摘要:
Briefly, in accordance with one embodiment of the invention, a system includes: a processor, a voltage regulator, and a memory. The voltage regulator is coupled to the processor to adjust the operating voltage of the processor. The memory is coupled to the processor by a memory bus. The memory has stored on it processor instructions that, when executed by the processor, result in modification of the operating frequency of the processor and result in adjustment of the operating voltage of the processor, based, at least in part, on dynamic changes in the processing load of the processor.
摘要:
Briefly, in accordance with one embodiment of the invention, a system includes: a processor, a voltage regulator, and a memory. The voltage regulator is coupled to the processor to adjust the operating voltage of the processor. The memory is coupled to the processor by a memory bus. The memory has stored on it processor instructions that, when executed by the processor, result in modification of the operating frequency of the processor and result in adjustment of the operating voltage of the processor, based, at least in part, on dynamic changes in the processing load of the processor.
摘要:
Briefly, in accordance with one embodiment of the invention, an integrated circuit has a voltage regulator and a clock divider that may be used to adjust the operational frequency and/or voltage potential of the integrated circuit to reduce the power consumption of the integrated circuit while in operation.
摘要:
Briefly, in accordance with one embodiment of the invention, an integrated circuit has a voltage regulator and a clock divider that may be used to adjust the operational frequency and/or voltage potential of the integrated circuit to reduce the power consumption of the integrated circuit while in operation.
摘要:
An image sensor having a well-to-substrate diode as the photodetector. In a preferred embodiment, a modern salicided (CMOS) process is utilized to manufacture the image sensor. The field oxide region above the diode junction is transparent to visible light, thus allowing the photodiode competitive quantum efficiency as compared to devices having source/drain diffusion-to-substrate photodiodes fabricated on a non-salicided process. The photodiode can be integrated as part of a sensor array with digital circuitry using a relatively unmodified digital CMOS process. Furthermore, the structure allows the optical properties of the photodiode to be engineered by modifying the well without deleterious effects, to approximate a first order, on the characteristics of a FET built in another identical well.
摘要:
Systems and methods for multi-mode radiation hardened multi-core microprocessors are disclosed. In some embodiments, a triplicated circuit includes a first core logic, a second core logic, a third core logic, and bus arbitration and control circuitry. The triplicated circuit is configurable to operate in both a Triple-Modular Redundant (TMR) mode of operation and a multi-threaded mode of operation. In some embodiments, there is essentially no overhead in soft mode and low overhead (power only) in hard mode. In most applications, it is expected that portions of missions require very hard systems (e.g., landing) where a failure is catastrophic. However, other portions require essentially no hardening (digital signal processor and signal processing activities) but much better throughput. Consequently, there is a huge opportunity to develop computer processors with low overhead in soft mode and unprecedented hardness in hard mode.
摘要:
This disclosure relates generally to processors and methods of operating the same. In particular, this disclosure relates to components for correcting soft errors in a processor. In one embodiment, a processor includes an instruction decoder and an exception handler. The instruction decoder is configured to receive one or more soft error correction instructions and decode the one or more soft error correction instructions. Additionally, an exception handler is configured to execute the one or more soft error correction instructions so as to correct one or more soft errors. In this manner, the processor is capable of correcting soft errors that are the result of radiation strikes.
摘要:
The disclosure relates generally to triple-redundant sequential state (TRSS) machines formed as integrated circuits on a semiconductor substrate, such as CMOS, and computerized methods and systems of designing the triple-redundant sequential state machines. Of particular focus in this disclosure are sequential state elements (SSEs) used to sample and hold bit states. The sampling and holding of bits states are synchronized by a clock signal thereby allowing for pipelining in the TRSS machines. In particular, the clock signal may oscillate between a first clock state and a second clock state to synchronize the operation of the SSE according to the timing provided by the clock states. The SSEs has a self-correcting mechanism to protect against radiation induced soft errors. The SSE may be provided in a pipeline circuit of a TRSS machine to receive and store a bit state of bit signal generated by combinational circuits within the pipeline circuit.
摘要:
Circuits, integrated circuits devices, and methods are disclosed that may include biasable transistors with screening regions positioned below a gate and separated from the gate by a semiconductor layer. Bias voltages can be applied to such screening regions to optimize multiple performance features, such as speed and current leakage. Particular embodiments can include biased sections coupled between a high power supply voltage and a low power supply voltage, each having biasable transistors. One or more generation circuits can generate multiple bias voltages. A bias control section can couple one of the different bias voltages to screening regions of biasable transistors to provide a minimum speed and lowest current leakage for such a minimum speed.