Insect trap
    1.
    发明授权
    Insect trap 有权
    昆虫陷阱

    公开(公告)号:US08959831B2

    公开(公告)日:2015-02-24

    申请号:US12865513

    申请日:2009-01-29

    申请人: Colin Smith

    发明人: Colin Smith

    IPC分类号: A01M1/10 A01M1/02 A01M1/14

    CPC分类号: A01M1/023 A01M1/14

    摘要: The invention relates to an insect trap (10), which mimics certain characteristics of a mammal and comprises a housing comprising a base (22) and a cover (24). The pad generates an infrared heat source (14) and can also generate water vapour (16). The trap has an insect retention surface (18) and is characterized in that the cover is positioned over the base in a manner such that it defines an opening (50) around the base/cover interface (52). The opening has a depth (d) of less than 1.5 cm and is sized and positioned such that at least one attractant signal (14′, 16′) is directed out of the opening in a manner allowing effective operation for at least 8 hours.

    摘要翻译: 本发明涉及昆虫捕获器(10),其模拟哺乳动物的某些特征,并且包括包括基部(22)和盖(24)的壳体。 衬垫产生红外热源(14)并且还可以产生水蒸汽(16)。 捕集器具有昆虫保持表面(18),其特征在于,所述盖以使得其限定围绕所述基部/覆盖物接触(52)的开口(50)的方式定位在所述基部上方。 开口具有小于1.5cm的深度(d),并且其尺寸和定位使得至少一个引诱信号(14',16')以允许有效操作至少8小时的方式被引导出开口。

    DIRECTED MULTI-DEFLECTED ION BEAM MILLING OF A WORK PIECE AND DETERMINING AND CONTROLLING EXTENT THEREOF
    3.
    发明申请
    DIRECTED MULTI-DEFLECTED ION BEAM MILLING OF A WORK PIECE AND DETERMINING AND CONTROLLING EXTENT THEREOF 审中-公开
    方向性离子束离子束切割工艺,确定和控制其范围

    公开(公告)号:US20130180843A1

    公开(公告)日:2013-07-18

    申请号:US13550628

    申请日:2012-07-17

    IPC分类号: H01J37/305

    摘要: Method, device, and system, for directed multi-deflected ion beam milling of a work piece, and, determining and controlling extent thereof. Providing an ion beam; and directing and at least twice deflecting the provided ion beam, for forming a directed multi-deflected ion beam, wherein the directed multi-deflected ion beam is directed towards, incident and impinges upon, and mills, a surface of the work piece. Device includes an ion beam source assembly; and an ion beam directing and multi-deflecting assembly, for directing and at least twice deflecting the provided ion beam, for forming a directed multi-deflected ion beam, wherein the directed multi-deflected ion beam is directed towards, incident and impinges upon, and mills, a surface of the work piece.

    摘要翻译: 方法,装置和系统,用于工件的定向多偏转离子束铣削,以及确定和控制其程度。 提供离子束; 并且引导和至少两次偏转所提供的离子束,用于形成定向的多偏转离子束,其中定向多偏转离子束被引导朝向,入射并冲击在工件的表面上并磨削。 装置包括离子束源组件; 以及离子束引导和多偏转组件,用于引导和至少两次偏转所提供的离子束,用于形成定向的多偏转离子束,其中定向多偏转离子束被引向,入射和撞击, 和磨机,工件的表面。

    DATA PROCESSING SYSTEM AND METHOD
    4.
    发明申请
    DATA PROCESSING SYSTEM AND METHOD 有权
    数据处理系统和方法

    公开(公告)号:US20100094600A1

    公开(公告)日:2010-04-15

    申请号:US12443713

    申请日:2007-10-01

    IPC分类号: G06F17/50 G06F17/16

    CPC分类号: G06F17/5018

    摘要: Embodiments of the present invention relate to a system and method for analysing, designing and manufacturing a body to determine potential discontinuities within the body when subjected to an action.

    摘要翻译: 本发明的实施例涉及用于分析,设计和制造身体的系统和方法,以确定当受到动作时身体内的潜在不连续性。

    Directed Multi-Deflected Ion Beam Milling of a Work Piece and Determining and Controlling Extent Thereof
    6.
    发明申请
    Directed Multi-Deflected Ion Beam Milling of a Work Piece and Determining and Controlling Extent Thereof 审中-公开
    定向多折射离子束铣削工件,确定和控制范围

    公开(公告)号:US20080078750A1

    公开(公告)日:2008-04-03

    申请号:US11661201

    申请日:2005-08-24

    IPC分类号: B23K9/00 G21K1/087

    摘要: Method, device, and system, for directed multi-deflected ion beam milling of a work piece, and, determining and controlling extent thereof. Providing an ion beam; and directing and at least twice deflecting the provided ion beam, for forming a directed multi-deflected ion beam, wherein the directed multi-deflected ion beam is directed towards, incident and impinges upon, and mills, a surface of the work piece. Device includes an ion beam source assembly; and an ion beam directing and multi-deflecting assembly, for directing and at least twice deflecting the provided ion beam, for forming a directed multi-deflected ion beam, wherein the directed multi-deflected ion beam is directed towards, incident and impinges upon, and mills, a surface of the work piece.

    摘要翻译: 方法,装置和系统,用于工件的定向多偏转离子束铣削,以及确定和控制其程度。 提供离子束; 并且引导和至少两次偏转所提供的离子束,用于形成定向的多偏转离子束,其中定向多偏转离子束被引导朝向,入射并冲击在工件的表面上并磨削。 装置包括离子束源组件; 以及用于引导和至少两次偏转所提供的离子束的离子束引导和多偏转组件,用于形成定向的多偏转离子束,其中定向多偏转离子束被引导,入射和撞击, 和磨机,工件的表面。

    Transducer assembly
    9.
    发明授权
    Transducer assembly 有权
    传感器组件

    公开(公告)号:US06234017B1

    公开(公告)日:2001-05-22

    申请号:US09182374

    申请日:1998-10-29

    IPC分类号: G01F2300

    CPC分类号: B06B1/0215 G01F23/2961

    摘要: A transducer assembly adapted for the pulse-emission of a signal includes a transducer (10) with a drive-circuit (20) therefor. The drive circuit (20) includes a charge-storage device (21), a wound-coil device (23) and one or more switching-elements (24, 25). The assembly can be used to determine the level of a fluid in an enclosed vessel.

    摘要翻译: 适于信号的脉冲发射的换能器组件包括具有驱动电路(20)的换能器(10)。 驱动电路(20)包括充电存储装置(21),绕线线圈装置(23)和一个或多个开关元件(24,25)。 该组件可用于确定封闭容器中的流体的水平。