Measurement of package interconnect impedance using tester and supporting tester
    2.
    发明授权
    Measurement of package interconnect impedance using tester and supporting tester 失效
    使用测试仪和支持测试仪测量封装互连阻抗

    公开(公告)号:US06946866B2

    公开(公告)日:2005-09-20

    申请号:US10620057

    申请日:2003-07-15

    IPC分类号: G01R31/28 G01R31/02 G01R31/11

    CPC分类号: G01R31/2886

    摘要: A tester head from a tester is used to mount a probe card. A DUT/load board has a socket which is configured to hold a substrate. Probe pins from the probe card make contact with bump pads on the substrate. Signal wires from the DUT/load board are fed to the tester, and the tester is connected to a DSO with a fast rise time signal head. During testing, a signal is launched using the DSO into a coaxial cable which is connected to the test head. The launched signal and the reflected signal are captured back by the DSO, and then fed into the tester. Using this data, post processing software is used to obtain the interconnect impedance versus time for the device (i.e., package) under test. The method and apparatus can be used in connection with both Flip Chip and Wire bonded products.

    摘要翻译: 来自测试仪的测试仪头用于安装探针卡。 DUT /负载板具有被配置为保持衬底的插座。 探针卡的探头引脚与基板上的凸点焊盘接触。 来自DUT /负载板的信号线馈送到测试仪,测试仪连接到具有快速上升时间信号头的DSO。 在测试期间,使用DSO将信号发射到连接到测试头的同轴电缆。 发射信号和反射信号由DSO捕获,然后送入测试仪。 使用该数据,后处理软件用于获得被测器件(即,封装)的互连阻抗与时间的关系。 该方法和设备可以与倒装芯片和线接合产品一起使用。

    Stiffener design
    3.
    发明授权
    Stiffener design 有权
    加固设计

    公开(公告)号:US06825066B2

    公开(公告)日:2004-11-30

    申请号:US10308310

    申请日:2002-12-03

    IPC分类号: H01L2144

    摘要: A stiffener for reinforcing a package integrated circuit. The stiffener includes a rigid planar element having a first surface for bonding to a package substrate. The rigid planar element forms a major interior aperture for receiving and surrounding an integrated circuit on all sides of the integrated circuit. The rigid planar element also forms a minor interior aperture for receiving and surrounding a secondary circuit structure on at least three sides of the secondary circuit structure. In this manner, the stiffener provides structural support to the integrated circuit package, which reduces and preferably eliminates twisting and warping of the substrate package as it heats and is subjected to other stresses. Because the major interior apertures does not need to be large enough to fit both the monolithic integrated circuit and the secondary circuit structure, there is more stiffener material available to provide structural support than there would be if the major interior aperture was large enough to fit both the monolithic integrated circuit and the secondary circuit structure.

    摘要翻译: 用于加强封装集成电路的加强件。 加强件包括刚性平面元件,其具有用于结合到封装基板的第一表面。 刚性平面元件形成用于在集成电路的所有侧面上接收和围绕集成电路的主要内部孔。 刚性平面元件还形成次要内孔,用于在次级电路结构的至少三侧上接收和围绕次级电路结构。 以这种方式,加强件提供对集成电路封装的结构支撑,其降低并优选地消除了衬底封装在其加热并经受其它应力时的扭曲和翘曲。 因为主要内部孔径不需要足够大以适合单片集成电路和次级电路结构,所以有更多的加强材料可用于提供结构支撑,如果主要内部孔径足够大以适合于两者 单片集成电路和二次电路结构。

    Microstrip package having optimized signal line impedance control
    4.
    发明授权
    Microstrip package having optimized signal line impedance control 有权
    微带封装具有优化的信号线阻抗控制

    公开(公告)号:US06531932B1

    公开(公告)日:2003-03-11

    申请号:US09894210

    申请日:2001-06-27

    IPC分类号: H01P308

    摘要: A method for fabricating a microstrip package to optimize signal trace impedance control is disclosed. The method includes patterning a plurality of signal traces on a multilayer substrate, and patterning a plurality of guard traces on the multilayer substrate, that are interspersed alternately among the signal traces to provide noise shielding between the signal traces. In a further embodiment, the traces are patterned on the substrate with a width that is adjusted at different locations based on the presence the guard traces to enable the package to meet a particular impedance requirement.

