Microwave plasma treating apparatus
    4.
    发明授权
    Microwave plasma treating apparatus 失效
    微波等离子体处理装置

    公开(公告)号:US5038713A

    公开(公告)日:1991-08-13

    申请号:US354856

    申请日:1989-05-22

    CPC分类号: H01J37/32357 H05H1/46

    摘要: A microwave plasma treating apparatus comprising a vacuum vessel, a device for introducing a microwave to the inside of the vacuum vessel by way of a microwave transmission circuit, a device for supplying a starting gas to the inside of the vacuum vessel, a device for evacuating the inside of the vacuum vessel, and a specimen holder for maintaining a specimen substrate to the inside of the vacuum vessel, wherein a cavity resonator integrated with two matching circuits is disposed in the microwave transmission circuit and a magnetic field generator is disposed to the outside of the cavity resonator, and having the following main features: (a) matching facilitated by a plunger for adjusting the axial length of the cavity resonator and cylindrical sling type irises, E-H tuner or three-stub tuner disposed at the portion of the cylindrical cavity resonator where the microwave is introduced, (b) a bell jar disposed within the cavity resonator to excite TM mode and (c) a magnetic field generator disposed to the outside of the cavity resonator to prepare a region of a great magnetic flux density in the discharging space at the inside of the cavity resonator.

    Process for the formation of a functional deposited film containing
group IV atoms or silicon atoms and group IV atoms by microwave plasma
chemical vapor deposition process
    5.
    发明授权
    Process for the formation of a functional deposited film containing group IV atoms or silicon atoms and group IV atoms by microwave plasma chemical vapor deposition process 失效
    通过微波等离子体化学气相沉积法形成含有IV族原子或硅原子和IV族原子的功能沉积膜的工艺

    公开(公告)号:US4908330A

    公开(公告)日:1990-03-13

    申请号:US302245

    申请日:1989-01-27

    摘要: A process for the formation of a functional deposited film as a thin semiconductor film constituted with the group IV element or a thin semiconductor film constituted with group IV element alloy, by introducing, into a film forming space, a compound as the film-forming raw material and, if required, a compound containing an element capable of controlling valence electrons for the deposited film as the constituent element each in a gaseous state, or in a state where at least one of the compounds is activated, while forming hydrogen atoms in an excited state causing chemical reaction with at least one of the compounds in the gaseous state or in the activated state in an activation space different from the film forming space and introducing them into the film forming space, thereby forming a deposited film on a substrate, wherein the hydrogen atoms in the excited state are formed from a hydrogen gas or a gas mixture composed of a hydrogen gas and a rare gas by means of a microwave plasma generated in a plasma generation chamber disposed in a cavity resonator integrated with two impedance matching circuits in a microwave circuit and the excited state of the hydrogen atoms is controlled.

    Apparatus for forming functional deposited film by microwave plasma CVD
process
    6.
    发明授权
    Apparatus for forming functional deposited film by microwave plasma CVD process 失效
    用微波等离子体CVD法形成功能沉积膜的装置

    公开(公告)号:US4898118A

    公开(公告)日:1990-02-06

    申请号:US252525

    申请日:1988-10-03

    CPC分类号: H01J37/32357 C23C16/511

    摘要: Disclosed herein is an apparatus for forming a deposited film by a microwave plasma CVD process comprising introducing a film-forming raw material gas into a reaction vessel capable of being vacuum sealed, and generating a microwave-excited plasma in the reaction vessel to deposit a film on a substrate for film deposition disposed in the reaction vessel. The apparatus comprises a rectangular waveguide for transmitting microwave energy, a pair of microwave cutoff cavities having different cutoff frequencies, the cavities being oppositely disposed on opposite sides of the waveguide, and a reaction vessel disposed to penetrate through the waveguide and the microwave cutoff cavities, wherein a raw material gas inlet is provided at one end of the reaction vessel, and a film deposition space is provided at the other end of the reaction vessel, whereby it is possible to use effectively the plasma generated in the reaction vessel for film deposition without leakage of the plasma into the cavity on the gas inlet side, and to perform stable film deposition with good reproducibility.

