公开(公告)号：US5593606A

公开(公告)日：1997-01-14

申请号：US276797

申请日：1994-07-18

申请人： Mark D. Owen ,  James N. O'Brien

发明人： Mark D. Owen ,  James N. O'Brien

IPC分类号： B23K26/00 ,  B23K26/38 ,  B23K26/40 ,  B23K101/42 ,  C23C14/04 ,  C23C14/28 ,  H05K3/00 ,  H05K3/02 ,  H05K3/40 ,  H05K3/42

CPC分类号： H05K3/4076 ,  B23K26/384 ,  B23K26/386 ,  B23K26/388 ,  B23K26/40 ,  B23K26/402 ,  C23C14/046 ,  C23C14/048 ,  C23C14/28 ,  H05K3/0035 ,  H05K3/0038 ,  B23K2203/08 ,  B23K2203/10 ,  B23K2203/12 ,  B23K2203/14 ,  B23K2203/172 ,  B23K2203/26 ,  B23K2203/40 ,  B23K2203/42 ,  B23K2203/50 ,  B23K2203/52 ,  B23K2203/54 ,  H05K2203/107 ,  H05K2203/108 ,  H05K3/027 ,  H05K3/427

摘要： The output of a continuously pumped, Q-switched, Nd:YAG laser (10) is frequency converted to provide ultraviolet light (62) for forming vias (72, 74) in multi-layered targets (40). The parameters of the output pulses (62) are selected to facilitate substantially clean, simultaneous or sequential drilling or via formation in a wide variety of materials such as metals, organic dielectrics, and reinforcement materials having different thermal absorption characteristics in response to ultraviolet light. These parameters typically include at least two of the following criteria: high average power of greater than about 100 milliwatts measured over the beam spot area, a temporal pulse width shorter than about 100 nanoseconds, a spot diameter of less than about 50 microns, and a repetition rate of greater than about one kilohertz. The laser system (10) and method circumvent conventional depth of cut saturation limitations and can achieve an increased depth of cut per pulse in a target (40) formed of either single- or multi-layered material.

摘要翻译： 连续泵浦的Q开关Nd：YAG激光器（10）的输出被频率转换以提供用于在多层靶（40）中形成通孔（72,74）的紫外光（62）。 选择输出脉冲（62）的参数以便于在各种各样的材料（例如响应于紫外光的不同热吸收特性的金属，有机电介质和增强材料）中促进基本清洁，同时或顺序的钻孔或通孔形成。 这些参数通常包括以下标准中的至少两个：在束斑区域上测量的大于约100毫瓦的高平均功率，短于约100纳秒的时间脉冲宽度，小于约50微米的光点直径，以及 重复率大于约1千赫兹。 激光系统（10）和方法规避了传统的切割深度饱和度限制，并且可以实现由单层或多层材料形成的目标（40）中每脉冲的切割深度增加。

公开(公告)号：US20110012514A1

公开(公告)日：2011-01-20

申请号：US12891649

申请日：2010-09-27

申请人： Steven J. Olson ,  Duwayne R. Anderson ,  Robert G. Culter ,  Mark D. Owen

发明人： Steven J. Olson ,  Duwayne R. Anderson ,  Robert G. Culter ,  Mark D. Owen

IPC分类号： H05B37/02 ,  H01L31/12

CPC分类号： H05B33/0851 ,  H05B33/0827

摘要： The present invention provides an optical system having an array of light emitting semiconductor devices to performing an operation that have multiple characteristics associated with performing the operation. The array includes at least one detector located within the array to selectively monitor multiple characteristics of the light emitting semiconductor devices and is configured to generate a signal corresponding to the selected characteristic. A controller is configured to control the light emitting semiconductor devices in response to the signal from the at least one detector. At least one of the multiple characteristics may be concentrated at an area of the array and the at least one detector may be located within the array at the area of the array to selectively monitor characteristic that is concentrated at the area of the array.

摘要翻译： 本发明提供了一种具有发光半导体器件阵列的光学系统，以执行具有与执行该操作相关联的多个特性的操作。 阵列包括位于阵列内的至少一个检测器，以选择性地监测发光半导体器件的多个特性，并且被配置为产生对应于所选择的特性的信号。 控制器被配置为响应于来自至少一个检测器的信号来控制发光半导体器件。 多个特征中的至少一个可以集中在阵列的一个区域，并且至少一个检测器可以位于阵列内的阵列区域内，以选择性地监视集中在阵列区域的特性。

公开(公告)号：US07638808B2

公开(公告)日：2009-12-29

申请号：US11084466

申请日：2005-03-18

申请人： Mark D. Owen ,  Duwayne R. Anderson ,  Thomas R. McNeil ,  Alexander F. Schreiner