    摘要翻译: 公开了一种用于制造微带封装以优化信号迹线阻抗控制的方法。 该方法包括在多层衬底上图形化多条信号迹线,以及对多层衬底上的多条保护迹线进行构图,其中交替地在信号迹线之间散布以提供信号迹线之间的噪声屏蔽。 在另一个实施例中,迹线在衬底上被图案化,其宽度基于保护迹线的存在而被调整到不同的位置,以使封装能够满足特定的阻抗要求。

    High density signal routing
    5.
    发明授权
    High density signal routing 有权
    高密度信号路由

    公开(公告)号:US06459049B1

    公开(公告)日:2002-10-01

    申请号:US09885299

    申请日:2001-06-20

    IPC分类号: H01R909

    摘要: A structure for receiving electrical signals near a central portion of the structure and distributing the electrical signals to a peripheral portion of the structure. The structure has a first set of contacts arranged in an array near the central portion of the structure. Electrically conductive traces connect the first set of contacts to a second set of contacts, where each of the electrically conductive traces has at least a first segment, a second segment, and a third segment. The first segment of each of the electrically conductive traces has relatively narrow width and spacing. The first segment of each of the electrically conductive traces is connected on a first end of the first segment to one of the first set of contacts and on a second end of the first segment to the second segment of each of the electrically conductive traces. The second segment of each of the electrically conductive traces has relatively intermediate width and spacing. The second segment of each of the electrically conductive traces is connected on a first end of the second segment to the second end of the first segment and on a second end of the second segment to the third segment of each of the electrically conductive traces. The third segment of each of the electrically conductive traces has relatively wide width and spacing. The third segment of each of the electrically conductive traces is connected on a first end of the third segment to the second end of the second segment and on a second end of the third segment to one of the second set of contacts.

    摘要翻译: 一种用于在所述结构的中心部分附近接收电信号并将所述电信号分配到所述结构的外围部分的结构。 该结构具有靠近结构的中心部分排列成阵列的第一组触点。 导电迹线将第一组触点连接到第二组触点,其中每个导电迹线具有至少第一段,第二段和第三段。 每个导电迹线的第一段具有相对较窄的宽度和间隔。 每个导电迹线的第一段在第一段的第一端连接到第一组触点中的一个,并且在第一段的第二端连接到每个导电迹线的第二段。 每个导电迹线的第二段具有相对中间的宽度和间隔。 每个导电迹线的第二段在第二段的第一端连接到第一段的第二端,并且在第二段的第二端连接到每个导电迹线的第三段。 每个导电迹线的第三段具有相对宽的宽度和间隔。 每个导电迹线的第三段在第三段的第一端连接到第二段的第二端,并且在第三段的第二端连接到第二组接触中的一个。

    Ball assignment system
    6.
    发明申请
    Ball assignment system 有权
    球分配系统

    公开(公告)号:US20060223341A1

    公开(公告)日:2006-10-05

    申请号:US11097895

    申请日:2005-04-01

    IPC分类号: H05K1/00

    摘要: A pattern of contacts that includes high speed transmitter contacts disposed in a first portion of the pattern, where the high speed transmitter contacts are disposed in transmitter differential pairs. High speed receiver contacts are disposed in a second portion of the pattern, where the first portion of the pattern is not interspersed with the second portion of the pattern, and the high speed receiver contacts are disposed in receiver differential pairs. At least one unbroken line of other contacts is disposed between the first portion of the pattern and the second portion of the pattern, where the other contacts do not contain any high speed transmitter contacts and high speed receiver contacts. Low speed IO contacts are disposed in a third portion of the pattern, where the third portion of the pattern is disposed in an interior portion of the pattern relative to both the first portion of the pattern and the second portion of the pattern. Substantially all of the contacts are disposed at a standard pitch one from another on a single contact surface.

    摘要翻译: 包括设置在图案的第一部分中的高速发射器触点的接触图案,其中高速发射器接触设置在发射机差分对中。 高速接收器触点设置在图案的第二部分中,其中图案的第一部分不与图案的第二部分分散,并且高速接收器触点设置在接收器差分对中。 在图案的第一部分和图案的第二部分之间设置至少一条其他触点的一条直线,其他触点不包含任何高速发送器触点和高速接收器触点。 低速IO触点设置在图案的第三部分中,其中图案的第三部分相对于图案的第一部分和图案的第二部分布置在图案的内部。 基本上所有的触点在单个接触表面上彼此之间以标准间距设置。

