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公开(公告)号:US5578865A
公开(公告)日:1996-11-26
申请号:US426875
申请日:1995-04-24
申请人: Duy-Phach Vu , Ngwe K. Cheong
发明人: Duy-Phach Vu , Ngwe K. Cheong
IPC分类号: G02B27/00 , G02F1/1335 , G02F1/1347 , G02F1/136 , G02F1/1362 , G09G3/30 , G09G3/36 , H01L21/84 , H01L27/15 , H04N5/70 , H04N5/74 , H04N9/31 , H01L29/167
CPC分类号: H04N9/3141 , G02B27/0093 , G09G3/30 , G09G3/36 , H01L21/84 , H04N5/7441 , G09G2300/023 , G09G2300/0809 , G09G2300/0842 , G09G2320/0233 , G09G2320/041 , G09G2320/043 , G09G2340/0464 , G09G2370/042 , G09G3/3607 , G09G3/3614 , G09G3/3648 , H04N5/70 , H04N5/7491
摘要: A semiconductor fabrication method improves the voltage characteristic of floating-body MOSFETs by creating recombination centers near the source-body junction of the device. A MOSFET is fabricated through the passivation oxidation stage, and a photolithography step is used to expose the source region. Implantation is then performed using one of two types of material. A first type creates electron traps of predetermined energy in the vicinity of the source-body junction. A second type creates defects in the crystalline structure of the semiconductor material. Both implantation types create recombination centers in the material. This allows the discharge through the source-body junction of charges built up in the body region.
摘要翻译: 半导体制造方法通过在器件的源体结点附近产生复合中心来改善浮体MOSFET的电压特性。 通过钝化氧化阶段制造MOSFET,并且使用光刻步骤来曝光源极区域。 然后使用两种类型的材料之一进行植入。 第一类型在源 - 体结附近产生预定能量的电子阱。 第二种类型在半导体材料的晶体结构中产生缺陷。 这两种植入类型都在材料中产生重组中心。 这允许通过在体区域中积聚的电荷的源 - 体结合进行放电。
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公开(公告)号:US5420055A
公开(公告)日:1995-05-30
申请号:US153781
申请日:1993-11-16
申请人: Duy-Phach Vu , Ngwe K. Cheong
发明人: Duy-Phach Vu , Ngwe K. Cheong
IPC分类号: G02B27/00 , G02F1/1335 , G02F1/1347 , G02F1/136 , G02F1/1362 , G09G3/30 , G09G3/36 , H01L21/84 , H01L27/15 , H04N5/70 , H04N5/74 , H04N9/31 , H01L21/265
CPC分类号: H04N9/3141 , G02B27/0093 , G09G3/30 , G09G3/36 , H01L21/84 , H04N5/7441 , G09G2300/023 , G09G2300/0809 , G09G2300/0842 , G09G2320/0233 , G09G2320/041 , G09G2320/043 , G09G2340/0464 , G09G2370/042 , G09G3/3607 , G09G3/3614 , G09G3/3648 , H04N5/70 , H04N5/7491
摘要: A semiconductor fabrication method improves the voltage characteristic of floating-body MOSFETs by creating recombination centers near the source-body junction of the device. A MOSFET is fabricated through the passivation oxidation stage, and a photolithography step is used to expose the source region. Implantation is then performed using one of two types of material. A first type creates electron traps of predetermined energy in the vicinity of the source-body junction. A second type creates defects in the crystalline structure of the semiconductor material. Both implantation types create recombination centers in the material. This allows the discharge through the source-body junction of charges built up in the body region.