发明人： Mark D. Owen ,  Duwayne R. Anderson ,  Thomas R. McNeil ,  Alexander F. Schreiner

IPC分类号： H01L33/00

CPC分类号： H01L33/60 ,  H01L25/0753 ,  H01L33/20 ,  H01L33/46 ,  H01L33/62 ,  H01L33/64 ,  H01L2224/48091 ,  H01L2924/01322 ,  H01L2924/09701 ,  H01L2924/10253 ,  H01L2924/3025 ,  H01L2924/00014 ,  H01L2924/00

摘要： The present invention provides an optical array module that includes a plurality of semiconductor devices mounted on a thermal substrate formed with a plurality of openings that function as micro-reflectors, wherein each micro-reflector includes a layer of reflective material to reflect light. Such material preferably is conductive so as to provide electrical connection for its associated semiconductor device.

摘要翻译： 本发明提供一种光学阵列模块，其包括安装在形成有多个用作微反射器的开口的热衬底上的多个半导体器件，其中每个微反射器包括反射光的反射材料层。 这种材料优选地是导电的，以便为其相关联的半导体器件提供电连接。

公开(公告)号：US20090233003A1

公开(公告)日：2009-09-17

申请号：US11813090

申请日：2005-12-30

申请人： Duwayne R. Anderson ,  Roland Jasmin ,  Mark D. Owen

发明人： Duwayne R. Anderson ,  Roland Jasmin ,  Mark D. Owen

IPC分类号： C23C16/48 ,  B05D3/06 ,  B05C21/00

CPC分类号： G11B7/26 ,  Y10S362/80

摘要： System and methods are disclosed in connection with a reaction at or below the surface of a work object, in the context of a fluid flow fostering the reaction. In some example embodiments, the reaction is fostered by (1) creating fluid flow of an inerting fluid over a surface during exposure of the surface to a predetermined type of light, (2) creating fluid flow comprising a reactive species that reacts with another species at or below the work surface in a predetermined manner and/or (3) creating a fluid flow comprising a catalytic species that catalyzes a reaction in a predetermined manner, e.g., during exposure of the surface to a predetermined type of light. In some example embodiments, a light source is employed that comprises a solid-state light source, e.g., a dense array of solid-state light sources. In at least one of such example embodiments, the reaction is a photoreaction associated with the light source.

摘要翻译： 关于在促进反应的流体流动的上下文中与工作对象的表面或其下方的反应有关的系统和方法被公开。 在一些示例性实施方案中，通过（1）在将表面暴露于预定类型的光时在表面上产生惰性流体的流体流动，（2）产生包含与另一种物质反应的反应性物质的流体流 以预定的方式在工作表面处或下方，和/或（3）产生包含以预定方式催化反应的催化物质的流体流，例如在将表面暴露于预定类型的光时。 在一些示例性实施例中，采用包括固态光源（例如，固态光源的密集阵列）的光源。 在这样的示例性实施方案中的至少一个中，反应是与光源相关联的光反应。

公开(公告)号：US07816638B2

公开(公告)日：2010-10-19

申请号：US11095210

申请日：2005-03-30

申请人： Steven J. Olson ,  Duwayne R. Anderson ,  Robert G. Culter ,  Mark D. Owen

发明人： Steven J. Olson ,  Duwayne R. Anderson ,  Robert G. Culter ,  Mark D. Owen

IPC分类号： H01L31/00

CPC分类号： H05B33/0851 ,  H05B33/0827

摘要： The present invention provides an optical system having an array of light emitting semiconductor devices to performing an operation that have multiple characteristics associated with performing the operation. The array includes at least one detector located within the array to selectively monitor multiple characteristics of the light emitting semiconductor devices and is configured to generate a signal corresponding to the selected characteristic. A controller is configured to control the light emitting semiconductor devices in response to the signal from the at least one detector. At least one of the multiple characteristics may be concentrated at an area of the array and the at least one detector may be located within the array at the area of the array to selectively monitor characteristic that is concentrated at the area of the array.

摘要翻译： 本发明提供了一种具有发光半导体器件阵列的光学系统，以执行具有与执行该操作相关联的多个特性的操作。 阵列包括位于阵列内的至少一个检测器，以选择性地监测发光半导体器件的多个特性，并且被配置为产生对应于所选择的特性的信号。 控制器被配置为响应于来自至少一个检测器的信号来控制发光半导体器件。 多个特征中的至少一个可以集中在阵列的一个区域，并且至少一个检测器可以位于阵列内的阵列区域内，以选择性地监视集中在阵列区域的特性。

公开(公告)号：US5614114A

公开(公告)日：1997-03-25

申请号：US327484

申请日：1994-10-20

申请人： Mark D. Owen

发明人： Mark D. Owen

IPC分类号： B23K26/00 ,  B23K26/38 ,  B23K26/40 ,  B23K101/42 ,  C23C14/04 ,  C23C14/28 ,  C23C26/00 ,  H05K3/00 ,  H05K3/02 ,  H05K3/40 ,  H05K3/42

