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公开(公告)号:US12131981B2
公开(公告)日:2024-10-29
申请号:US18357931
申请日:2023-07-24
发明人: Yushuang Yao , Vemmond Jeng Hung Ng
IPC分类号: H01L23/492 , H01L21/48
CPC分类号: H01L23/4924 , H01L21/4871
摘要: Implementations described herein are related to a semiconductor device package having an improved baseplate. In such an improved baseplate, there is a recess cut out of a region of a surface of the baseplate such that the recess has a first sidewall having a first thickness above a recess base and a second sidewall having a second thickness above the recess base. A substrate, e.g., a direct bonded copper (DBC) substrate, may be attached to the baseplate at a recess base using, e.g., a solder layer between the recess base and a surface of the substrate.
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公开(公告)号:US12087670B1
公开(公告)日:2024-09-10
申请号:US18446841
申请日:2023-08-09
IPC分类号: H01L23/00 , H01L21/48 , H01L23/492
CPC分类号: H01L23/4922 , H01L21/4803 , H01L21/4878 , H01L23/4924
摘要: In-Substrate Structures (ISS) and isolation regions, including, but not limited to Through Metal Vias (TMV), Dielectric Isolation Vias (DIV), and Dielectric Isolation Pockets (DIP) formed in a metal substrate to provide enhanced operations for semiconductor packages incorporating a metal substrate, and methods of making the same.
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公开(公告)号:US12057375B2
公开(公告)日:2024-08-06
申请号:US18324479
申请日:2023-05-26
申请人: ROHM CO., LTD.
发明人: Maiko Hatano
IPC分类号: H01L23/492 , H01L23/00 , H01L23/31
CPC分类号: H01L23/4924 , H01L23/3114 , H01L24/83 , H01L2224/8384
摘要: A semiconductor device A1 includes a semiconductor element 10A having an element obverse face 101 and an element reverse face 102, the element obverse face 101 having an obverse face electrode 11 formed thereon and the element reverse face 102 having a reverse face electrode 12 formed thereon, a conductive substrate 22A including an obverse face 221A opposed to the element reverse face 102, and to which the reverse face electrode 12 is conductively bonded, a conductive substrate 22B including an obverse face 221B and spaced from the conductive substrate 22A in a width direction x, and a lead member 51 extending in the width direction x, and electrically connecting the obverse face electrode 11 and the conductive substrate 22B. The lead member 51 is located ahead of the obverse face 221B in the direction in which the obverse face 221B is oriented, and bonded to the obverse face electrode 11 via a lead bonding layer 32. The conductive substrate 22A, the semiconductor element 10A, and the lead bonding layer 32 overlap with the conductive substrate 22B, as viewed in the width direction x.
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公开(公告)号:US20240178100A1
公开(公告)日:2024-05-30
申请号:US18464511
申请日:2023-09-11
发明人: Naoki YOSHIMATSU , Shintaro ARAKI
IPC分类号: H01L23/373 , H01L21/56 , H01L23/00 , H01L23/31 , H01L23/492 , H01L23/495
CPC分类号: H01L23/3736 , H01L21/565 , H01L23/3107 , H01L23/4924 , H01L23/4952 , H01L23/49562 , H01L23/49579 , H01L24/45 , H01L2224/45124 , H01L2924/13055
摘要: The semiconductor device includes: a heat spreader; a first solder layer; a second solder layer; a semiconductor element including a first surface bonded to the heat spreader through the first solder layer, a second surface facing the first surface, a first electrode disposed on the first surface, and a second electrode disposed on the second surface; a block bonded to the second electrode through the second solder layer; a sheet including a first portion, and a second portion having insulating properties and being in contact with the heat spreader; a first lead frame welded to the heat spreader; a second lead frame welded to the block; and a sealant having insulating properties and sealing the first and second lead frames, the heat spreader, the first and second solder layers, the semiconductor element, and the block.
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公开(公告)号:US11908834B2
公开(公告)日:2024-02-20
申请号:US17741402
申请日:2022-05-10
发明人: Vivek Arora , Woochan Kim
IPC分类号: H01L25/065 , H01L23/00 , H01L23/31 , H01L23/492 , H01L23/495 , H01L21/56 , H01F27/40 , H01F27/06 , H01L25/00
CPC分类号: H01L25/0655 , H01F27/06 , H01F27/40 , H01L21/56 , H01L23/3107 , H01L23/4924 , H01L23/49503 , H01L23/49575 , H01L24/48 , H01L24/92 , H01L25/50 , H01L2224/48195 , H01L2224/92247
摘要: A multi-chip isolation (ISO) device package includes a leadframe including leads, an interposer substrate including a top copper layer and a bottom metal layer, with a dielectric layer in-between. A first IC die and a second IC die include circuitry including a transmitter or a receiver, and first and second bond pads are both attached top side up in the package. A laminate transformer is attached to the top copper layer positioned lateral to the IC die. Bondwires wirebond the first bond pads to first pads on the laminate transformer and to a first group of the leads or the lead terminals, and bondwires wirebond the second bond pads to second pads on the laminate transformer and to a second group of the leads or the lead terminals. A mold compound provides encapsulation.
