公告)日:2017-01-31

    申请号:US14588055

    申请日:2014-12-31

    Abstract: Metrology may be implemented during semiconductor device fabrication by a) modeling a first measurement on a first test cell formed in a layer of a partially fabricated device; b) performing a second measurement on a second test cell in the layer; c) feeding information from the second measurement into the modeling of the first measurement; and after a lithography pattern has been formed on the layer including the first and second test cells, d) modeling a third and a fourth measurement on the first and second test cells respectively using information from a) and b) respectively.

    Abstract translation: 可以在半导体器件制造期间通过以下步骤来实现计量:a)对形成在部分制造的器件的层中的第一测试单元上的第一测量进行建模; b)对所述层中的第二测试单元执行第二测量; c)将第二测量中的信息馈送到第一测量的建模中; 并且在包括第一和第二测试单元的层上形成光刻图案之后,d)分别使用来自a)和b)的信息对第一和第二测试单元上的第三和第四测量进行建模。

    Laser repetition rate multiplier and flat-top beam profile generators using mirrors and/or prisms
    84.
    发明授权
    Laser repetition rate multiplier and flat-top beam profile generators using mirrors and/or prisms 有权
    使用反射镜和/或棱镜的激光重复率倍增器和平顶光束轮廓发生器

    公开(公告)号:US09525265B2

    公开(公告)日:2016-12-20

    申请号:US14596738

    申请日:2015-01-14

    Abstract: A repetition rate (pulse) multiplier includes one or more beam splitters and prisms forming one or more ring cavities with different optical path lengths that delay parts of the energy of each pulse. A series of input laser pulses circulate in the ring cavities and part of the energy of each pulse leaves the system after traversing the shorter cavity path, while another part of the energy leaves the system after traversing the longer cavity path, and/or a combination of both cavity paths. By proper choice of the ring cavity optical path length, the repetition rate of an output series of laser pulses can be made to be a multiple of the input repetition rate. The relative energies of the output pulses can be controlled by choosing the transmission and reflection coefficients of the beam splitters. Some embodiments generate a time-averaged output beam profile that is substantially flat in one dimension.

    Abstract translation: 重复率(脉冲)乘法器包括一个或多个分束器和棱镜,其形成具有延迟每个脉冲的能量部分的不同光程长度的一个或多个环形空腔。 一系列输入激光脉冲在环形腔中循环,并且每个脉冲的能量的一部分在穿过较短腔体路径之后离开系统,而另一部分能量在穿过较长腔体路径后离开系统,和/或组合 两个腔道。 通过适当选择环腔光程长度,激光脉冲的输出系列的重复率可以是输入重复率的倍数。 可以通过选择分束器的透射和反射系数来控制输出脉冲的相对能量。 一些实施例产生在一个维度上基本上平坦的时间平均的输出光束轮廓。

    Laser Repetition Rate Multiplier And Flat-Top Beam Profile Generators Using Mirrors And/or Prisms
    85.
    发明申请
    Laser Repetition Rate Multiplier And Flat-Top Beam Profile Generators Using Mirrors And/or Prisms 审中-公开
    激光重复率乘法器和平顶波束轮廓发生器使用镜子和/或棱镜

    公开(公告)号:US20160359292A1

    公开(公告)日:2016-12-08

    申请号:US15239268

    申请日:2016-08-17

    Abstract: A repetition rate (pulse) multiplier includes one or more beam splitters and prisms forming one or more ring cavities with different optical path lengths that delay parts of the energy of each pulse. A series of input laser pulses circulate in the ring cavities and part of the energy of each pulse leaves the system after traversing the shorter cavity path, while another part of the energy leaves the system after traversing the longer cavity path, and/or a combination of both cavity paths. By proper choice of the ring cavity optical path length, the repetition rate of an output series of laser pulses can be made to be a multiple of the input repetition rate. The relative energies of the output pulses can be controlled by choosing the transmission and reflection coefficients of the beam splitters. Some embodiments generate a time-averaged output beam profile that is substantially flat in one dimension.

    Abstract translation: 重复率(脉冲)乘法器包括一个或多个分束器和棱镜,其形成具有延迟每个脉冲的能量部分的不同光程长度的一个或多个环形空腔。 一系列输入激光脉冲在环形腔中循环,并且每个脉冲的能量的一部分在穿过较短腔体路径之后离开系统,而另一部分能量在穿过较长腔体路径后离开系统,和/或组合 两个腔道。 通过适当选择环腔光程长度,激光脉冲的输出系列的重复率可以是输入重复率的倍数。 可以通过选择分束器的透射和反射系数来控制输出脉冲的相对能量。 一些实施例产生在一个维度上基本上平坦的时间平均的输出光束轮廓。

    Multi-spot illumination for improved detection sensitivity
    86.
    发明授权
    Multi-spot illumination for improved detection sensitivity 有权
    多点照明提高检测灵敏度

