摘要:
An integrated circuit structure can include an interposer having a plurality of conductive layers and a die coupled to the interposer through an internal interconnect structure. The integrated circuit structure can include an inductor implemented within at least one of the conductive layers of the interposer. The inductor can include a first terminal and a second terminal. The first terminal and the second terminal can be coupled to the internal interconnect structure.
摘要:
A method of testing a multi-die integrated circuit (IC) can include testing an inter-die connection of the multi-die IC. The inter-die connection can include a micro-bump coupling a first die to a second die. The method can include detecting whether a fault occurs during testing of the inter-die connection. Responsive to detecting the fault, the multi-die integrated circuit can be designated as including a faulty inter-die connection. Also described is an integrated circuit that includes a first die, a second die on which the first die may be disposed, a plurality of inter-die connections coupling the first die to the second die, and a plurality of probe pads, where each probe pad is coupled to at least one of the inter-die connections.
摘要:
A method and apparatus for integrated circuit package thermo-mechanical reliability analysis are described. In some examples, a computer-implemented method of modeling stress in a packaged semiconductor device includes: selecting, using a computer, successive portions of a package layout for the semiconductor device, each of the successive portions of the package layout describing physical layout of at least one interconnect structure in the semiconductor device; for each portion of the successive portions of the package layout: (1) selecting a pre-defined layout from a library of pre-defined layouts based on the portion of the package layout; (2) obtaining pre-characterization information for the pre-defined layout that defines structural properties of the pre-defined layout; and (3) executing a modeling algorithm to determine a stress measurement for the portion of the package layout using the pre-characterization information as parametric input; and combining stress measurements for each of the successive portions of the package layout to determine a stress profile for the semiconductor device.
摘要:
A method of configuring a stacked integrated circuit (“IC”) having a first IC die with configurable logic and a second IC die electrically coupled to the first IC die through an array of inter-chip contacts includes: providing a frame having frame data and a frame address in a frame header to the first IC die; storing the frame data in a frame data register of the first IC die; processing the frame header to determine whether a frame destination is in the first IC die or the second IC die; in response to determining that the frame destination is in the second IC die, providing the frame address to the second IC die through an inter-chip frame address bus including a first plurality of the array of inter-chip contacts; and writing the frame data from the frame data register of the first IC die to the frame destination through an inter-chip frame data bus including a second plurality of the array of inter-chip contacts.
摘要:
A semiconductor device includes a field-programmable gate array (“FPGA”) die (202) having a frame address bus (604), a frame data bus (608), and a second integrated circuit (“IC”) die (204) attached to the FPGA die. An inter-chip frame address bus (605) couples at least low order frame address bits of a frame address of a frame between the FPGA die and the second IC die. The inter-chip frame address bus includes a first plurality of contacts (614) formed between the FPGA die and the second IC die. An inter-chip frame data bus couples frame data of the frame between the FPGA die and the second IC die. The inter-chip frame data bus includes a second plurality of contacts (616) formed between the FPGA die and the second IC die.
摘要:
Specific ionic interactions with a sensing material that is electrically coupled with the floating gate of a floating gate-based ion sensitive field effect transistor (FGISFET) may be used to sense a target material. For example, an FGISFET can use (e.g., previously demonstrated) ionic interaction-based sensing techniques with the floating gate of floating gate field effect transistors. The floating gate can serves as a probe and an interface to convert chemical and/or biological signals to electrical signals, which can be measured by monitoring the change in the device's threshold voltage, VT.
摘要:
Apparatus for integrating capacitors in stacked integrated circuits are described. One aspect of the invention relates to a semiconductor assembly having a carrier substrate, a plurality of integrated circuit dice, and at least one metal-insulator-metal (MIM) capacitor. The integrated circuit dice are vertically stacked on the carrier substrate. Each MIM capacitor is disposed between a first integrated circuit die and a second integrated circuit die of the plurality of integrated circuit dice. The at least one MIM capacitor is fabricated on at least one of a face of the first integrated circuit die and a backside of the second integrated circuit die.
摘要:
A three dimensional (3D) integrated circuit (IC), 3D IC chip and method of fabricating a 3D IC chip. The chip includes multiple layers of circuits, e.g., silicon insulator (SOI) CMOS IC layers, each including circuit elements. The layers may be formed in parallel and one layer attached to another to form a laminated 3D chip.
摘要:
A PLD (200) includes a power management unit (PMU 210) that selectively implements one or more different power-reduction techniques in response to power configuration signals (PC). By manipulating the PC signals, the PMU can independently enable/disable various supply voltage circuits (110, 120, 130) that power CLBs (101), IOBs (102), and configuration memory cells (106), can generate a capture signal that causes data stored in storage elements of the CLBs to be captured in configuration memory cells, and/or can switch power terminals of configuration memory cells between voltage supply circuits. Also, the PMU can sequentially apply and remove power from a number of configurable PLD portions in response to the PC signals, wherein each configurable portion may include any number of the PLD's resources.
摘要:
An FPGA system includes a combined shift register and look up table (LUT) forming a shift register LUT (SRL) that provides data write, reset and shift enable on a cell-by-cell basis. The data write and reset can be performed during FPGA operation without requiring a number of frames or columns of configuration memory cells to be reprogrammed, as with conventional SRAM cells. The shift enable provides for synchronization to facilitate the cell-by-cell write and reset.