CPC分类号： B23K26/384 ,  B23K26/386 ,  B23K26/388 ,  B23K26/40 ,  B23K26/402 ,  C23C14/046 ,  C23C14/048 ,  C23C14/28 ,  H05K3/0035 ,  H05K3/0038 ,  H05K3/4076 ,  B23K2203/08 ,  B23K2203/10 ,  B23K2203/12 ,  B23K2203/14 ,  B23K2203/16 ,  B23K2203/26 ,  B23K2203/40 ,  B23K2203/42 ,  B23K2203/50 ,  B23K2203/54 ,  H05K2203/107 ,  H05K2203/108 ,  H05K3/027 ,  H05K3/427

摘要： The output of a continuously pumped, Q-switched, Nd:YAG laser (10) is frequency converted to provide ultraviolet light (62) for plating internal wall surfaces (79, 126) of vias (72, 74) in multilayered electronic devices (80). The parameters of the output pulses (62) are selected to facilitate substantially uniform deposition of plating material particles explosively vaporized from a substrate (124) onto the internal wall surface (79, 126). These parameters typically include at least two of the following criteria: high average power of greater than about 100 milliwatts measured over the beam spot area, a temporal pulse width shorter than about 100 nanoseconds, a spot diameter of less than about 50 microns, and a repetition rate of greater than about one kilohertz.

摘要翻译： 连续泵浦的Q开关Nd：YAG激光器（10）的输出被频率转换以提供紫外光（62），用于对多层电子设备（72,74）中的通孔（72,74）的内壁表面（79，126） 80）。 选择输出脉冲（62）的参数以促进从衬底（124）爆炸地蒸发到内壁表面（79,126）上的电镀材料颗粒的基本上均匀的沉积。 这些参数通常包括以下标准中的至少两个：在束斑区域上测量的大于约100毫瓦的高平均功率，短于约100纳秒的时间脉冲宽度，小于约50微米的光点直径，以及 重复率大于约1千赫兹。

公开(公告)号：US08637332B2

公开(公告)日：2014-01-28

申请号：US12617126

申请日：2009-11-12

申请人： Mark D. Owen ,  Duayne R. Anderson ,  Thomas R. McNeill ,  Alexander F. Schreiner

发明人： Mark D. Owen ,  Duayne R. Anderson ,  Thomas R. McNeill ,  Alexander F. Schreiner

IPC分类号： H01L21/00

CPC分类号： H01L33/60 ,  H01L25/0753 ,  H01L33/20 ,  H01L33/46 ,  H01L33/62 ,  H01L33/64 ,  H01L2224/48091 ,  H01L2924/01322 ,  H01L2924/09701 ,  H01L2924/10253 ,  H01L2924/3025 ,  H01L2924/00014 ,  H01L2924/00

摘要： The present invention provides an optical array module that includes a plurality of semiconductor devices mounted on a thermal substrate formed with a plurality of openings that function as micro-reflectors, wherein each micro-reflector includes a layer of reflective material to reflect light. Such material preferably is conductive so as to provide electrical connection for its associated semiconductor device.

摘要翻译： 本发明提供一种光学阵列模块，其包括安装在形成有多个用作微反射器的开口的热衬底上的多个半导体器件，其中每个微反射器包括反射光的反射材料层。 这种材料优选地是导电的，以便为其相关联的半导体器件提供电连接。

公开(公告)号：US20130118995A1

公开(公告)日：2013-05-16

申请号：US13811615

申请日：2011-07-22

申请人： R. Thomas Hawkins, II ,  Mark D. Owen

发明人： R. Thomas Hawkins, II ,  Mark D. Owen

IPC分类号： B01J35/00

CPC分类号： B01J35/004 ,  A61L2/088 ,  A61L2/10 ,  A61L9/205 ,  B01J21/063 ,  B01J21/08 ,  B01J35/06 ,  B01J35/1028 ,  B01J37/0215 ,  C02F1/002 ,  C02F1/02 ,  C02F1/325 ,  C02F1/705 ,  C02F1/725 ,  C02F2103/18 ,  C02F2201/009 ,  C02F2301/024 ,  C02F2301/028 ,  C02F2303/04 ,  C02F2305/023 ,  C02F2305/08 ,  C02F2305/10 ,  C02F2307/02 ,  Y02A20/212 ,  Y02W10/37

摘要： Disclosed herein are embodiments of a solar-activated photochemical fluid treatment system, some of which comprise a fluid vessel, a porous enclosure positioned inside of the fluid vessel, a porous enclosure positioned inside of the fluid vessel, a fiber substrate contained within the enclosure, and a semiconductor photocatalyst coupled to the fiber substrate. The fluid vessel can be configured to contain a fluid in contact with the photocatalyst such that the fluid treatment system, responsive to solar radiation applied to the photocatalyst and to the fluid in the vessel, induces photochemical modification of contaminants and living organisms in the fluid. Related methods are also disclosed.

