Full Bus Transaction Level Modeling Approach for Fast and Accurate Contention Analysis
    1.
    发明申请
    Full Bus Transaction Level Modeling Approach for Fast and Accurate Contention Analysis 审中-公开
    完整的总线交易级建模方法,用于快速准确的竞争分析

    公开(公告)号:US20130054854A1

    公开(公告)日:2013-02-28

    申请号:US13398083

    申请日:2012-02-16

    IPC分类号: G06F13/362

    CPC分类号: G06F13/362 G06F13/1642

    摘要: The present invention presents an effective Cycle-count Accurate Transaction level (CCA-TLM) full bus modeling and simulation technique. Using the two-phase arbiter and master-slave models, an FSM-based Composite Master-Slave-pair and Arbiter Transaction (CMSAT) model is proposed for efficient and accurate dynamic simulations. This approach is particularly effective for bus architecture exploration and contention analysis of complex Multi-Processor System-on-Chip (MPSoC) designs.

    摘要翻译: 本发明提出了一种有效的循环计数精确交易级别(CCA-TLM)全总线建模和仿真技术。 使用两相仲裁器和主从模型,提出了基于FSM的复合主从从对和仲裁器事务(CMSAT)模型,用于高效和准确的动态模拟。 这种方法对于复杂的多处理器片上系统(MPSoC)设计的总线架构探索和竞争分析特别有效。

    Cycle-Count-Accurate (CCA) Processor Modeling for System-Level Simulation
    2.
    发明申请
    Cycle-Count-Accurate (CCA) Processor Modeling for System-Level Simulation 审中-公开
    用于系统级仿真的循环计数精确(CCA)处理器建模

    公开(公告)号:US20120185231A1

    公开(公告)日:2012-07-19

    申请号:US13008921

    申请日:2011-01-19

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5022 G06F2217/68

    摘要: The present invention discloses a cycle-count-accurate (CCA) processor modeling, which can achieve high simulation speeds while maintaining timing accuracy of the system simulation. The CCA processor modeling includes a pipeline subsystem model and a cache subsystem model with accurate cycle with accurate cycle count information and guarantees accurate timing and functional behaviors on processor interface. The CCA processor modeling further includes a branch predictor and a bus interface (BIF) to predict the branch of pipeline execution behavior (PEB) and to simulate the data accesses between the processor and the external components via an external bus, respectively. The experimental results show that the CCA processor modeling performs 50 times faster than the corresponding Cycle-accurate (CA) model while providing the same cycle count information as the target RTL model.

    摘要翻译: 本发明公开了一种循环计数精确(CCA)处理器建模,可以实现高仿真速度,同时保持系统仿真的定时精度。 CCA处理器建模包括管道子系统模型和具有精确周期的缓存子系统模型,具有精确的周期计数信息,并保证处理器接口上的精确时序和功能行为。 CCA处理器建模还包括分支预测器和总线接口(BIF),以预测流水线执行行为(PEB)的分支,并分别通过外部总线模拟处理器与外部组件之间的数据访问。 实验结果表明,CCA处理器建模比相应的周期精确(CA)模型快50倍,同时提供与目标RTL模型相同的周期计数信息。

    Varnish, prepreg, and substrate thereof
    5.
    发明授权
    Varnish, prepreg, and substrate thereof 有权
    清漆,预浸料及其底材

    公开(公告)号:US08088490B2

    公开(公告)日:2012-01-03

    申请号:US12605368

    申请日:2009-10-25

    申请人: Li-Chun Chen

    发明人: Li-Chun Chen

    摘要: A halogen-free varnish includes (A) resin, (B) curing agent, (C) flame inhibitor (flame-retarding agent), (D) accelerator and (E) additives. Resin of (A) has novolac epoxy resin, DOPO-CNE and DOPO-HQ-CNE. Curing agent of (B) includes Benzoxazine resin and phenol novolac resin. Glass fabric cloth is dipped into the halogen-free varnish so as to form a prepreg with better thermal stability, anti-flammability, low absorbent ability and higher curing rate. Furthermore, the prepreg has more toughness.

