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    NONVOLATILE MEMORY DEVICE AND A METHOD FOR FABRICATING THE SAME
    2.
    发明申请
    NONVOLATILE MEMORY DEVICE AND A METHOD FOR FABRICATING THE SAME 有权
    非易失存储器件及其制造方法

    公开(公告)号：US20140048945A1

    公开(公告)日：2014-02-20

    申请号：US13927914

    申请日：2013-06-26

    Applicant: Jong-Heun LIM ,  Hyo-Jung KIM ,  Ji-Woon IM ,  Kyung-Hyun KIM

    Inventor： Jong-Heun LIM ,  Hyo-Jung KIM ,  Ji-Woon IM ,  Kyung-Hyun KIM

    IPC: H01L23/48

    CPC classification number: H01L23/48 ,  H01L27/11575 ,  H01L27/11582 ,  H01L2924/0002 ,  H01L2924/00

    Abstract: A nonvolatile memory device including a substrate which includes a cell array region and a connection region, an electrode structure formed on the cell array region and the connection region and including a plurality of laminated electrodes, a first recess formed in the electrode structure on the connection region and disposed between the cell array region and a second recess formed in the electrode structure on the connection region, and a plurality of vertical wirings formed on the plurality of electrodes exposed by the first recess.

    Abstract translation: 一种非易失性存储器件，包括：包括单元阵列区域和连接区域的基板;形成在单元阵列区域上的电极结构和连接区域，并且包括多个层压电极;形成在电极结构中的第一凹部， 并且布置在单元阵列区域和形成在连接区域上的电极结构中的第二凹槽之间，以及形成在由第一凹部暴露的多个电极上的多个垂直布线。

    Cyclic redundancy check code generating circuit, semiconductor memory device, and method of driving semiconductor memory device
    4.
    发明授权
    Cyclic redundancy check code generating circuit, semiconductor memory device, and method of driving semiconductor memory device 有权
    循环冗余校验码产生电路，半导体存储器件以及驱动半导体存储器件的方法

    公开(公告)号：US08321777B2

    公开(公告)日：2012-11-27

    申请号：US12002557

    申请日：2007-12-18

    Applicant: Kyung-hyun Kim

    Inventor： Kyung-hyun Kim

    IPC: G06F11/00 ,  H03M13/00

    CPC classification number: H03M13/09 ,  G06F11/1004 ,  H03M13/1102 ,  H03M13/136 ,  H03M13/1515 ,  H03M13/19 ,  H03M13/2957

    Abstract: Disclosed are a semiconductor memory device, and a method of driving the same, and a cyclic redundancy check code generating circuit capable of performing cyclic redundancy check. A semiconductor memory device according to an aspect of the present invention includes a memory cell array, a data processing unit receiving data that is read from the memory cell array and selectively outputting at least some of the data according to ordering information, bit structure information, and burst length information, and a check code generating unit generating a cyclic redundancy check code to detect an error in the data being output, the check code generating unit generating and outputting the cyclic redundancy check code by using the read data, the ordering information, the bit structure information, and the burst length information.

    Abstract translation: 公开了一种半导体存储器件及其驱动方法，以及能够执行循环冗余校验的循环冗余校验码产生电路。 根据本发明的一个方面的半导体存储器件包括存储单元阵列，数据处理单元，接收从存储单元阵列读取的数据，并根据排序信息，比特结构信息选择性地输出数据中的至少一些， 检测码生成部，生成循环冗余校验码，检测出正在输出的数据的错误;校验码生成部，使用读取的数据生成并输出循环冗余校验码，排序信息， 比特结构信息和突发长度信息。

    Methods of manufacturing semiconductor devices
    5.
    发明授权
    Methods of manufacturing semiconductor devices 有权
    制造半导体器件的方法

    公开(公告)号：US08283248B2

    公开(公告)日：2012-10-09

    申请号：US13234558

    申请日：2011-09-16

    Applicant: Tae-Hyun Kim ,  Kyung-Hyun Kim ,  Jae-Hwang Sim ,  Jae-Jin Shin ,  Jong-Heun Lim ,  Hyun-Min Park

    Inventor： Tae-Hyun Kim ,  Kyung-Hyun Kim ,  Jae-Hwang Sim ,  Jae-Jin Shin ,  Jong-Heun Lim ,  Hyun-Min Park

    IPC: H01L21/4763

    CPC classification number: H01L27/11526 ,  H01L21/764 ,  H01L21/7682 ,  H01L27/11529 ,  H01L27/11573

    Abstract: A method of manufacturing a semiconductor device includes forming a plurality of preliminary gate structures, forming a capping layer pattern on sidewalls of the plurality of preliminary gate structures, and forming a blocking layer on top surfaces of the plurality of preliminary gate structures and the capping layer pattern such that a void is formed therebetween. The method also includes removing the blocking layer and an upper portion of the capping layer pattern such that at least the upper sidewalls of the plurality of preliminary gate structures are exposed, and a lower portion of the capping layer pattern remains on lower sidewalls of the preliminary gate structures. The method further includes forming a conductive layer on at least the upper sidewalls of the plurality of preliminary gate structures, reacting the conductive layer with the preliminary gate structures, and forming an insulation layer having an air gap therein.