摘要翻译： 本文公开了太阳活化光化学流体处理系统的实施方案，其中一些包括流体容器，位于流体容器内部的多孔外壳，位于流体容器内部的多孔外壳，容纳在外壳内的纤维基材， 以及耦合到所述纤维基板的半导体光催化剂。 流体容器可以被配置为容纳与光催化剂接触的流体，使得响应于施加到光催化剂的太阳辐射和容器中的流体的流体处理系统诱导流体中污染物和活生物体的光化学改性。 还公开了相关方法。

公开(公告)号：US20120228236A1

公开(公告)日：2012-09-13

申请号：US13505451

申请日：2010-11-04

申请人： R.Thomas Hawkins, II ,  Mark D. Owen

发明人： R.Thomas Hawkins, II ,  Mark D. Owen

IPC分类号： B01J19/08 ,  C02F1/32 ,  B01D53/86

CPC分类号： B01J19/123 ,  B01D53/885 ,  B01D2255/20707 ,  B01D2255/802 ,  B01D2255/9202 ,  B01D2257/60 ,  B01D2257/602 ,  B01D2257/91 ,  B01D2259/804 ,  B01J2219/0871 ,  B01J2219/0875 ,  B01J2219/0877 ,  B01J2219/0892 ,  C02F1/325 ,  C02F1/725 ,  C02F2201/3222 ,  C02F2201/3227

摘要： Apparatus and methods for the photochemical purification of fluids are disclosed. Fluids containing organic, inorganic and/or microbiological contaminants are treated by photochemical processes in a hybrid photoreactor incorporating a photocatalyst bonded to a light transmissive fiber substrate within at least a portion of the fluid and light sources to illuminate the fluid and photocatalyst. Photochemical processes include photocatalytic oxidation, photocatalytic reduction, photoadsorption, photolysis and photodisinfection. Some aspects of the disclosure include optimization of distribution of photocatalyst within the fluid, optimization of mass transport of contaminants by distribution of randomly-oriented fiber substrate, optimization of photoefficiency by control of light source wavelengths, use of LEDs to achieve optimized light source wavelengths, optimization of light delivery from light sources to fluid, and use of a microprocessor to optimize system performance.

摘要翻译： 公开了用于光化学净化流体的装置和方法。 含有有机，无机和/或微生物污染物的流体在混合光反应器中通过光化学过程进行处理，所述混合光反应器包含结合到透光纤维基材的至少一部分流体和光源中的光催化剂以照射流体和光催化剂。 光化学过程包括光催化氧化，光催化还原，光吸收，光解和光致消解。 本公开的一些方面包括优化流体内光催化剂的分布，通过随机取向的纤维基材的分布优化污染物的质量传输，通过控制光源波长优化光效率，使用LED实现优化的光源波长， 优化从光源到流体的光输送，以及使用微处理器优化系统性能。

公开(公告)号：US08039785B2

公开(公告)日：2011-10-18

申请号：US12891649

申请日：2010-09-27

申请人： Steven J. Olson ,  Duwayne R. Anderson ,  Robert G. Culter ,  Mark D. Owen

发明人： Steven J. Olson ,  Duwayne R. Anderson ,  Robert G. Culter ,  Mark D. Owen

IPC分类号： H01L31/00

CPC分类号： H05B33/0851 ,  H05B33/0827

摘要： The present invention provides an optical system having an array of light emitting semiconductor devices to performing an operation that have multiple characteristics associated with performing the operation. The array includes at least one detector located within the array to selectively monitor multiple characteristics of the light emitting semiconductor devices and is configured to generate a signal corresponding to the selected characteristic. A controller is configured to control the light emitting semiconductor devices in response to the signal from the at least one detector. At least one of the multiple characteristics may be concentrated at an area of the array and the at least one detector may be located within the array at the area of the array to selectively monitor characteristic that is concentrated at the area of the array.

摘要翻译： 本发明提供了一种具有发光半导体器件阵列的光学系统，以执行具有与执行该操作相关联的多个特性的操作。 阵列包括位于阵列内的至少一个检测器，以选择性地监测发光半导体器件的多个特性，并且被配置为产生对应于所选择的特性的信号。 控制器被配置为响应于来自至少一个检测器的信号来控制发光半导体器件。 多个特征中的至少一个可以集中在阵列的一个区域，并且至少一个检测器可以位于阵列内的阵列区域内，以选择性地监视集中在阵列区域的特性。