Semiconductor memory system
    7.
    发明授权
    Semiconductor memory system 失效
    半导体存储器系统

    公开(公告)号:US5598373A

    公开(公告)日:1997-01-28

    申请号:US476765

    申请日:1995-06-07

    CPC分类号: G11C29/80 G11C29/02 G11C29/44

    摘要: A defect remedy LSI mounted on a memory module, comprising: an input interface portion for capturing address and control signals, the input interface portion being the same as that of a dynamic RAM; an input/output interface portion corresponding to a data bus of a memory device comprised of a plurality of dynamic random access memories; a memory circuit to which a chip address and an X defective address of any of the plurality of random access memories are electrically written, the memory circuit being substantially made nonvolatile; a redundancy remedy RAM portion composed of a static RAM wherein a word line is selected by a compare match signal between an X address signal and the defective address of the memory circuit, the X address signal and the defective address being captured via the input interface portion, and a column is selected by a Y address signal captured via the input interface portion; a selecting portion for connecting a data input/output bus of the redundancy remedy RAM portion to an input/output circuit corresponding to a defective chip address; a data input/output portion for selectively activating an input/output circuit to be connected to a data bus corresponding to a dynamic RAM found defective; and a mask portion for outputting a control signal for putting in a high-impedance state an output pin of the defective RAM in a read operation.

    摘要翻译: 安装在存储器模块上的缺陷补救LSI包括:用于捕获地址和控制信号的输入接口部分,所述输入接口部分与动态RAM的相同; 对应于由多个动态随机存取存储器构成的存储器件的数据总线的输入/输出接口部分; 存储器电路,其中电子地写入多个随机存取存储器中的任何一个的芯片地址和X缺陷地址,所述存储器电路基本上是非易失性的; 由静态RAM组成的冗余补救RAM部分,其中通过X地址信号和存储器电路的缺陷地址之间的比较匹配信号来选择字线,X地址信号和缺陷地址经由输入接口部分捕获 并且通过经由输入接口部分捕获的Y地址信号来选择列; 选择部分,用于将冗余补救RAM部分的数据输入/输出总线连接到对应于有缺陷的芯片地址的输入/输出电路; 数据输入/输出部分,用于选择性地激活要连接到与发现有缺陷的动态RAM相对应的数据总线的输入/输出电路; 以及掩模部分,用于在读取操作中输出用于将缺陷RAM的输出引脚置于高阻抗状态的控制信号。

    Semiconductor memory device with low-house pads for electron beam test
    8.
    发明授权
    Semiconductor memory device with low-house pads for electron beam test 失效
    半导体存储器件,具有用于电子束测试的低屋垫

    公开(公告)号:US5021998A

    公开(公告)日:1991-06-04

    申请号:US339843

    申请日:1989-04-18

    CPC分类号: H01L27/10808

    摘要: Disclosed are measurement (observation) pads for judging whether or not a dynamic random access memory (DRAM) adopting a shared sense system is functioning as designed. Concretely, measurement pads are formed by the step of forming a second layer of wiring respectively connected to pairs of complementary data lines which are formed by the step of forming a first layer of wiring, and the signal waveforms of the pairs of complementary data lines are measured using the measurement pads. Further, the measurement pads are provided between wiring layers which become fixed potentials in, at least, the operation of measuring data. In addition, each of the measurement pads is used in common by data lines which are respectively connected to two memory cells located in different memory cell mats.

    摘要翻译: 公开了用于判断采用共享感测系统的动态随机存取存储器(DRAM)是否如此设计的功能的测量(观察)焊盘。 具体地,通过形成分别连接到形成第一层布线的步骤形成的互补数据线对的第二层布线的步骤形成测量焊盘,并且互补数据线对的信号波形是 使用测量垫测量。 此外,至少在测量数据的操作中,测量焊盘设置在成为固定电位的布线层之间。 此外,每个测量焊盘由分别连接到位于不同存储单元垫中的两个存储单元的数据线共同使用。

    Semiconductor memorizing device
    9.
    发明授权
    Semiconductor memorizing device 失效
    半导体记忆装置

    公开(公告)号:US4849939A

    公开(公告)日:1989-07-18

    申请号:US100752

    申请日:1987-09-24

    CPC分类号: G11C29/835 G11C8/00

    摘要: A semiconductor memory having a memory array, a first and a second selection line which are connected to a memory cell, and a selection means which selects either one of the selection lines. The selection means includes a selection circuit which optionally selects the first selection line or the second selection line when an address signal corresponding to the first selection line is aligned with a predetermined address signal.

    摘要翻译: 具有连接到存储单元的存储器阵列,第一和第二选择线的半导体存储器以及选择选择线之一的选择装置。 选择装置包括选择电路,当与第一选择线对应的地址信号与预定的地址信号对准时,可选地选择第一选择线或第二选择线。

    Semiconductor memory device having redundant column and operation method
thereof
    10.
    发明授权
    Semiconductor memory device having redundant column and operation method thereof 失效
    具有冗余列的半导体存储器件及其操作方法

    公开(公告)号:US5485425A

    公开(公告)日:1996-01-16

    申请号:US375727

    申请日:1995-01-20

    CPC分类号: G11C17/126 G11C29/84

    摘要: There is provided a semiconductor memory device having a redundant column. This memory device has a redundant column disposed in the direction of the Y-system address, a ROM accessed by using an X-system address, a Y-system address signal having a defective cell included in the cells therein being electrically written into the ROM, a comparator circuit for comparing a signal read out from this ROM with a Y-system address signal and outputting a coincidence signal upon coincidence, and a defect relieving circuit responsive to output of the coincidence signal from this comparator circuit to cause selection of the redundant column of Y system instead of the Y-system address selection device.

    摘要翻译: 提供了具有冗余列的半导体存储器件。 该存储装置具有沿Y系统地址的方向设置的冗余列,通过使用X系统地址访问的ROM,其中包含在其中的单元中的具有缺陷单元的Y系统地址信号被电写入ROM 比较电路,用于将从该ROM读出的信号与Y系统地址信号进行比较,并且一致地输出一致信号,以及响应来自该比较器电路的符合信号的输出的缺陷消除电路,以选择冗余 Y系列的列,而不是Y系统地址选择设备。