摘要翻译: 半导体制造方法通过在器件的源体结点附近产生复合中心来改善浮体MOSFET的电压特性。 通过钝化氧化阶段制造MOSFET,并且使用光刻步骤来曝光源极区域。 然后使用两种类型的材料之一进行植入。 第一类型在源 - 体结附近产生预定能量的电子阱。 第二种类型在半导体材料的晶体结构中产生缺陷。 这两种植入类型都在材料中产生重组中心。 这允许通过在体区域中积聚的电荷的源 - 体结合进行放电。
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公开(公告)号:US6027958A
公开(公告)日:2000-02-22
申请号:US680210
申请日:1996-07-11
申请人: Duy-Phach Vu , Brenda Dingle , Ngwe K. Cheong
发明人: Duy-Phach Vu , Brenda Dingle , Ngwe K. Cheong
IPC分类号: G06K19/077 , G06K19/07 , H01L21/68 , H01L21/98 , H01L23/538 , H01L25/065 , H05K1/00 , H05K1/16 , H05K3/20 , H01L21/44
CPC分类号: H01L21/568 , H01L21/6835 , H01L23/5387 , H01L24/24 , H01L25/0652 , H01L25/50 , H05K1/16 , H01L2221/6835 , H01L2221/68359 , H01L2221/68363 , H01L2221/68368 , H01L2924/13091 , H01L2924/14 , H01L2924/3025 , H05K1/0393 , H05K3/20
摘要: Integrated circuits for use in electronic devices requiring high density packaging are fabricated to provide highly flexible and ultra-thin devices having a variety of applications. The flexible circuits have dimensions up to several centimeters in surface area and thicknesses of a few microns. These circuits are fabricated using transfer techniques which include the removal of VLSI circuits from silicon wafers and mounting of the circuits on application specific substrates.
摘要翻译: 制造用于需要高密度封装的电子器件的集成电路被制造以提供具有各种应用的高度灵活和超薄的器件。 柔性电路的表面积可达几厘米,厚度几微米。 这些电路使用转移技术制造,其中包括从硅晶片去除VLSI电路,并将电路安装在特定应用的基板上。
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公开(公告)号:US5453153A
公开(公告)日:1995-09-26
申请号:US849632
申请日:1992-03-05
申请人: John C. C. Fan , Paul M. Zavracky , Jagdish Narayan , Lisa P. Allen , Duy-Phach Vu , Ngwe K. Cheong
发明人: John C. C. Fan , Paul M. Zavracky , Jagdish Narayan , Lisa P. Allen , Duy-Phach Vu , Ngwe K. Cheong
CPC分类号: H01L21/2022
摘要: An improved method of zone-melting recrystallizing of a silicon film on an insulator in which the film is implanted and annealed to achieve a reduction of the density of defects within the film.
摘要翻译: 在绝缘体上进行区域熔融重结晶的改进方法,其中膜被注入和退火以实现薄膜内的缺陷密度的降低。
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公开(公告)号:US06486929B1
公开(公告)日:2002-11-26
申请号:US09082925
申请日:1998-05-21
申请人: Duy-Phach Vu , Brenda D. Dingle , Jason E. Dingle , Ngwe Cheong
发明人: Duy-Phach Vu , Brenda D. Dingle , Jason E. Dingle , Ngwe Cheong
IPC分类号: G02F11343
CPC分类号: H01L27/1266 , A61B3/113 , G02B5/30 , G02B27/0093 , G02B27/017 , G02B27/0172 , G02B2027/0132 , G02B2027/0138 , G02B2027/0187 , G02B2027/0198 , G02F1/13336 , G02F1/133526 , G02F1/13454 , G02F1/13473 , G02F1/136209 , G02F1/136277 , G02F2001/13613 , G02F2202/105 , G09G3/30 , G09G3/32 , G09G3/36 , G09G3/3607 , G09G3/3614 , G09G3/3648 , G09G2300/023 , G09G2300/0809 , G09G2300/0842 , G09G2320/0233 , G09G2320/041 , G09G2320/043 , G09G2340/0464 , G09G2370/042 , H01L21/8221 , H01L24/96 , H01L25/0756 , H01L25/10 , H01L25/50 , H01L27/0688 , H01L27/1214 , H01L27/156 , H01L29/786 , H01L29/78603 , H01L29/78648 , H01L2221/68359 , H01L2221/68363 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01015 , H01L2924/01027 , H01L2924/01033 , H01L2924/01039 , H01L2924/01049 , H01L2924/01065 , H01L2924/01072 , H01L2924/01073 , H01L2924/01074 , H01L2924/01082 , H01L2924/12042 , H01L2924/19041 , H01L2924/30105 , H01L2924/3025 , H01L2924/3511 , H01S5/0217 , H01S5/423 , H04N5/70 , H04N5/7441 , H04N5/7491 , H04N9/3141 , H05B33/12 , H01L2924/00
摘要: The invention relates to the formation of arrays of thin film transistors (TFT's) on silicon substrates and the dicing and tiling of such substrates for transfer to a common module body. TFT's activate display electrodes formed adjacent the transistors after the tiles have been transferred.
