Differential pressure chemical-mechanical polishing in integrated circuit interconnects
    1.
    发明授权
    Differential pressure chemical-mechanical polishing in integrated circuit interconnects 有权
    集成电路互连中的差压化学机械抛光

    公开(公告)号:US06426297B1

    公开(公告)日:2002-07-30

    申请号:US09905296

    申请日:2001-07-13

    IPC分类号: H01L21382

    摘要: A method is provided for manufacturing an integrated circuit having a semiconductor substrate with a semiconductor device. A dielectric layer is formed on the semiconductor wafer and an opening is formed in the dielectric layer. A barrier layer is deposited to line the opening and a conductor core is deposited to fill the channel opening over the barrier layer. The semiconductor wafer is then subjected to chemical-mechanical polishing using a differential pressure between the center of the semiconductor wafer and its periphery.

    摘要翻译: 提供了一种用于制造具有半导体器件的半导体衬底的集成电路的方法。 在半导体晶片上形成电介质层,并在电介质层中形成开口。 沉积阻挡层以对开口进行排列,并且沉积导体芯以填充阻挡层上的通道开口。 然后使用半导体晶片的中心与其周边之间的压差对半导体晶片进行化学机械抛光。

    Non-planar copper alloy target for plasma vapor deposition systems
    6.
    发明授权
    Non-planar copper alloy target for plasma vapor deposition systems 有权
    用于等离子体气相沉积系统的非平面铜合金靶

    公开(公告)号:US06589408B1

    公开(公告)日:2003-07-08

    申请号:US10107778

    申请日:2002-03-27

    IPC分类号: C23C1435

    CPC分类号: C23C14/3414 C23C14/3407

    摘要: A non-planar target can be configured for use in a plasma vapor deposition (PVD) process in which ions bombard the non-planar target and cause alloy atoms present in the non-planar target to be knocked loose and form an alloy film layer. The target includes a top planar section having a first alloy concentration and a side annular section having a second alloy concentration. The side annular section has ends coupled to ends of the top planar section. The first alloy concentration and the second alloy concentration are different.

    摘要翻译: 非平面靶可以被配置用于等离子体气相沉积(PVD)工艺,其中离子轰击非平面靶,并使存在于非平面靶中的合金原子被敲击松动并形成合金膜层。 目标包括具有第一合金浓度的顶部平面部分和具有第二合金浓度的侧部环形部分。 侧面环形部分具有端部连接到顶部平面部分的端部。 第一合金浓度和第二合金浓度不同。

    Time ramped method for plating of high aspect ratio semiconductor vias and channels
    10.
    发明授权
    Time ramped method for plating of high aspect ratio semiconductor vias and channels 有权
    用于电镀高纵横比半导体通孔和通道的时间渐变方法

    公开(公告)号:US06297157B1

    公开(公告)日:2001-10-02

    申请号:US09431516

    申请日:1999-11-01

    IPC分类号: H01L2144

    摘要: A method is provided for forming conductive layers in semiconductor vias by using forward and reverse pulses during the electroplating process which have time intervals between pulses which increase with time and for forming conductive layers in semiconductor channels by using forward pulses during the electroplating process which have time intervals between pulses which also increase with time. This allows fast deposition while reducing the deposition stress to eliminate voids and speeds up the overall manufacturing process.

    摘要翻译: 提供了一种用于在电镀工艺期间通过使用正向和反向脉冲在电镀过程中形成导电层的方法,其间具有随时间增加的脉冲之间的时间间隔,并且通过在电镀工艺期间使用正向脉冲来形成半导体通道中的导电层, 脉冲之间的间隔也随时间增加。 这允许快速沉积,同时减少沉积应力以消除空隙并加速整个制造过程。