    摘要翻译: 无卤清漆包括(A)树脂,(B)固化剂,(C)阻燃剂(阻燃剂),(D)促进剂和(E)添加剂。 (A)的树脂具有酚醛环氧树脂,DOPO-CNE和DOPO-HQ-CNE。 (B)的固化剂包括苯并恶嗪树脂和酚醛清漆树脂。 将玻璃织物布浸入无卤清漆中,形成具有更好的热稳定性,抗燃性,低吸水能力和较高固化速度的预浸料。 此外,预浸料具有更多的韧性。

    HALOGEN-FREE VANISH AND PREPREG THEREOF
    6.
    发明申请
    HALOGEN-FREE VANISH AND PREPREG THEREOF 有权
    无卤素及其准备

    公开(公告)号:US20100248570A1

    公开(公告)日:2010-09-30

    申请号:US12409850

    申请日:2009-03-24

    申请人: Li-Chun Chen

    发明人: Li-Chun Chen

    IPC分类号: B32B17/10 C08K3/22

    摘要: A halogen-free varnish includes epoxy resin, composite curing agent, condensed phosphate, and filler. The composite curing agent includes Benzoxazine (BZ) resin and amino triazine novolac (ATN) resin. The filler has aluminium hydroxide and silica. Glass fabric is dipped into the varnish so as to form a prepreg with better thermal stability, anti-flammability, and low moisture absorption

    摘要翻译: 无卤清漆包括环氧树脂,复合固化剂,缩合磷酸盐和填料。 复合固化剂包括苯并恶嗪(BZ)树脂和氨基三嗪酚醛清漆(ATN)树脂。 填料具有氢氧化铝和二氧化硅。 将玻璃织物浸入清漆中以形成具有更好的热稳定性,抗燃性和低吸湿性的预浸料

    Porous Carbon Membranes and Their Forming Method
    8.
    发明申请
    Porous Carbon Membranes and Their Forming Method 审中-公开
    多孔碳膜及其成型方法

    公开(公告)号:US20090273106A1

    公开(公告)日:2009-11-05

    申请号:US12114086

    申请日:2008-05-02

    IPC分类号: B28B1/14

    摘要: The present invention discloses a method for fabricating a carbon membrane having pore regularity. The method comprises: providing a template having a plurality of pores arranged regularly; performing a tubular carbon forming process in the regularly-arranged pores; then performing a removal process to form an annular cavity; performing a carbon forming process in the annular cavity to combine the carbon in the annular cavity with the tubular carbon to thereby form a carbon substance having a thick wall; and repeatedly performing the removal process and the carbon forming process so as to form a carbon membrane having pore regularity.

    摘要翻译: 本发明公开了一种具有孔规律性的碳膜的制造方法。 该方法包括:提供具有规则排列的多个孔的模板; 在规则排列的孔中进行管状碳成形工序; 然后执行去除工艺以形成环形空腔; 在环形空腔中进行碳成形工艺以将环形空腔中的碳与管状碳结合,从而形成具有厚壁的碳物质; 并重复进行除去工序和碳成形工序,形成具有孔规律性的碳膜。

    Integrated defect yield management and query system
    9.
    发明授权
    Integrated defect yield management and query system 失效
    综合缺陷产量管理与查询系统

    公开(公告)号:US06314379B1

    公开(公告)日:2001-11-06

    申请号:US08984882

    申请日:1997-12-04

    IPC分类号: G06F1900

    CPC分类号: H01L22/20 G01R31/2894

    摘要: An integrated defect yield management and query system for a semiconductor wafer fabrication process is disclosed. A local area network connects various testing devices for testing defect conditions of wafers, a defect yield management server and a client device. After inspection, these devices generate a plurality of process records corresponding to each of the semiconductor wafers. The defect yield management server retrieves the process records through the local area network. These process records are stored in a database divided into a plurality of fields, wherein each field corresponds to a specific defect property of the semiconductor wafers. Therefore, these acquired on-line data and their related history records can be accessed by using an inquiring interface, and the client device can effectively poll the process records stored in the database of the defect yield management server.

    摘要翻译: 公开了一种用于半导体晶片制造工艺的综合缺陷产量管理和查询系统。 局域网连接各种测试设备,用于测试晶片的缺陷状况,缺陷产量管理服务器和客户端设备。 在检查之后,这些装置产生对应于每个半导体晶片的多个处理记录。 缺陷产出管理服务器通过局域网检索进程记录。 这些处理记录被存储在分成多个场的数据库中,其中每个场对应于半导体晶片的特定缺陷特性。 因此,这些获取的在线数据及其相关历史记录可以通过使用查询界面来访问,并且客户端设备可以有效地轮询存储在缺陷产量管理服务器的数据库中的过程记录。

    Tool grip
    10.
    外观设计
    Tool grip 失效
    工具夹

    公开(公告)号:USD448265S1

    公开(公告)日:2001-09-25

    申请号:US29127279

    申请日:2000-08-04

    申请人: Li-Chun Chen

    设计人: Li-Chun Chen