    摘要翻译: 本文公开了一种通过微波等离子体CVD法形成沉积膜的装置,包括将成膜原料气体引入能够被真空密封的反应容器中,并在反应容器中产生微波激发等离子体以沉积膜 在设置在反应容器中的用于膜沉积的基板上。 该装置包括用于传输微波能量的矩形波导,具有不同截止频率的一对微波截止腔,空腔相对地设置在波导的相对侧上,反应容器设置成穿过波导和微波截止腔, 其中原料气体入口设置在反应容器的一端,并且在反应容器的另一端设置有膜沉积空间,由此可以有效地利用在反应容器中产生的用于膜沉积的等离子体而不用 将等离子体泄漏到气体入口侧的空腔中,并以良好的再现性进行稳定的膜沉积。

    Apparatus for forming functional deposited film by microwave plasma CVD
process
    8.
    发明授权
    Apparatus for forming functional deposited film by microwave plasma CVD process 失效
    用微波等离子体CVD法形成功能沉积膜的装置

    公开(公告)号:US4998503A

    公开(公告)日:1991-03-12

    申请号:US430246

    申请日:1989-11-02

    CPC分类号: H01J37/32357 C23C16/511

    摘要: Disclosed herein is an apparatus for forming a deposited film by a microwave plasma CVD process comprising introducing a film-forming raw material gas into a reaction vessel capable of being vacuum sealed, and generating a microwave-excited plasma in the reaction vessel to deposit a film on a substrate for film deposition disposed in the reaction vessel. The apparatus comprises a waveguide for transmitting microwave energy, a pair of microwave cutoff cavities having different cutoff frequencies, the cavities being oppositely disposed on opposite sides of the waveguide, and a reaction vessel disposed to penetrate through the waveguide and the microwave cutoff cavities, wherein a raw material gas inlet is provided at one end of the reaction vessel, and a film deposition space is provided at the other end of the reaction vessel, whereby it is possible to use effectively the plasma generated in the reaction vessel for film deposition without leakage of the plasma into the cavity on the gas inlet side, and to perform stable film deposition with good reproducibility.

    MANUFACTURING METHOD FOR POLYCRYSTALLINE SILICON INGOT, AND POLYCRYSTALLINE SILICON INGOT
    10.
    发明申请
    MANUFACTURING METHOD FOR POLYCRYSTALLINE SILICON INGOT, AND POLYCRYSTALLINE SILICON INGOT 审中-公开
    多晶硅和多晶硅的制造方法

    公开(公告)号:US20130028825A1

    公开(公告)日:2013-01-31

    申请号:US13636490

    申请日:2011-03-25

    IPC分类号: C03B5/23 C01B33/02

    摘要: A method for manufacturing a polycrystalline silicon ingot includes: solidifying a silicon melt retained in a crucible unidirectionally upward from a bottom surface of the silicon melt, wherein a silicon nitride coating layer is formed on inner surfaces of side walls and an inner side surface of a bottom of the crucible, a solidification process in the crucible is divided into a first region from 0 mm to X (10 mm≦X

    摘要翻译: 一种多晶硅锭的制造方法,其特征在于,包括:从所述硅熔体的底面单向上固化保持在坩埚中的硅熔体,其中,在侧壁的内表面和 坩埚的底部,坩埚中的凝固过程被高分割成从0到X(10mm和nlE; X <30mm)的第一区域,从X到Y的第二区域(30mm&amp; NlE; Y <100mm) ,Y以上的第三区域以坩埚的底部为基准,第一区域的固化率V1为10mm / h×nlE; V1&lt; ll; 20mm / h,凝固率 第二区域中的V2在1mm / h&lt; lEE; V2&nlE; 5mm / h的范围内。