摘要翻译: 本发明涉及在硅衬底上形成薄膜晶体管(TFT)的阵列以及用于转移到公共模块体的这种衬底的切割和平铺。 在移动瓦片之后,TFT的激活显示电极与晶体管相邻形成。
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公开(公告)号:US6143582A
公开(公告)日:2000-11-07
申请号:US249012
申请日:1999-02-12
申请人: Duy-Phach Vu , Brenda Dingle , Ngwe Cheong
发明人: Duy-Phach Vu , Brenda Dingle , Ngwe Cheong
IPC分类号: A61B3/113 , G02B5/30 , G02B27/00 , G02B27/01 , G02F1/1333 , G02F1/1335 , G02F1/1347 , G02F1/136 , G02F1/1362 , G09G3/30 , G09G3/32 , G09G3/36 , H01L21/77 , H01L21/822 , H01L21/84 , H01L25/075 , H01L27/06 , H01L27/12 , H01L27/15 , H01L29/786 , H01L33/00 , H01S5/02 , H01S5/42 , H04N5/70 , H04N5/74 , H05B33/12 , H10L21/00
CPC分类号: G02F1/13454 , A61B3/113 , G02B27/0093 , G02B27/017 , G02B27/0172 , G02F1/133526 , G02F1/136209 , G02F1/136277 , G09G3/30 , G09G3/36 , H01L21/8221 , H01L24/96 , H01L25/0756 , H01L27/0688 , H01L27/1214 , H01L27/156 , H01L29/786 , H01L29/78603 , H01L29/78648 , H04N5/7441 , H04N9/3141 , H05B33/12 , G02B2027/0132 , G02B2027/0138 , G02B2027/0187 , G02B2027/0198 , G02B5/30 , G02F1/13336 , G02F1/13473 , G02F2001/13613 , G02F2202/105 , G09G2300/023 , G09G2300/0842 , G09G2320/0233 , G09G2320/041 , G09G2320/043 , G09G2340/0464 , G09G2370/042 , G09G3/32 , G09G3/3607 , G09G3/3648 , H01L2221/68359 , H01L2221/68363 , H01L2221/68368 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01015 , H01L2924/01019 , H01L2924/01023 , H01L2924/01027 , H01L2924/01033 , H01L2924/01039 , H01L2924/01065 , H01L2924/01072 , H01L2924/01073 , H01L2924/01074 , H01L2924/01082 , H01L2924/12042 , H01L2924/1305 , H01L2924/13091 , H01L2924/19041 , H01L2924/30105 , H01L2924/3025 , H01L2924/3511 , H01S5/0217 , H01S5/423 , H04N5/70 , H04N5/7491
摘要: The invention relates to device processing, packaging and interconnects that will yield integrated electronic circuitry of higher density and complexity than can be obtained by using conventional multi-chip modules. Processes include the formation of complex multi-function circuitry on common module substrates using circuit tiles of silicon thin-films which are transferred, interconnected and packaged. Circuit modules using integrated transfer/interconnect processes compatible with extremely high density and complexity provide large-area active-matrix displays with on-board drivers and logic in a complete glass-based modules. Other applications are contemplated, such as, displays, microprocessor and memory devices, and communication circuits with optical input and output.