    Abstract translation: 一种制造半导体器件的方法包括：形成多个初步栅极结构，在多个预选栅极结构的侧壁上形成覆盖层图案，以及在多个预选栅极结构的顶表面上形成阻挡层，并且覆盖层 使得它们之间形成空隙。 该方法还包括去除阻挡层和覆盖层图案的上部，使得至少多个预选栅极结构的上侧壁被暴露，并且覆盖层图案的下部保留在预备的栅极结构的下侧壁上 门结构。 所述方法还包括在所述多个预选择门结构的至少上侧壁上形成导电层，使所述导电层与所述预选栅极结构反应，以及在其中形成具有气隙的绝缘层。

    Phase-change semiconductor device and methods of manufacturing the same
    7.
    发明授权
    Phase-change semiconductor device and methods of manufacturing the same 有权
    相变半导体器件及其制造方法

    公开(公告)号：US08053751B2

    公开(公告)日：2011-11-08

    申请号：US12591531

    申请日：2009-11-23

    Applicant: Tae-Won Kim ,  Yong-Sun Ko ,  Ki-Jong Park ,  Kyung-Hyun Kim

    Inventor： Tae-Won Kim ,  Yong-Sun Ko ,  Ki-Jong Park ,  Kyung-Hyun Kim

    IPC: H01L21/4763

    CPC classification number: H01L45/06 ,  H01L27/2436 ,  H01L45/1233 ,  H01L45/126 ,  H01L45/1273 ,  H01L45/143 ,  H01L45/144 ,  H01L45/148 ,  H01L45/1675

    Abstract: In a phase-change semiconductor device and methods of manufacturing the same, an example method may include forming a metal layer pattern on a substrate, the metal layer pattern including an opening that exposes a portion of the substrate, forming an etch stop layer on the metal layer pattern, a sidewall of the opening and the exposed portion of the substrate, the etch stop layer formed with a thickness less than an upper thickness threshold, and reducing at least a portion of the etch stop layer, the reduced portion of the etch stop layer forming an electrical connection with the substrate.

    Abstract translation: 在相变半导体器件及其制造方法中，示例性方法可以包括在衬底上形成金属层图案，金属层图案包括露出衬底的一部分的开口，在其上形成蚀刻停止层 金属层图案，开口的侧壁和衬底的暴露部分，蚀刻停止层形成为具有小于上部厚度阈值的厚度，以及减少至少一部分蚀刻停止层，蚀刻部分的蚀刻 停止层与基底形成电连接。

    Polishing method using chemical mechanical slurry composition
    8.
    发明授权
    Polishing method using chemical mechanical slurry composition 有权
    抛光方法采用化学机械浆料组成

    公开(公告)号：US08048809B2

    公开(公告)日：2011-11-01

    申请号：US11898850

    申请日：2007-09-17

    Applicant: Hyo-Jin Lee ,  Kyung-Hyun Kim ,  Yong-Sun Ko

    Inventor： Hyo-Jin Lee ,  Kyung-Hyun Kim ,  Yong-Sun Ko

    IPC: H01L21/302

    CPC classification number: H01L21/7684 ,  C09G1/02 ,  C09K3/1463 ,  H01L21/28123 ,  H01L21/3212

    Abstract: A slurry composition includes about 4.25 to about 18.5 weight percent of an abrasive, about 80 to about 95 weight percent of deionized water, and about 0.05 to about 1.5 weight percent of an additive. The slurry composition may further include a surfactant. In a polishing method using the slurry composition, a polysilicon layer may be rapidly polished, and also dishing and erosion of the polysilicon layer may be suppressed.

    Abstract translation: 浆料组合物包括约4.25至约18.5重量％的研磨剂，约80至约95重量％的去离子水和约0.05至约1.5重量％的添加剂。 浆料组合物还可以包括表面活性剂。 在使用浆料组合物的抛光方法中，可以快速抛光多晶硅层，并且可以抑制多晶硅层的凹陷和侵蚀。

    DIAGNOSTIC KIT FOR RESPIRATORY DISEASE
    10.
    发明申请
    DIAGNOSTIC KIT FOR RESPIRATORY DISEASE 审中-公开
    用于呼吸道疾病的诊断用具

    公开(公告)号：US20110136216A1

    公开(公告)日：2011-06-09

    申请号：US12902442

    申请日：2010-10-12

    Applicant: Kyung-Hyun KIM ,  Chul Huh ,  Chil-Seong Ah ,  Gun-Yong Sung

    Inventor： Kyung-Hyun KIM ,  Chul Huh ,  Chil-Seong Ah ,  Gun-Yong Sung

    IPC: C12M1/34

    CPC classification number: G01N33/54366 ,  B01L3/5027 ,  G01N33/56983 ,  G01N2800/12

    Abstract: The present invention relates to a diagnostic kit for a respiratory disease that enables a preprocessing process with respect to a sample to be performed within a diagnostic kit when diagnosing respiratory disease using the diagnostic kit, and thereby enables all the operations starting from collecting the sample to verifying a diagnosis result to be automatically performed within the diagnostic kit. The diagnostic kit for a respiratory disease may perform a field diagnosis at anywhere without being restricted to a specific location, and even a general user may also easily obtain an accurate diagnosis result.

    Abstract translation: 本发明涉及一种用于呼吸疾病的诊断试剂盒，其能够使用诊断试剂盒诊断呼吸系统疾病时能够在诊断试剂盒内进行关于样品的预处理过程，从而使从收集样品开始的所有操作 验证诊断结果在诊断套件内自动执行。 用于呼吸系统疾病的诊断套件可以在任何地方执行现场诊断，而不限于特定位置，甚至一般用户也可以容易地获得准确的诊断结果。

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