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公开(公告)号:US11862537B2
公开(公告)日:2024-01-02
申请号:US17374553
申请日:2021-07-13
发明人: Jun Hee Park , Nam Sik Kong , Hyun Koo Lee
IPC分类号: H01L23/492 , H01L23/00 , H05K3/10 , H05K3/34
CPC分类号: H01L23/4924 , H01L24/32 , H01L24/73 , H05K3/107 , H05K3/3468 , H01L2224/2612 , H01L2224/32245 , H01L2224/73251
摘要: A soldering structure configured for preventing solder overflow during soldering and a power module, may include a component to be soldered; and a metal layer having a bonding area, to which the component to be soldered is bonded by solder, and a groove portion formed around the bonding area.
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公开(公告)号:US11735504B2
公开(公告)日:2023-08-22
申请号:US16949869
申请日:2020-11-18
发明人: Yushuang Yao , Vemmond Jeng Hung Ng
IPC分类号: H01L23/492 , H01L21/48
CPC分类号: H01L23/4924 , H01L21/4871
摘要: Implementations described herein are related to a semiconductor device package having an improved baseplate. In such an improved baseplate, there is a recess cut out of a region of a surface of the baseplate such that the recess has a first sidewall having a first thickness above a recess base and a second sidewall having a second thickness above the recess base. A substrate, e.g., a direct bonded copper (DBC) substrate, may be attached to the baseplate at a recess base using, e.g., a solder layer between the recess base and a surface of the substrate.
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公开(公告)号:US20230187404A1
公开(公告)日:2023-06-15
申请号:US17926623
申请日:2021-03-16
发明人: Xiaoguang LIANG
IPC分类号: H01L23/00 , H01L23/29 , H01L23/31 , H01L23/492
CPC分类号: H01L24/37 , H01L24/40 , H01L24/29 , H01L24/32 , H01L24/73 , H01L23/291 , H01L23/3121 , H01L23/293 , H01L23/4922 , H01L2224/29111 , H01L2224/32225 , H01L2224/73263 , H01L2224/37147 , H01L2224/40225 , H01L2224/37028 , H01L2224/37032 , H01L23/4924
摘要: A power semiconductor module includes a metal bottom plate, an insulating heat dissipation material layer, a chip, a binding plate, silica gel, and an outer housing, where the binding plate includes a copper plate and a copper strap. The copper plate is connected to the copper strap through welding, and the binding plate is configured to connect circuits of various components. The metal bottom plate is connected to the insulating heat dissipation material layer through tin soldering, the chip is connected to the insulating heat dissipation material layer through tin soldering, the chip is connected to the copper strap, and the copper strap is connected to the insulating heat dissipation material layer. The module can resolve the prior-art problem of mechanical stress generated on the chip in the case of a temperature change when a relatively thick copper frame is applied to the packaging of the power semiconductor module.
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公开(公告)号:US20230170275A1
公开(公告)日:2023-06-01
申请号:US17538583
申请日:2021-11-30
申请人: Qorvo US, Inc.
发明人: Kelly M. Lear , Jeffrey Miller , Mihir Roy , Christine Blair
IPC分类号: H01L23/367 , H01L23/492 , H01L23/48
CPC分类号: H01L23/3677 , H01L23/481 , H01L23/4924
摘要: The present disclosure relates to a system in package having a chiplet with a first substrate and a first die deposed over the first substrate, a second die, a second substrate that the chiplet and the second die are deposed over, and a heatsink spreader deposed over the chiplet and the second die. Herein, the first substrate includes layered-cake shaped heatsink stanchions that are coupled to the first die, and the second substrate includes layered-cake shaped heatsink stanchions that are coupled to the chiplet and the second die. As such, heat generated by the first die can be dissipated by the heatsink stanchions within the first and second substrates, and heat generated by the second die can be dissipated by the heatsink stanchions within the second substrate. Furthermore, the heat generated by the first die and the second die can be dissipated by the heatsink spreader above them.
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公开(公告)号:US10020248B2
公开(公告)日:2018-07-10
申请号:US15153970
申请日:2016-05-13
申请人: LG INNOTEK CO., LTD.
发明人: Dae Sung Yoo , Han Mo Koo , Ki Tae Park , Jun Young Lim , Tae Ki Hong
IPC分类号: H05K7/02 , H01L23/498 , H01L23/495 , H01L23/31 , H01L23/492 , H01L23/00
CPC分类号: H01L23/49811 , H01L23/315 , H01L23/4924 , H01L23/49572 , H01L23/49582 , H01L23/49838 , H01L23/49894 , H01L24/50 , H01L24/86 , H01L2924/0002 , H05K7/02 , H01L2924/00
摘要: Provided is a tape for electronic devices with lead crack and a method of manufacturing the tape. According to the present invention, by forming a cutting portion on a narrow circuit pattern to be connected from an inner lead to an outer lead and further forming the cutting portion within a resin application portion, the problem of occurrence of cracks along a width of a narrow wiring can be avoided. The tape may include a first lead and a second lead formed on a dielectric substrate and a cutting portion formed on one of the first lead and the second lead wherein the cutting portion is formed within a resin application portion.
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