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公开(公告)号:US5976953A
公开(公告)日:1999-11-02
申请号:US986998
申请日:1997-12-08
IPC分类号: H01L21/822 , H01L21/98 , H01L23/498 , H01L25/065 , H01L25/18 , H01L27/00 , H01L27/04 , H01L27/10
CPC分类号: H01L25/50 , H01L23/49833 , H01L24/24 , H01L24/82 , H01L25/0657 , H01L25/18 , H01L2224/16145 , H01L2224/24225 , H01L2225/06524 , H01L2225/06527 , H01L2225/06541 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01015 , H01L2924/01019 , H01L2924/01023 , H01L2924/01033 , H01L2924/01039 , H01L2924/01047 , H01L2924/01061 , H01L2924/01072 , H01L2924/01074 , H01L2924/01082 , H01L2924/014 , H01L2924/07802 , H01L2924/10253 , H01L2924/10329 , H01L2924/12041 , H01L2924/12042 , H01L2924/14 , H01L2924/30105 , H01L2924/30107 , H01L2924/3025 , Y10S148/164
摘要: A multi-layered structure is fabricated in which a microprocessor is configured in different layers and interconnected vertically through insulating layers which separate each circuit layer of the structure. Each circuit layer can be fabricated in a separate wafer or thin film material and then transferred onto the layered structure and interconnected.
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公开(公告)号:US4914491A
公开(公告)日:1990-04-03
申请号:US374621
申请日:1989-06-29
申请人: Duy-Phach Vu
发明人: Duy-Phach Vu
IPC分类号: H01L21/337 , H01L29/808
CPC分类号: H01L29/66901 , H01L29/8086
摘要: A junction field effect transistor formed on insulator substrates particularly oxide substrates and having a polysilicon vertical control gate region formed of a cross member and two end members orthogonal thereto. The vertical control gate is formed over an n-channel in a Si island, the n-channel is located beneath the cross member, with p.sup.+ junction gate regions laterally disposed on either side of the n-channel and n.sup.+ drain and gate regions laterally orthogonal thereto in Si island.
摘要翻译: 形成在绝缘体衬底上的结型场效应晶体管,特别是氧化物衬底,并且具有由横向构件和与其正交的两个端部构件形成的多晶硅垂直控制栅极区域。 垂直控制栅极形成在Si岛上的n沟道上,n沟道位于横向构件下方,p +结栅极区域横向设置在n沟道的两侧,n +漏极和栅极区域横向正交 在Si岛。
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公开(公告)号:US06919935B2
公开(公告)日:2005-07-19
申请号:US10620133
申请日:2003-07-15
申请人: Duy-Phach Vu , Brenda D. Dingle , Jason E. Dingle , Ngwe Cheong
发明人: Duy-Phach Vu , Brenda D. Dingle , Jason E. Dingle , Ngwe Cheong
IPC分类号: A61B3/113 , G02B5/30 , G02B27/00 , G02B27/01 , G02F1/1333 , G02F1/1335 , G02F1/1347 , G02F1/136 , G02F1/1362 , G09G3/30 , G09G3/32 , G09G3/36 , H01L21/77 , H01L21/822 , H01L21/84 , H01L25/075 , H01L27/06 , H01L27/12 , H01L27/15 , H01L29/786 , H01L33/00 , H01S5/02 , H01S5/42 , H04N5/70 , H04N5/74 , H05B33/12 , G02F1/1343