    Ball assignment system
    7.
    发明授权
    Ball assignment system 有权
    球分配系统

    公开(公告)号:US07319272B2

    公开(公告)日:2008-01-15

    申请号:US11097895

    申请日:2005-04-01

    摘要: A pattern of contacts that includes high speed transmitter contacts disposed in a first portion of the pattern, where the high speed transmitter contacts are disposed in transmitter differential pairs. High speed receiver contacts are disposed in a second portion of the pattern, where the first portion of the pattern is not interspersed with the second portion of the pattern, and the high speed receiver contacts are disposed in receiver differential pairs. At least one unbroken line of other contacts is disposed between the first portion of the pattern and the second portion of the pattern, where the other contacts do not contain any high speed transmitter contacts and high speed receiver contacts. Low speed IO contacts are disposed in a third portion of the pattern, where the third portion of the pattern is disposed in an interior portion of the pattern relative to both the first portion of the pattern and the second portion of the pattern. Substantially all of the contacts are disposed at a standard pitch one from another on a single contact surface.

    摘要翻译: 包括设置在图案的第一部分中的高速发射器触点的接触图案,其中高速发射器接触设置在发射机差分对中。 高速接收器触点设置在图案的第二部分中,其中图案的第一部分不与图案的第二部分分散,并且高速接收器触点设置在接收器差分对中。 在图案的第一部分和图案的第二部分之间设置至少一条其他触点的一条直线,其他触点不包含任何高速发送器触点和高速接收器触点。 低速IO触点设置在图案的第三部分中,其中图案的第三部分相对于图案的第一部分和图案的第二部分布置在图案的内部。 基本上所有的触点在单个接触表面上彼此之间以标准间距设置。

    Integrated circuit test vehicle
    8.
    发明授权
    Integrated circuit test vehicle 失效
    集成电路测试车

    公开(公告)号:US06534968B1

    公开(公告)日:2003-03-18

    申请号:US09928071

    申请日:2001-08-10

    IPC分类号: G01R3100

    摘要: An apparatus for detecting failures in electrical connections between an integrated circuit package substrate and a circuit board. The substrate has substrate electrical contacts that are electrically connected one to another in first sets in a first region of the substrate. The circuit board has circuit board electrical contacts that are electrically connected one to another in second sets in a second region of the circuit board. The substrate electrical contacts align with and make electrical contact with the circuit board electrical contacts. The first region of the substrate aligns with the second region of the circuit board when the substrate electrical contacts make electrical contact with the circuit board electrical contacts. The first sets of substrate electrical contacts form chains of electrical contacts with the second sets of circuit board electrical contacts. The chains of electrical contacts loop back and forth electrically between the substrate and the circuit board.

    摘要翻译: 一种用于检测集成电路封装衬底和电路板之间的电连接故障的装置。 衬底具有在衬底的第一区域中的第一组中彼此电连接的衬底电触点。 电路板具有在电路板的第二区域中在第二组中彼此电连接的电路板电触点。 基板电触点与电路板电触点对齐并与之电接触。 当基板电触头与电路板电触点电接触时,基板的第一区域与电路板的第二区域对齐。 第一组基板电触点与第二组电路板电触点形成电触点链。 电触头链在基板和电路板之间电连接。

    Transmission equalization system and an integrated circuit package employing the same
    9.
    发明授权
    Transmission equalization system and an integrated circuit package employing the same 有权
    传输均衡系统和采用该系统的集成电路封装

    公开(公告)号:US06496081B1

    公开(公告)日:2002-12-17

    申请号:US09967195

    申请日:2001-09-28

    IPC分类号: H04B314

    CPC分类号: H01P3/088 H01P3/003 H04B3/14

    摘要: The present invention provides a transmission equalization system for use with an integrated circuit package employing a substrate. In one embodiment, the transmission equalization system includes a signal transmission subsystem having a pair of transmission line conductors located in the substrate and employing a differential electrical signal. The transmission equalization system also includes an equalization subsystem located proximate the pair of transmission line conductors that employs at least one aperture positioned and oriented to provide a substantially equivalent transmission environment for each of the pair of transmission line conductors.

    摘要翻译: 本发明提供一种与使用基板的集成电路封装一起使用的传输均衡系统。 在一个实施例中,传输均衡系统包括信号传输子系统,其具有位于衬底中的一对传输线导体并采用差分电信号。 传输均衡系统还包括位于该对传输线路导体附近的均衡子系统,该均衡子系统使用至少一个定位和定向的孔径,以为该对传输线路导体中的每一个提供基本相等的传输环境。