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    High voltage three-dimensional devices having dielectric liners
    6.
    发明授权
    High voltage three-dimensional devices having dielectric liners 有权
    具有电介质衬垫的高压三维器件

    公开(公告)号：US09570467B2

    公开(公告)日：2017-02-14

    申请号：US14641117

    申请日：2015-03-06

    申请人： Walid M. Hafez ,  Jeng-Ya D. Yeh ,  Curtis Tsai ,  Joodong Park ,  Chia-Hong Jan ,  Gopinath Bhimarasetti

    发明人： Walid M. Hafez ,  Jeng-Ya D. Yeh ,  Curtis Tsai ,  Joodong Park ,  Chia-Hong Jan ,  Gopinath Bhimarasetti

    IPC分类号： H01L21/84 ,  H01L27/12 ,  H01L29/66 ,  H01L21/8234 ,  H01L21/02 ,  H01L21/28 ,  H01L29/423 ,  H01L29/51

    CPC分类号： H01L27/1211 ,  H01L21/02164 ,  H01L21/0228 ,  H01L21/02532 ,  H01L21/02598 ,  H01L21/28158 ,  H01L21/823412 ,  H01L21/823418 ,  H01L21/823431 ,  H01L21/823437 ,  H01L21/823462 ,  H01L21/823468 ,  H01L21/845 ,  H01L29/42356 ,  H01L29/51 ,  H01L29/513 ,  H01L29/66545 ,  H01L29/6656 ,  H01L29/6681

    摘要： High voltage three-dimensional devices having dielectric liners and methods of forming high voltage three-dimensional devices having dielectric liners are described. For example, a semiconductor structure includes a first fin active region and a second fin active region disposed above a substrate. A first gate structure is disposed above a top surface of, and along sidewalls of, the first fin active region. The first gate structure includes a first gate dielectric, a first gate electrode, and first spacers. The first gate dielectric is composed of a first dielectric layer disposed on the first fin active region and along sidewalls of the first spacers, and a second, different, dielectric layer disposed on the first dielectric layer and along sidewalls of the first spacers. The semiconductor structure also includes a second gate structure disposed above a top surface of, and along sidewalls of, the second fin active region. The second gate structure includes a second gate dielectric, a second gate electrode, and second spacers. The second gate dielectric is composed of the second dielectric layer disposed on the second fin active region and along sidewalls of the second spacers.

    摘要翻译： 描述了具有电介质衬垫的高压三维器件和形成具有电介质衬垫的高电压三维器件的方法。 例如，半导体结构包括设置在基板上方的第一鳍状物活性区域和第二鳍状物活性区域。 第一栅极结构设置在第一鳍片活动区域的顶表面之上并且沿着第一鳍片活动区域的侧壁的上方。 第一栅极结构包括第一栅极电介质，第一栅极电极和第一间隔物。 第一栅极电介质由设置在第一鳍状物活性区域上并沿着第一间隔物的侧壁的第一介电层和设置在第一介电层上并沿着第一间隔物的侧壁的第二不同介电层组成。 半导体结构还包括第二栅极结构，其设置在第二鳍片活动区域的顶表面之上并且沿着第二鳍片活动区域的侧壁的上方。 第二栅极结构包括第二栅极电介质，第二栅电极和第二间隔物。 第二栅极电介质由设置在第二鳍状物活性区域和第二间隔物的侧壁上的第二介电层构成。

    FIN-BASED SEMICONDUCTOR DEVICES AND METHODS
    7.
    发明申请
    FIN-BASED SEMICONDUCTOR DEVICES AND METHODS 审中-公开
    基于FIN的半导体器件和方法

    公开(公告)号：US20170005187A1

    公开(公告)日：2017-01-05

    申请号：US15100286

    申请日：2014-01-24

    申请人： Walid M. Hafez ,  Chia-Hong Jan

    发明人： Walid M. Hafez ,  Chia-Hong Jan

    IPC分类号： H01L29/74 ,  H01L29/66 ,  H01L29/417 ,  H01L27/02 ,  H01L29/06

    CPC分类号： H01L29/74 ,  H01L21/2255 ,  H01L27/0262 ,  H01L29/0649 ,  H01L29/41716 ,  H01L29/66363 ,  H01L29/785

    摘要： Embodiments of semiconductor devices, integrated circuit devices and methods are disclosed. In some embodiments, a semiconductor device may include a first fin and a second fin disposed on a substrate. The first fin may have a portion including a first material disposed between a second material and the substrate, the second material disposed between a third material and the first material, and the third material disposed between a fourth material and the second material. The first and third materials may be formed from a first type of extrinsic semiconductor, and the second and fourth materials may be formed from a second, different type of extrinsic semiconductor. The second fin may be laterally separated from the first fin and materially contiguous with at least one of the first, second, third or fourth materials. Other embodiments may be disclosed and/or claimed.

    摘要翻译： 公开了半导体器件，集成电路器件和方法的实施例。 在一些实施例中，半导体器件可以包括设置在衬底上的第一鳍和第二鳍。 第一翅片可以具有包括设置在第二材料和基底之间的第一材料的部分，第二材料设置在第三材料和第一材料之间，第三材料设置在第四材料和第二材料之间。 第一和第三材料可以由第一类型的非本征半导体形成，并且第二和第四材料可以由第二种不同类型的外在半导体形成。 第二翅片可以与第一翅片横向分离并且与第一，第二，第三或第四材料中的至少一个物质连接。 可以公开和/或要求保护其他实施例。

    METAL FUSE BY TOPOLOGY
    8.
    发明申请
    METAL FUSE BY TOPOLOGY 有权
    金属保险丝通过拓扑学

    公开(公告)号：US20150187709A1

    公开(公告)日：2015-07-02

    申请号：US14142629

    申请日：2013-12-27

    申请人： Chen-Guan Lee ,  Walid M. Hafez ,  Chia-Hong Jan

    发明人： Chen-Guan Lee ,  Walid M. Hafez ,  Chia-Hong Jan

    IPC分类号： H01L23/62 ,  H01L21/3205 ,  H01L21/02

    CPC分类号： H01L23/62 ,  H01L21/0217 ,  H01L21/32055 ,  H01L23/5256 ,  H01L2224/16225 ,  H01L2924/0002 ,  H01L2924/15311 ,  H01L2924/00

    摘要： Embodiments of the present disclosure describe techniques and configurations for overcurrent fuses in integrated circuit (IC) devices. In one embodiment, a device layer of a die may include a first line structure with a recessed portion between opposite end portions and two second line structures positioned on opposite sides of the first line structure. An isolation material may be disposed in the gaps between the line structures and in a first recess defined by the recessed portion. The isolation material may have a recessed portion that defines a second recess in the first recess, and a fuse structure may be disposed in the second recess. Other embodiments may be described and/or claimed.

    摘要翻译： 本公开的实施例描述了用于集成电路（IC）装置中的过电流保险丝的技术和配置。 在一个实施例中，管芯的器件层可以包括在相对端部之间具有凹陷部分的第一线结构和位于第一线结构的相对侧上的两个第二线结构。 隔离材料可以设置在线结构之间的间隙中，并且可以设置在由凹部限定的第一凹部中。 隔离材料可以具有限定第一凹部中的第二凹部的凹部，并且熔丝结构可以设置在第二凹部中。 可以描述和/或要求保护其他实施例。