CPC分类号: H01L27/1266 , A61B3/113 , G02B5/30 , G02B27/0093 , G02B27/017 , G02B27/0172 , G02B2027/0132 , G02B2027/0138 , G02B2027/0187 , G02B2027/0198 , G02F1/13336 , G02F1/133526 , G02F1/13454 , G02F1/13473 , G02F1/136209 , G02F1/136277 , G02F2001/13613 , G02F2202/105 , G09G3/30 , G09G3/32 , G09G3/36 , G09G3/3607 , G09G3/3648 , G09G2300/023 , G09G2300/0842 , G09G2320/0233 , G09G2320/041 , G09G2320/043 , G09G2340/0464 , G09G2370/042 , H01L21/8221 , H01L24/96 , H01L25/0756 , H01L27/0688 , H01L27/1214 , H01L27/156 , H01L29/786 , H01L29/78603 , H01L29/78648 , H01L2221/68359 , H01L2221/68363 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01015 , H01L2924/01027 , H01L2924/01033 , H01L2924/01039 , H01L2924/01049 , H01L2924/01065 , H01L2924/01072 , H01L2924/01073 , H01L2924/01074 , H01L2924/01082 , H01L2924/12042 , H01L2924/19041 , H01L2924/30105 , H01L2924/3025 , H01L2924/3511 , H01S5/0217 , H01S5/423 , H04N5/70 , H04N5/7441 , H04N5/7491 , H04N9/3141 , H05B33/12 , H01L2924/00
摘要: The invention relates to the formation of arrays of thin film transistors (TFT's) on silicon substrates and the dicing and tiling of such substrates for transfer to a common module body. TFT's activate display electrodes formed adjacent the transistors after the tiles have been transferred.
摘要翻译: 本发明涉及在硅衬底上形成薄膜晶体管(TFT)的阵列以及用于转移到公共模块体的这种衬底的切割和平铺。 在移动瓦片之后,TFT的激活显示电极与晶体管相邻形成。
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公开(公告)号:US5705424A
公开(公告)日:1998-01-06
申请号:US215555
申请日:1994-03-21
IPC分类号: G02F1/136 , G02B27/00 , G02F1/1335 , G02F1/1347 , G02F1/1362 , G02F1/1368 , G09G3/20 , G09G3/30 , G09G3/36 , H01L21/336 , H01L21/77 , H01L21/84 , H01L27/12 , H01L29/786 , H04N5/74 , H01L21/20 , H01L21/22 , H01L21/304 , H01L21/52
CPC分类号: A61B3/113 , G02B27/0093 , G02F1/133526 , G02F1/13454 , G02F1/136277 , G02F1/1368 , G09G3/30 , G09G3/36 , H01L27/1214 , H01L27/1266 , H01L27/156 , H01L29/786 , H01L29/78603 , H01L29/78633 , H01L29/78648 , H04N5/7441 , H04N9/3105 , H04N9/312 , H04N9/3141 , H04N9/3144 , H05B33/12 , G02B2027/0198 , G02F1/133514 , G02F1/133516 , G02F1/13473 , G02F1/136209 , G02F2001/13613 , G02F2202/105 , G02F2203/01 , G09G2300/023 , G09G2300/0809 , G09G2300/0842 , G09G2310/0259 , G09G2320/0233 , G09G2320/041 , G09G2320/043 , G09G2340/0464 , G09G2370/04 , G09G2370/042 , G09G3/2014 , G09G3/3607 , G09G3/3614 , G09G3/3648 , H01L2221/68359 , H01L2221/68363 , H01L29/78612 , H01L29/78618 , H04N5/70 , H04N5/74 , H04N5/7491 , Y10S438/977
摘要: The present invention relates to methods of fabricating pixel electrodes for active matrix displays including the formation of arrays of transistor circuits in thin film silicon on an insulating substrate and transfer of this active matrix circuit onto an optically transmissive substrate. An array of color filter elements can be formed prior to transfer of the active matrix circuit that are aligned between a light source for the display and the array of pixel electrodes to provide a color display.
摘要翻译: 本发明涉及制造用于有源矩阵显示器的像素电极的方法,包括在绝缘衬底上形成薄膜硅中晶体管电路的阵列并将该有源矩阵电路传送到光学透射衬底上。 可以在转移有源矩阵电路之前形成彩色滤光片元件阵列,该有源矩阵电路在用于显示器的光源和像素电极阵列之间对齐以提供彩色显示。
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