    公开(公告)号:US09494531B2

    公开(公告)日:2016-11-15

    申请号:US14455161

    申请日:2014-08-08

    CPC classification number: G01N21/9501 G01J1/04 G01N21/8806

    Abstract: Methods and systems for minimizing interference among multiple illumination beams generated from a non-uniform illumination source to provide an effectively uniform illumination profile over the field of view of an inspection system are presented. In some examples, a pulsed beam of light is split into multiple illumination beams such that each of the beams are temporally separated at the surface of the specimen under inspection. In some examples, multiple illumination beams generated from a non-uniform illumination source are projected onto spatially separated areas on the surface of the specimen. A point object of interest illuminated by each area is imaged onto the surface of a time-delay integration (TDI) detector. The images are integrated such that the relative position of the illumination areas along the direction of motion of the point object of interest has no impact on the illumination efficiency distribution over the field of view.

    Abstract translation: 提出了用于最小化从不均匀照明源产生的多个照明光束之间的干扰的方法和系统,以在检查系统的视场上提供有效均匀的照明轮廓。 在一些示例中,脉冲光束被分成多个照明光束,使得每个光束在被检查的样品的表面处在时间上分离。 在一些示例中,从不均匀照明源产生的多个照明光束投影到样本表面上的空间分离的区域上。 由每个区域照明的感兴趣的点对象被成像到时间延迟积分(TDI)检测器的表面上。 图像被集成为使得照明区域沿着感兴趣点对象的运动方向的相对位置对视场的照明效率分布没有影响。

    Photomultiplier Tube, Image Sensor, And An Inspection System Using A PMT Or Image Sensor
    88.
    发明申请
    Photomultiplier Tube, Image Sensor, And An Inspection System Using A PMT Or Image Sensor 有权
    光电倍增管,图像传感器和使用PMT或图像传感器的检测系统

    公开(公告)号:US20160300701A1

    公开(公告)日:2016-10-13

    申请号:US15189871

    申请日:2016-06-22

    CPC classification number: H01J40/06 H01J43/08 H01L31/02161 H01L31/103

    Abstract: A system for inspecting a sample including a detector, either a photomultiplier tube or an electron-bombarded image sensor, that is positioned to receive light from the sample. The detector includes a semiconductor photocathode and a photodiode. Notably, the photodiode includes a p-doped semiconductor layer, an n-doped semiconductor layer formed on a first surface of the p-doped semiconductor layer to form a diode, and a pure boron layer formed on a second surface of the p-doped semiconductor layer. The semiconductor photocathode includes silicon, and further includes a pure boron coating on at least one surface.

    Abstract translation: 用于检查包括检测器,光电倍增管或电子轰击图像传感器的样品的系统,其被定位成接收来自样品的光。 检测器包括半导体光电阴极和光电二极管。 值得注意的是,光电二极管包括p掺杂半导体层,形成在p掺杂半导体层的第一表面上以形成二极管的n掺杂半导体层,以及在p掺杂的第二表面上形成的纯硼层 半导体层。 半导体光电阴极包括硅,并且在至少一个表面上还包括纯硼涂层。

    Low-Noise Sensor And An Inspection System Using A Low-Noise Sensor
    90.
    发明申请
    Low-Noise Sensor And An Inspection System Using A Low-Noise Sensor 有权
    低噪声传感器和使用低噪声传感器的检测系统

    公开(公告)号:US20150177159A1

    公开(公告)日:2015-06-25

    申请号:US14273424

    申请日:2014-05-08

    Abstract: A method of inspecting a sample at high speed includes directing and focusing radiation onto a sample, and receiving radiation from the sample and directing received radiation to an image sensor. Notably, the method includes driving the image sensor with predetermined signals. The predetermined signals minimize a settling time of an output signal of the image sensor. The predetermined signals are controlled by a phase accumulator, which is used to select look-up values. The driving can further include loading an initial phase value, selecting most significant bits of the phase accumulator, and converting the look-up values to an analog signal. In one embodiment, for each cycle of a phase clock, a phase increment can be added to the phase accumulator. The driving can be performed by a custom waveform generator.

    Abstract translation: 高速检查样品的方法包括将辐射引导和聚焦到样品上,并且接收来自样品的辐射并将接收的辐射引导到图像传感器。 值得注意的是,该方法包括以预定信号驱动图像传感器。 预定信号最小化图像传感器的输出信号的建立时间。 预定信号由相位累加器控制,该相位累加器用于选择查找值。 驱动还可以包括加载初始相位值,选择相位累加器的最高有效位,以及将查找值转换为模拟信号。 在一个实施例中,对于相位时钟的每个周期,相位增量可以被加到相位累加器。 驱动可由自定义波形发生器执行。

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